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X-ray photoelectron microscopy XPS

Abbreviations AES, Auger emission spectrometry CRM, Certified reference material DL, Detection limit ED, Energy dispersive ESRF, European Synchrotron Radiation Facility EXAES, Extended X-ray absorption fine structure NEXAFS, Near edge X-ray absorption fine structure PCI, Phase contrast imaging RM, Reference material SR, Synchrotron radiation SRM, Standard reference material TXRF, Total reflection X-ray fluorescence XANES, X-ray absorption near edge structure XAS, X-ray absorption spectrometry XDM, X-ray diffraction microscopy XFCT, X-ray fluorescence computerized microtomography XPEEM, X-ray photoelectron microscopy XPS, X-ray photoelectron spectrometry XRD, X-ray diffraction XRF, X-ray fluorescence... [Pg.1738]

Electron spectroscopy for chemical analysis (ESCA) also called X-ray photoelectron microscopy (XPS) <100 A... [Pg.32]

The interface properties can usually be independently measured by a number of spectroscopic and surface analysis techniques such as secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS), specular neutron reflection (SNR), forward recoil spectroscopy (FRES), scanning electron microscopy (SEM) and transmission electron microscopy (TEM), infrared (IR) and several other methods. Theoretical and computer simulation methods can also be used to evaluate H t). Thus, we assume for each interface that we have the ability to measure H t) at different times and that the function is well defined in terms of microscopic properties. [Pg.354]

Film-forming chemical reactions and the chemical composition of the film formed on lithium in nonaqueous aprotic liquid electrolytes are reviewed by Dominey [7], SEI formation on carbon and graphite anodes in liquid electrolytes has been reviewed by Dahn et al. [8], In addition to the evolution of new systems, new techniques have recently been adapted to the study of the electrode surface and the chemical and physical properties of the SEI. The most important of these are X-ray photoelectron spectroscopy (XPS), SEM, X-ray diffraction (XRD), Raman spectroscopy, scanning tunneling microscopy (STM), energy-dispersive X-ray spectroscopy (EDS), FTIR, NMR, EPR, calorimetry, DSC, TGA, use of quartz-crystal microbalance (QCMB) and atomic force microscopy (AFM). [Pg.420]

A variety of other techniques have been used to investigate ion transport in conducting polymers. The concentrations of ions in the polymer or the solution phase have been monitored by a variety of in situ and ex situ techniques,8 such as radiotracer studies,188 X-ray photoelectron spectroscopy (XPS),189 potentiometry,154 and Rutherford backscatter-ing.190 The probe-beam deflection method, in which changes in the density of the solution close to the polymer surface are monitored, provides valuable data on transient ion transport.191 Rotating-disk voltammetry, using an electroactive probe ion, provides very direct and reliable data, but its utility is very limited.156,19 193 Scanning electrochemical microscopy has also been used.194... [Pg.580]

Suhtnicion nickel powders luive been synthesized successfully from aqueous NiCh at various tempmatuTKi and times with ethanol-water solvent by using the conventional and ultrasonic chemical reduction method. The reductive condition was prepared by flie dissolution of hydrazine hydrate into basic solution. The samples synthesized in various conditions weae claractsiz by the m ins of an X-ray diffractometry (XRD), a scanning electron microscopy (SEM), a thermo-gravimetry (TG) and an X-ray photoelectron spectroscopy (XPS). It was found that the samples obtained by the ultrasonic method were more smoothly spherical in shape, smaller in size and narrower in particle size distribution, compared to the conventional one. [Pg.773]

The films were characterized using x-ray powder diffraction (XRD), x-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). The photoelectron spectroscopy utilized a Vacuum Generators ESCA Lab II system with Mg(Ka) radiation. Binding energies (BE) were measured with respect to the surface C(ls) peak (284.5 eV) which was always present In these films. Scanning electron microscopy was done with a JEOL JSM-35C system. [Pg.567]

