X-ray fluorescence intensity

Compai ison with literature experimental and calculation data showed that the model proposed ensures the accurate behavior of the functional dependence of x-ray fluorescence intensity on the particle size. Its main advantage is the possibility to estimate the effect of particle size for polydispersive multicomponent substances. 

X-RAY FLUORESCENCE INTENSITY ELEMENTS OE MULTICOMPONENT POWDER MATERIAL WITH CONTINUOUS GRAIN SIZE DISTRIBUTION OE COMPONENTS... 

The existing models for emitting x-ray fluorescence intensity of elemental analytical lines from heterogeneous samples are limited in practical applications, because in most publications the relations between the fluorescence intensity of analytical lines elements and the properties of powder materials were not completely studied. For example, particles distribution of components within narrow layer of irradiator which emitted x-ray fluorescence intensity of elements might be in disagreement with particles distribution of components within whole sample. 

Since then, TXRE has become the standard tool for surface and subsurface microanalysis [4.7-4.11]. In 1983 Becker reported the angular dependence of X-ray fluorescence intensities in the range of total reflection [4.12]. Recent demands have set the pace of further development in the field of TXRE - improved detection limits [4.13] in combination with subtle surface preparation techniques [4.14, 4.15], analyte concentrations extended even to ultratraces (pg) of light elements, e. g. A1 [4.16], spe-dation of different chemical states [4.17], and novel optical arrangements [4.18] and X-ray sources [4.19, 4.20]. 

Ka X-ray fluorescence intensities in single RBC. (b) Characteristic Ko X-ray signal of Ru inside and outside the digestive vacuole of the parasite. Adapted with permission from Ref. [154]. 

Porous silicon layers with a porosity of 60% on n-type (lll)Si substrates were prepared by anodic etching under white illumination. Silver/porous-silicon/Si and metal Ag/Si structures were fabricated by evaporation of thin metal films onto the porous silicon or Si surface, respectively. The diffusion annealing of structures was carried out in air at 100-250C. Examination of the Ag concentration distribution in porous silicon layers and monocrystalline Si substrates was performed by successive removal of thin layers and measurement of the energy dispersive X-ray fluorescence intensity of AgK( peaks. The effective diffusion coefficients were described by ... 

Test Method B (Mathematical Correction Procedure)—The measured X-ray fluorescence intensity for a given element is mathematically corrected for potential interference from other elements present in the sample (see Sections 1 to 6, and 12 to 16). 

At X-ray fluorescence analysis (XRF) of samples of the limited weight is perspective to prepare for specimens as polymeric films on a basis of methylcellulose [1]. By the example of definition of heavy metals in film specimens have studied dependence of intensity of X-ray radiation from their chemical compound, surface density (P ) and the size (D) particles of the powder introduced to polymer. Have theoretically established, that the basic source of an error of results XRF is dependence of intensity (F) analytical lines of determined elements from a specimen. Thus the best account of variations P provides a method of the internal standard at change P from 2 up to 6 mg/sm the coefficient of variation describing an error of definition Mo, Zn, Cu, Co, Fe and Mn in a method of the direct external standard, reaches 40 %, and at use of a method of the internal standard (an element of comparison Ga) value does not exceed 2,2 %. Experiment within the limits of a casual error (V changes from 2,9 up to 7,4 %) has confirmed theoretical conclusions. 

THE USE OF INTENSITY OF COHERENT AND NON-COHERENT SCATTERED RADIATION OF THE X-RAY TUBE FOR THE COMPENSATION OF MATRIX EFFECTS AT THE ANALYSIS OF SOLUTIONS BY X-RAY FLUORESCENCE... 

In X-Ray Fluorescence (XRF), an X-ray beam is used to irradiate a specimen, and the emitted fluorescent X rays are analyzed with a crystal spectrometer and scintillation or proportional counter. The fluorescent radiation normally is diffracted by a crystal at different angles to separate the X-ray wavelengths and therefore to identify the elements concentrations are determined from the peak intensities. For thin films XRF intensity-composition-thickness equations derived from first principles are used for the precision determination of composition and thickness. This can be done also for each individual layer of multiple-layer films. 

X-Ray Fluorescence (XRF) is a nondestructive method used for elemental analysis of materials. An X-ray source is used to irradiate the specimen and to cause the elements in the specimen to emit (or fluoresce) their characteristic X rays. A detector s)rstem is used to measure the positions of the fluorescent X-ray peaks for qualitative identiflcation of the elements present, and to measure the intensities of the peaks for quantitative determination of the composition. All elements but low-Z elements—H, He, and Li—can be routinely analyzed by XRF. 

