Surface profilometer

X-Ray diffraction was performed on a M03X-HF22 diffractometer (MAC Science) using Mn filtered Fe Ka radiation. The thickness of the films was determined with a surface profilometer (Kosaka Laboratory Co., SE 1700). Absorption spectra of the films were recorded on a Shimadzu UV-3100PC spectrophotometer. Nitrogen adsorption isotherm was obtained on a BELSORP TCV (BEL Japan Inc.) system. 

Figure 1 Computerized surface profilometer, Alpha-Step 200 Tencor Instruments,...

All sensitive layers were prepared from solutions of Makrolon in mixtures of chloroform and dichlorobenzene by a spin-coating process. By adjustment of the rotation speed and time the thickness of the layers were varied between 35 nm and 455 nm. Layer thicknesses and refractive indices were determined by spectral ellipsometry. Furthermore the polymer thicknesses were verified by a surface profilometer (Alpha Step 500, Tencor Instruments, Mountain View, USA). 

Where polymers transfer to counterface surfaces in extremely thin film forms, of the order of monolayers the surface profilometer becomes ineffective and other tools must be used. A device which can measure the thickness of such films is the ellipsometer. It can detect film thicknesses of polymers on the order of angstroms. 

A host of analytical tools are available to the tribologist for the study of the wear of polymers and polymer films. Much can be learned about the wear behavior of polymer with visual observation of the wear surfaces with the scanning electron microscope while surface profilometer can assist in quantifying polymer wear. 

Given that the density of electrodeposited nontemplated vanadia is 2.87 g cm , the average density of double-gyroid structured vanadia with a volume fraction of 37.9 % is1.09 g cm, illustrating the porous nature of the DG structure [16]. Thus, the specific surface area of DG-structured V2O5 is 1.48 m g . Furthermore, the mass m of vanadia electrodes was calculated using these densities, the electrode area and thickness. The V2O5 film thickness was determined by cross-sectional SEM or with a surface profilometer. 

Today, most laser profilometer devices determine not only the longitudinal profile and roughness indices but also other surface characteristics such as transverse profile, macrotexture, crossfall, gradient or radius of curvature. The availability depends on the manufacturer and the model purchased. There are a number of high-speed profilometers on the market. A sample of the devices, also known as road surface profilometers (RSPs) or road surface testers (RSTs), is shown in Figure 16.30. 

Qualitative assessment The usefulness of optical and electron microscopy has already been mentioned. By examination at various magnifications, they give an overall qualitative impression of the surface. The use of Scanning probe microscopy is discussed elsewhere. For relatively smooth surfaces, optical interference methods may be used. Among other methods, surface profilometers are important, being a popular method that can provide routine results. 

Before illustrating actual examples of electrochemical growth of epitaxial organic films and their visualization by AEM, a brief description of the AFM method in this context is warranted. An atomic force microscope operates much like a surface profilometer. A small tip, usually of silicon or silicon nitride, at the end of a silicon cantilever is moved in small increments with piezoelectric actuators over the sample (or the sample is moved under... 

A non-contact laser surface profilometer which allows for precise characterization of surface profile has been purchased from Rodenstock Precision Optics. Profiles of microscopic surface terrain over spans of up to 60mm are achievable at a scan rate of 30 rnm/min. ITie laser beam allows surface height resolution on the order of one micron. In initial tests with the system, both longitudinal and radial profile scanning were successfully performed on cylindrical tensile test specimens. Radial scanning is possible because the footprint of the focused solid state laser (0.8 pm) is small compared to the radius of curvature of the specimen. 

The surface profilometer software calculates numerous parameters from the surface roughness profile. As the Advanced Processing Program continues, the research effort will be focused on detennining which of these roughness parameters or additional spectral analysis (max peak/unit distance, fractal dimension, etc.) are predictive of mechanical behavior, and relating them to fabrication variables. 

The major use of STM is in the research area of imaging atomic structures on clean conducting and semi-conducting surfaces, under UHV conditions. SFM, on the other hand, is widely used throughout industry as a very high resolution surface profilometer to monitor surface roughness, defects, and man-made micro or nano structures. 

These polymers were dissolved in spectroscopic grade dioxane, and then filtered through a 0.45 pm membrane. The solutions were then spin-coated onto glass slides. The film thickness was controlled to 0.2-2.0 pm by adjusting the solution concentration and spin speed. The spin-coated films were then dried under vacuum for 24 h at 40-50 and stored in a desiccator until fiirther studies. Since the sulfonated and carboxylic substituted polyazophenols were water-soluble, deionized water was used as the solvent to dissolve these polymers (pH 11 water was used for the carboxylic substituted polyazophenol). The solutions were also filtered through a 0.45 pm membrane and the films were fabricated on glass substrates at temperature of 70 °C. The thickness of all spin-coated films was measured by using a Dektak IIA surface profilometer. 

There are several methods to study the surface topography which have been developed over the years. The most common method of studying surface texture is the surface profilometer (Figure 5.3). In this method, a fine, very lighdy loaded, stylus is travelled smoothly at a constant speed across the surface... 

Figure 4.9 shows the concentration profiles for several possible standards prepared by ion implantation. The profiles were recorded on a Cameca IMS 3f using a Cs" primary beam and detecting negative secondary ions. Depth measurements were made with a contact surface profilometer. Deuterium is included because it is useful in experiments for studying as an example, hydrogen diffusion, because the... 

The thickness was measured by the contact probe surface profilometer. For this measurement a part of the gel film was scraped off with a surgical knife inunediately after deposition, and the level difference between the coated part and the scraped part was measured 1 day later or after firing. 

Gauges and equipment are available for checking surface profiles (Figs. 14.19 to 14.24). In the hands of an experienced person, a good statistical estimate can be made in a short time of a properly prepared surface. Profilometers (useful laboratory instruments) give exact... 

FIGURE 8.16 Surface profilometer tracing of thick film conductor. Dashed lines represent width of line at peak height. 

Atomic force microscope (AFM) (characterization) A stylus surface profilometer that measures the deflection of a probe mounted on a cantilever beam. The AFM can be operated in three modes contact, non-contact, and tapping. Also called the scanning force microscope (SFM). 

A Wyko NT-2000 non-contact surface profilometer was used to measure surface roughness of the contact blanks, the treated sample surfaces, and the sample free surfaces. In addition, a Hitachi S-3400N scanning electron microscope was utilized to capture images of sample surfaces. 

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