In the present study, we synthesized in zeolite cavities Co-Mo binary sulfide clusters by using Co and Mo carbonyls and characterized the clusters by extended X-ray absorption fine structure (EXAFS), X-ray photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy (FTIR), and high resolution electron microscopy (HREM). The mechanism of catalytic synergy generation in HDS is discussed. [Pg.503]

Usually bimetallic nanoparticles as well as monometallic ones are characterized by many probing tools such as UV-visible (UV-Vis) spectroscopy, transmission electron microscopy (TEM), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), EXAFS, infrared spectroscopy of adsorbed CO (CO-IR), and so on [1,2]. [Pg.50]

We have found new CO-tolerant catalysts by alloying Pt with a second, nonprecious, metal (Pt-Fe, Pt-Co, Pt-Ni, etc.) [Fujino, 1996 Watanabe et al., 1999 Igarashi et al., 2001]. In this section, we demonstrate the properties of these new alloy catalysts together with Pt-Ru alloy, based on voltammetric measurements, electrochemical quartz crystal microbalance (EQCM), electrochemical scanning tunneling microscopy (EC-STM), in situ Fourier transform infrared (FTIR) spectroscopy, and X-ray photoelectron spectroscopy (XPS). [Pg.318]

Ffirai and Toshima have published several reports on the synthesis of transition-metal nanoparticles by alcoholic reduction of metal salts in the presence of a polymer such as polyvinylalcohol (PVA) or polyvinylpyrrolidone (PVP). This simple and reproducible process can be applied for the preparation of monometallic [32, 33] or bimetallic [34—39] nanoparticles. In this series of articles, the nanoparticles are characterized by different techniques such as transmission electronic microscopy (TEM), UV-visible spectroscopy, electron diffraction (EDX), powder X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) or extended X-ray absorption fine structure (EXAFS, bimetallic systems). The great majority of the particles have a uniform size between 1 and 3 nm. These nanomaterials are efficient catalysts for olefin or diene hydrogenation under mild conditions (30°C, Ph2 = 1 bar)- In the case of bimetallic catalysts, the catalytic activity was seen to depend on their metal composition, and this may also have an influence on the selectivity of the partial hydrogenation of dienes. [Pg.220]

The most conventional investigations on the adsorption of both modifier and substrate looked for the effect of pH on the amount of adsorbed tartrate and MAA [200], The combined use of different techniques such as IR, UV, x-ray photoelectron spectroscopy (XPS), electron microscopy (EM), and electron diffraction allowed an in-depth study of adsorbed tartrate in the case of Ni catalysts [101], Using these techniques, the general consensus was that under optimized conditions a corrosive modification of the nickel surface occurs and that the tartrate molecule is chemically bonded to Ni via the two carbonyl groups. There were two suggestions as to the exact nature of the modified catalyst Sachtler [195] proposed adsorbed nickel tartrate as chiral active site, whereas Japanese [101] and Russian [201] groups preferred a direct adsorption of the tartrate on modified sites of the Ni surface. [Pg.504]

Another approach is to perform ex situ reactions and insert the sample into a high vacuum system without exposure to ambient conditions. Incorporating N2 glove boxes or reactor systems with X-ray photoelectron spectroscopy (XPS) sample handling can also provide information that is closer to operational conditions. In a similar manner ex situ reactions and sample handling are starting to be apphed to electron microscopy studies. Commercially available sample transfer systems will accelerate the application of this methodology. [Pg.159]

Substrate Characterization. Test coupons and panels of 7075-T6 aluminum, an alloy used extensively for aircraft structures, were degreased In a commercial alkaline cleaning solution and rinsed In distilled, deionized water. The samples were then subjected to either a standard Forest Products Laboratories (FPL) treatment ( 0 or to a sulfuric acid anodization (SAA) process (10% H2SO4, v/v 15V 20 min), two methods used for surface preparation of aircraft structural components. The metal surfaces were examined by scanning transmission electron microscopy (STEM) In the SEM mode and by X-ray photoelectron spectroscopy (XPS). [Pg.236]

