X technique

Fig. 4. Comparison of profiles from solvent extraction (O, values expressed as average of two or more replicates) and Chelex-100 (X) techniques. (From ref. 15.)...

EXAFS Extended X-ray absorption fine structure spectroscopy. A spectroscopic technique which can determine interatomic distances very precisely. 

X-ray fluorescence A method of analysis used to identify and measure heavy elements in the presence of each other in any matrix. The sample is irradiated with a beam of primary X-rays of greater energy than the characteristic X-radiation of the elements in the sample. This results in the excitation of the heavy elements present and the emission of characteristic X-ray energies, which can be separated into individual wavelengths and measured. The technique is not suitable for use with elements of lower atomic number than calcium. 

Other techniques such as X-ray diffusion or small angle neutron diffusion are also used in attempts to describe the size and form of asphaltenes in crude oil. It is generally believed that asphaltenes have the approximate form of very flat ellipsoids whose thicknesses are on the order of one nanometer and diameters of several dozen nanometers. 

Gordon R., Bender R., Herman G.T. Algebraic reconstruction techniques (ART) for three-dimensional electron micrographs and X-ray photography., J. Theor. Biol., V. 29, 1970, p. 471-481. 

The use of experimental X-ray vidicons, original technique of X-raying and computer image processing allowed to improve basic parameters of XTVI and to achieve higher defectoscopic sensitivity and greater thickness of X-rayed materials and products. 

The efficiency of gas turbines is limited by the maximum allowable turbine inlet temperature (TIT). The TIT may be increased by cooling of the blades and vanes of the high pressure turbine. Cooling channels can be casted into the components or may be drilled afterwards. Non-conventional processes like EDM, ECD or Laser are used for drilling. Radiographic examination of the drilled components is part of the inspection procedure. Traditional X-Ray film technique has been used. The consumable costs, the waste disposal and the limited capacity of the two film units lead to the decision to investigate the alternative of Real-Time X-Ray. 

This research examines the feasibility of a technique based upon the CT principle using a microfocus X-ray source with an image intensifier while the examined object is being rotated The attainable enlargement is up to 200. The data to be processed is collected from the whole surface of the image intensifier by a frame grabber and noise suppression is performed. 

Due to large improvements in computer technology in combination with new designs of area x-ray detector systems it is possible to extend the 2D-CT systems up to the third dimension. Therefor special algorithms and techniques for 3D-CT of the measured projection data and 3D visualisation and measurement of the results had to be developed. 

When we look at a very simple sketch of an X-ray tube, we can outline some aspects of the applied technique of construction ... 

Laminographical approaches can be used for layer-by-layer visualization of the internal microstructure for the flat objects (multilayers, PCBs etc.), that caimot be reconstructed by computerized tomography because of the limited possibilities in rotation. Depth and lateral spatial resolutions are limited by the tube, camera and rotation accuracy. Microfocus X-ray tubes and digital registration techniques with static cameras allow improving resolution. Precision object manipulations and more effective distortion corrections can do further improvement. 

It is shown how phase contrast X-ray microtomography can be realised with a (commercial) polychromatic X-ray microfocus tomograph provided the source size and the resolution of the detector are sufficiently small and the distance between source and detector is sufficiently large. The technique opens perspectives for high resolution tomography of light objects... 

A much better way would be to use phase contrast, rather than attenuation contrast, since the phase change, due to changes in index of refraction, can be up to 1000 times larger than the change in amplitude. However, phase contrast techniques require the disposal of monochromatic X-ray sources, such as synchrotrons, combined with special optics, such as double crystal monochromatics and interferometers [2]. Recently [3] it has been shown that one can also obtain phase contrast by using a polychromatic X-ray source provided the source size and detector resolution are small enough to maintain sufficient spatial coherence. 

Considering existing microscopical techniques, one can find that non-destmctive information from the internal stmcture of an object in natural conditions can be obtained by transmission X-ray microscopy. Combination of X-ray transmission technique with tomographical reconstmction allows getting three-dimensional information about the internal microstmcture [1-3]. In this case any internal area can be reconstmcted as a set of flat cross sections which can be used to analyze the two- and three-dimensional morphological parameters [4]. For X-ray methods the contrast in the images is a mixed combination of density and compositional information. In some cases the compositional information can be separated from the density information [5]. Recently there has been a... 

The detailed examination of the behavior of light passing through or reflected by an interface can, in principle, allow the determination of the monolayer thickness, its index of refiraction and absorption coefficient as a function of wavelength. The subjects of ellipsometry, spectroscopy, and x-ray reflection deal with this goal we sketch these techniques here. 

In the case of Langmuir monolayers, film thickness and index of refraction have not been given much attention. While several groups have measured A versus a, [143-145], calculations by Knoll and co-workers [146] call into question the ability of ellipsometry to unambiguously determine thickness and refractive index of a Langmuir monolayer. A small error in the chosen index of refraction produces a large error in thickness. A new microscopic imaging technique described in section IV-3E uses ellipsometric contrast but does not require absolute determination of thickness and refractive index. Ellipsometry is routinely used to successfully characterize thin films on solid supports as described in Sections X-7, XI-2, and XV-7. 

Since the development of grazing incidence x-ray diffraction, much of the convincing evidence for long-range positional order in layers has come from this technique. Structural relaxations from distorted hexagonal structure toward a relaxed array have been seen in heneicosanol [215]. Rice and co-workers combine grazing incidence x-ray diffraction with molecular dynamics simulations to understand several ordering transitions [178,215-219]. 

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