In addition to qualitative identification of the elements present, XRF can be used to determine quantitative elemental compositions and layer thicknesses of thin films. In quantitative analysis the observed intensities must be corrected for various factors, including the spectral intensity distribution of the incident X rays, fluorescent yields, matrix enhancements and absorptions, etc. Two general methods used for making these corrections are the empirical parameters method and the fimdamen-tal parameters methods. 

Evidence concerning the identity of the mobile species can be obtained from observation [406,411—413] of the dispositions of product phases and phase boundaries relative to inert and immobile markers implanted at the plane of original contact between reactant surfaces. Movement of the markers themselves is known as the Kirkendall effect [414], Carter [415] has used pores in the material as markers. Product layer thickness has alternatively been determined by the decrease in intensity of the X-ray fluorescence from a suitable element which occurs in the underlying reactant but not in the intervening product layers [416]. 

Fig. 3.6 (a) Decay scheme of and (b) ideal emission spectrum of Co diffused into rhodium metal. The nuclear levels in (a) are labeled with spin quantum numbers and lifetime. The dashed arrow up indicates the generation of Co by the reaction of Mn with accelerated deuterons (d in Y out). Line widths in (b) are arbitrarily set to be equal. The relative line intensities in (%) are given with respect to the 122-keV y-line. The weak line at 22 keV, marked with ( ), is an X-ray fluorescence line from rhodium and is specific for the actual source matrix... 

The Thin Film Approximation. If absorption and X-ray fluorescence are neglected (i.e. the film is assumed to be infinitely thin ), then the measured X-ray intensity from element A in a thin specimen of unit thickness, generated by a current i is given by... 

X-ray fluorescence analysis is a nondestructive method to analyze rubber materials qualitatively and quantitatively. It is used for the identification as well as for the determination of the concentration of all elements from fluorine through the remainder of the periodic table in their various combinations. X-rays of high intensity irradiate the solid, powder, or liquid specimen. Hence, the elements in the specimen emit X-ray fluorescence radiation of wavelengths characteristic to each element. By reflection from an analyzing crystal, this radiation is dispersed into characteristic spectral lines. The position and intensity of these lines are measured. 

Figure 32. X-ray field intensities at extended Ge (220) lattice positions (0-9) for a perfectly collimated incident X-ray beam. An atomic adlayer whose center falls on one of these positions would have its characteristic fluorescence intensity modulated in the same fashion. The dashed curve represents the Bragg reflectivity profile. (From M. J. Bedzyk, Ph. D thesis, SUNY Albany, 1982.)...

With due regard to the lateral variations in composition which can arise as a consequence of source geometry and positioning (discussed in Section II), it is vise to analyze the alloy film at a number of representative points. For example, if a catalytic reaction was carried out over an alloy film deposited inside a spherical vessel maintained at a constant temperature over its entire area, then the mean alloy composition (and the uniformity of composition) is required. A convenient procedure is to cut glass reaction vessels carefully into pieces at the end of the experiment and to determine the composition by X-ray fluorescence analysis of a number of representative pieces. Compositions of Pd-Ag alloy films (40) determined at 12 representative parts of a spherical vessel from the intensities of the AgK 12 and PdKau fluorescent X-ray emissions are shown in Table V mean compositions are listed in the first column. (The Pd and Ag sources were separate short concentric spirals.) In other applications of evaporated alloy films to adsorption and catalytic studies, as good or better uniformity of composition was achieved. Analyses of five sections of a cylindrical... 

Summary. This Chapter focuses on the investigation of fast electron transport studies in solids irradiated at relativistic laser intensities. Experimental techniques based upon space-resolved spectroscopy are presented in view of their application to both ultrashort Ka X-ray sources and fast ignition studies. Spectroscopy based upon single-photon detection is unveiled as a complementary diagnostic technique, alternative to well established techniques based upon bent crystals. Application of this technique to the study of X-ray fluorescence emission from fast electron propagation in multilayer targets is reported and explored as an example case. 

X-ray fluorescence spectra of most elements consist largely of bands associated with the K, L, and M series. The XRF associated with the K series is dominated by the oq/a doublet, although some very weak [i XRF can often be observed at higher energies. The L-series XRF will consist of three main groups of lines, associated with the a, / , and y structure. Ordinarily, the a, line will be the strongest, and the /h line will be the next most intense. The peaks within the M series are observed only for the heavier elements, and consist of an unresolved oq/o doublet as the strongest feature, followed by a band of peaks associated with the /i XRF. 

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