X-ray photoelectron spectroscopy technique

The adsorption of N-substituted tetrazoles on surfaces was studied by means of the X-ray photoelectron spectroscopy technique <2000MI130, 2004MI1371>. 

As the X-ray photoelectron spectroscopy technique is very surface sensitive, the fluoropolymers were carefully transferred - through the air - from the sputtering vessel to the ESCA spectrometer, and analyzed without further chemical or mechanical treatment. All the studied samples were stable in air (see below) and in the spectrometer during the analysis, i.e. no degradation could be detected. 

XPS is also often perfonned employing syncln-otron radiation as the excitation source [59]. This technique is sometimes called soft x-ray photoelectron spectroscopy (SXPS) to distinguish it from laboratory XPS. The use of syncluotron radiation has two major advantages (1) a much higher spectral resolution can be achieved and (2) the photon energy of the excitation can be adjusted which, in turn, allows for a particular electron kinetic energy to be selected. 

Other techniques in which incident photons excite the surface to produce detected electrons are also Hsted in Table 1. X-ray photoelectron Spectroscopy (xps), which is also known as electron spectroscopy for chemical analysis (esca), is based on the use of x-rays which stimulate atomic core level electron ejection for elemental composition information. Ultraviolet photoelectron spectroscopy (ups) is similar but uses ultraviolet photons instead of x-rays to probe atomic valence level electrons. Photons are used to stimulate desorption of ions in photon stimulated ion angular distribution (psd). Inverse photoemission (ip) occurs when electrons incident on a surface result in photon emission which is then detected. 

X-ray Photoelectron Spectroscopy. X-ray photoelectron spectroscopy (xps) and Auger electron spectroscopy (aes) are related techniques (19) that are initiated with the same fundamental event, the stimulated ejection of an electron from a surface. The fundamental aspects of these techniques will be discussed separately, but since the instmmental needs required to perform such methods are similar, xps and aes instmmentation will be discussed together. 

In other articles in this section, a method of analysis is described called Secondary Ion Mass Spectrometry (SIMS), in which material is sputtered from a surface using an ion beam and the minor components that are ejected as positive or negative ions are analyzed by a mass spectrometer. Over the past few years, methods that post-ion-ize the major neutral components ejected from surfaces under ion-beam or laser bombardment have been introduced because of the improved quantitative aspects obtainable by analyzing the major ejected channel. These techniques include SALI, Sputter-Initiated Resonance Ionization Spectroscopy (SIRIS), and Sputtered Neutral Mass Spectrometry (SNMS) or electron-gas post-ionization. Post-ionization techniques for surface analysis have received widespread interest because of their increased sensitivity, compared to more traditional surface analysis techniques, such as X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES), and their more reliable quantitation, compared to SIMS. 

Neutron reflectivity provides a depth resolution of 1 nm and fills an important gap in the resolution between X-ray photoelectron spectroscopy and ion-beam techniques. In this regard, neutron reflectivity promises to play a decisive role in the investigation of solid materials. Equally important is the fact that reflectivity meas-... 

X-ray photoelectron spectroscopy (XPS) is currently the most widely used surface-analytical technique, and is therefore described here in more detail than any of the other techniques. At its inception hy Sieghahn and coworkers [2.1] it was called ESCA (electron spectroscopy for chemical analysis), hut the name ESCA is now considered too general, because many surface-electron spectroscopies exist, and the name given to each one must be precise. The name ESCA is, nevertheless, still used in many places, particularly in industrial laboratories and their publications. Briefly, the reasons for the popularity of XPS are the exceptional combination of compositional and chemical information that it provides, its ease of operation, and the ready availability of commercial equipment. 

Surface analysis has made enormous contributions to the field of adhesion science. It enabled investigators to probe fundamental aspects of adhesion such as the composition of anodic oxides on metals, the surface composition of polymers that have been pretreated by etching, the nature of reactions occurring at the interface between a primer and a substrate or between a primer and an adhesive, and the orientation of molecules adsorbed onto substrates. Surface analysis has also enabled adhesion scientists to determine the mechanisms responsible for failure of adhesive bonds, especially after exposure to aggressive environments. The objective of this chapter is to review the principals of surface analysis techniques including attenuated total reflection (ATR) and reflection-absorption (RAIR) infrared spectroscopy. X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) and to present examples of the application of each technique to important problems in adhesion science. 

