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Devices processing

The examples discussed in tliis chapter show a strong synergy between fundamental physical chemistry and device processing metliods. This is expected only to become richer as shrinking dimensions place ever more stringent demands on process reliability. Selecting key aspects of processes for fundamental study in simpler environments will not only enable finer control over processes, but also enable more sophisticated simulations tliat will reduce tire cost and time required for process optimization. [Pg.2939]

Building and explaining a complex model requires a unified view caUed an ontology. Methods of quahtative reasoning can be based on different viewpoints the dominant viewpoints are device, process, and constraints. Behavior generation is handled with two approaches ... [Pg.509]

Clearly the full potential of CIS PV devices has not been fully exploited, since the combination of group I-III-VI2 elements can result in a variety of end products. Therefore, standards need to be defined that can associate device processing, fabrication, and film composition to cell band gap and efficiency. Spray CVD in conjunction with SSP design provides a proof-of-concept for a reproducible highly manufacturable process. Items that need more investigation include (1) precursor design development of more volatile/thermally... [Pg.192]

Bharathan, J. Yang, Y. 1998. Polymer electroluminescent devices processed by inkjet printing I. Polymer fight-emitting logo. Appl. Phys. Lett. 72 2660-2662. [Pg.404]

The most convincing argument for using Si photodiodes in UV detection is the availability of strong expertise in electronic Si devices. Processing and performance of opto-electronic Si devices have been optimized for decades, and the UV-enhanced photodiode is a high-performance niche product that can be produced at a reasonable price, thanks to these efforts. Its probably most serious drawback is the necessity of using filters for visible-blind applications, which considerably increases the cost of sensors and reduces their otherwise optimum sensitivity. [Pg.168]

One typical example of CIM is the introduction of a very thin layer of LiF between the cathode A1 and ETL such as Alq3 [48]. It has been demonstrated that such a thin layer of LiF dramatically improves the device performance and efficiency. In addition, this LiF/Al bilayer is also stable relative to Mgo.gAgo.i and should be compatible with Si device processing [49]. [Pg.310]

Y. Yang, S.C. Chang, J. Bharathan, and J. Liu, Organic/polymeric electroluminescent devices processed... [Pg.581]

Scanning electron microscopy confirmed sub-0.5p.m resolution capabilities in TBSS -acid generator resist films (Figure 3). Note that the edge profiles are nearly vertical. Preliminary results indicate that the plasma etching resistance is satisfactory for semiconductor device processing. [Pg.53]

A perfect top contact would have a highly uniform layer of metal with complete, conformal contact at the SAM surface to form a sharp interface in which there is good overlap of the electronic states of the metal surface and the molecule terminal groups. This ideal situation is not to be expected in real device processing as a number of physical and chemical defects can easily arise, as summarized in the schematic in Fig. 6. [Pg.245]

Ion implantation appears as the only feasible method to accomplish selective area doping of SiC in planar device technology. As described in this chapter, substantial progress has been made during recent years but several fundamental issues and technology barriers remain before the implantation process is fully developed and can be truly implemented in SiC device processing. Eor instance, mesa-etched p n-diodes... [Pg.147]

Kim H (2003) Atomic layer deposition of metal and nitride thin films. Current research efforts and applications for semiconductor device processing. Journal of Vacuum Science Technology B 21(6), 2231-2261... [Pg.226]

The increasing importance of multilevel interconnection systems and surface passivation in integrated circuit fabrication has stimulated interest in polyimide films for application in silicon device processing both as multilevel insulators and overcoat layers. The ability of polyimide films to planarize stepped device geometries, as well as their thermal and chemical inertness have been previously reported, as have various physical and electrical parameters related to circuit stability and reliability in use (1, 3). This paper focuses on three aspects of the electrical conductivity of polyimide (PI) films prepared from Hitachi and DuPont resins, indicating implications of each conductivity component for device reliability. The three forms of polyimide conductivity considered here are bulk electronic ionic, associated with intentional sodium contamination and surface or interface conductance. [Pg.151]

The introduction of certain manufacturing steps into device processing has placed increased demands on the properties of photoresists, especially with regard to thermal stability. In addition there is often a need for... [Pg.54]

Write a brief description of the principles of operation of a device, process, or algorithm. [Pg.72]

In recent years, the electronics industry has made increasing use of ion imptamaiion as a method of doping semiconductors. Since rhe number of ions implanted is determined hy the charge transferred to the substrate and Iheir depth distribution hy the incident energy, ion implantation has improved the controllability and reproducibility of certain semiconductor device processing operations. Also, ion implantation processes do not... [Pg.865]

This section deals with multi-scale models for the PEFC and consists of three subsections, 4.1,4.2, and 4.3, that relate to molecular-level models, bridging models between scales and device/process level models, respectively. The objectives of these subsections are to survey the development and application of these models. [Pg.92]

A modular micro structured chemical reaction system (ICS) similar to [R 14] is claimed by Bard [84]. The system can use various replaceable and interchangeable cylindrical or rectangular reactors. Generally, the ICS system can include fluid flow handling and control components, mixers, reaction chip-type units, separator devices, process variable detectors and controllers and a computer interface for communicating with the master control center (see Figure 4.31) [84],... [Pg.546]

While these polymeric materials hold promise for low-cost electronics and simplified device processing, they still suffer from lower performance than conventional inorganic semiconductors. As the development of these novel materials continues, an alternative technology incorporating patterning schemes such as inkjet printing and conventional vacuum deposited thin films, may provide the required overlap of performance with low-cost fabrication of microelectronic circuits on large-area platforms. [Pg.271]


See other pages where Devices processing is mentioned: [Pg.429]    [Pg.474]    [Pg.391]    [Pg.8]    [Pg.172]    [Pg.67]    [Pg.39]    [Pg.45]    [Pg.439]    [Pg.35]    [Pg.1]    [Pg.6]    [Pg.40]    [Pg.227]    [Pg.156]    [Pg.109]    [Pg.148]    [Pg.156]    [Pg.15]    [Pg.19]    [Pg.1022]    [Pg.24]    [Pg.30]    [Pg.386]    [Pg.7]    [Pg.229]    [Pg.246]    [Pg.236]    [Pg.213]    [Pg.221]    [Pg.272]    [Pg.272]   
See also in sourсe #XX -- [ Pg.138 ]




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