We reported the synthesis of Si/Si02//PS-h-poly(acrylate) tethered diblock copolymer brushes [31,32,46,47]. The properties of these diblock brushes were studied using water contact angles, ellipsometry. X-ray photoelectron spectroscopy (XPS), FTIR spectroscopy and atomic force microscopy (AFM). For a sample with a 26 nm PS layer and a 9 nm PMMA layer, the advanc-... [Pg.137]

A number of methods are available for the characterization and examination of SAMs as well as for the observation of the reactions with the immobilized biomolecules. Only some of these methods are mentioned briefly here. These include surface plasmon resonance (SPR) [46], quartz crystal microbalance (QCM) [47,48], ellipsometry [12,49], contact angle measurement [50], infrared spectroscopy (FT-IR) [51,52], Raman spectroscopy [53], scanning tunneling microscopy (STM) [54], atomic force microscopy (AFM) [55,56], sum frequency spectroscopy. X-ray photoelectron spectroscopy (XPS) [57, 58], surface acoustic wave and acoustic plate mode devices, confocal imaging and optical microscopy, low-angle X-ray reflectometry, electrochemical methods [59] and Raster electron microscopy [60]. [Pg.54]

The size and morphology are characteristic parameters of metal particles. It is possible to determine them by various techniques transmission electron microscopy (TEM) [105-107], X-ray photoelectron spectroscopy (XPS) [108], X-ray diffraction (XRD), extended X-ray absorption fine structure (EXAES) [109, 110], thermoprogrammed oxidation, reduction or desorption (TPO, TPR or TPO) and chemisorption of probe molecules (H2, O2, CO, NO) are currently used. It is therefore possible to know the particles (i) size (by TEM) [105-107], extended X-ray absorption fine structure (EXAES) [109, 110]), (ii) structure (by XRD, TEM), (iii) chemical composition (by TEM-EDAX, elemental analysis), (iv) chemical state (surface and bulk metal atoms by XPS [108], TPD, TPR, TPO) and... [Pg.59]

This paper contributes to the literature by quantifying anionic polymer adsorption onto the clay minerals kaolinite, feldspar, mica and quartz by X-ray photoelectron spectroscopy (XPS). XPS measures the sorbed amount directly rather than by a subtraction technique. This enables an insight into how effective selective flocculation is for obtaining kaolinite from a mineral mixture. Atomic force microscopy (AFM) is also used to image polymer adsorption onto mineral surfaces and the effectiveness of this technique applied to mineral surfaces is discussed here. [Pg.72]

In addition to the electrochemical techniques, many surface analytical techniques are constantly in use, such as ellipsome-try for the surface thin oxide thickness, multiple reflection infrared spectroscopy (MIR), and X-ray photoelectron spectroscopy (XPS) for surface layer composition, total reflection X-ray fluorescence spectroscopy (TXRFS) for the metal surface contaminants, and naturally atomic force microscopy (AFM) for the surface roughness profile. [Pg.309]


See other pages where X-ray photoelectron microscopy XPS is mentioned: [Pg.493]    [Pg.272]    [Pg.113]    [Pg.937]    [Pg.1967]    [Pg.199]    [Pg.16]    [Pg.89]    [Pg.493]    [Pg.272]    [Pg.113]    [Pg.937]    [Pg.1967]    [Pg.199]    [Pg.16]    [Pg.89]    [Pg.56]    [Pg.299]    [Pg.415]    [Pg.954]    [Pg.141]    [Pg.359]    [Pg.28]    [Pg.676]    [Pg.3]    [Pg.83]    [Pg.198]    [Pg.518]    [Pg.146]    [Pg.23]    [Pg.588]    [Pg.137]    [Pg.217]    [Pg.287]    [Pg.14]    [Pg.232]    [Pg.247]    [Pg.71]   
See also in sourсe #XX -- [ Pg.493 , Pg.533 ]




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X-ray photoelectron

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