The interface properties can usually be independently measured by a number of spectroscopic and surface analysis techniques such as secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS), specular neutron reflection (SNR), forward recoil spectroscopy (FRES), scanning electron microscopy (SEM) and transmission electron microscopy (TEM), infrared (IR) and several other methods. Theoretical and computer simulation methods can also be used to evaluate H t). Thus, we assume for each interface that we have the ability to measure H t) at different times and that the function is well defined in terms of microscopic properties. 

The most widely used techniques for surface analysis are Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), secondary ion mass spectroscopy (SIMS), Raman and infrared spectroscopy, and contact angle measurement. Some of these techniques have the ability to determine the composition of the outermost atomic layers, although each technique possesses its own special advantages and disadvantages. 

Film-forming chemical reactions and the chemical composition of the film formed on lithium in nonaqueous aprotic liquid electrolytes are reviewed by Dominey [7], SEI formation on carbon and graphite anodes in liquid electrolytes has been reviewed by Dahn et al. [8], In addition to the evolution of new systems, new techniques have recently been adapted to the study of the electrode surface and the chemical and physical properties of the SEI. The most important of these are X-ray photoelectron spectroscopy (XPS), SEM, X-ray diffraction (XRD), Raman spectroscopy, scanning tunneling microscopy (STM), energy-dispersive X-ray spectroscopy (EDS), FTIR, NMR, EPR, calorimetry, DSC, TGA, use of quartz-crystal microbalance (QCMB) and atomic force microscopy (AFM). 

Other techniques utilize various types of radiation for the investigation of polymer surfaces (Fig. 2). X-ray photoelectron spectroscopy (XPS) has been known in surface analysis for approximately 23 years and is widely applied for the analysis of the chemical composition of polymer surfaces. It is more commonly referred to as electron spectroscopy for chemical analysis (ESCA) [22]. It is a very widespread technique for surface analysis since a wide range of information can be obtained. The surface is exposed to monochromatic X-rays from e.g. a rotating anode generator or a synchrotron source and the energy spectrum of electrons emitted... 

A variety of other techniques have been used to investigate ion transport in conducting polymers. The concentrations of ions in the polymer or the solution phase have been monitored by a variety of in situ and ex situ techniques,8 such as radiotracer studies,188 X-ray photoelectron spectroscopy (XPS),189 potentiometry,154 and Rutherford backscatter-ing.190 The probe-beam deflection method, in which changes in the density of the solution close to the polymer surface are monitored, provides valuable data on transient ion transport.191 Rotating-disk voltammetry, using an electroactive probe ion, provides very direct and reliable data, but its utility is very limited.156,19 193 Scanning electrochemical microscopy has also been used.194... 

X-ray photoelectron spectroscopy (XPS), which is synonymous with ESCA (Electron Spectroscopy for Chemical Analysis), is one of the most powerful surface science techniques as it allows not only for qualitative and quantitative analysis of surfaces (more precisely of the top 3-5 monolayers at a surface) but also provides additional information on the chemical environment of species via the observed core level electron shifts. The basic principle is shown schematically in Fig. 5.34. 

Surface composition and morphology of copolymeric systems and blends are usually studied by contact angle (wettability) and surface tension measurements and more recently by x-ray photoelectron spectroscopy (XPS or ESCA). Other techniques that are also used include surface sensitive FT-IR (e.g., Attenuated Total Reflectance, ATR, and Diffuse Reflectance, DR) and EDAX. Due to the nature of each of these techniques, they provide information on varying surface thicknesses, ranging from 5 to 50 A (contact angle and ESCA) to 20,000-30,000 A (ATR-IR and EDAX). Therefore, they can be used together to complement each other in studying the depth profiles of polymer surfaces. 

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