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Polymer thickness

Polymer thick films also perform conductor, resistor, and dielectric functions, but here the polymeric resias remain an iategral part after cuting. Owiag to the relatively low (120—165°C) processiag temperatures, both plastic and ceramic substrates can be used, lea ding to overall low costs ia materials and fabrication. A common conductive composition for flexible membrane switches ia touch keyboards uses fine silver particles ia a thermoplastic or thermoset polymeric biader. [Pg.126]

Figure 15-24. Spectral response or devices nude wilh different PEOPT polymer thicknesses Al/C ) (35 nm)/PEOPT (30 nin)/PEDOT-PSS (110 unU/lTO (120 ninj/glass (solid circles) and AI/Cm (35 nm)/PEOPT (40 iini)/Pl DOT-PS.S (110 mn)/lTO (120 ninj/glass (open circles). The absorption spectrum of the PEOPT polymer is plollcd for comparison (solid line) (reproduced by permission of Wiley-VCH from Ref. (92]). Figure 15-24. Spectral response or devices nude wilh different PEOPT polymer thicknesses Al/C ) (35 nm)/PEOPT (30 nin)/PEDOT-PSS (110 unU/lTO (120 ninj/glass (solid circles) and AI/Cm (35 nm)/PEOPT (40 iini)/Pl DOT-PS.S (110 mn)/lTO (120 ninj/glass (open circles). The absorption spectrum of the PEOPT polymer is plollcd for comparison (solid line) (reproduced by permission of Wiley-VCH from Ref. (92]).
The measured SAXS curve of the calibration sample must have been pre-processed in the usual way (cf. Sects. 7.3 - 7.6). Therefore it is important to have calibration samples with a well-defined thickness27. Because synchrotron beamlines can be adjusted to a fairly wide range of radiation power, it is important to have thin calibration samples for a high-power adjustment (e.g., common SAXS with wide slit openings) and thick calibration samples for low-power adjustments (e.g., USAXS with microbeam). For calibration samples from synthetic polymers, thicknesses ranging between 0.2 mm and 3 mm are reasonable. It appears worth to be noted that not only polymers, but as well glassy carbon [88] can be used as a solid secondary standard for the calibration to absolute intensity. [Pg.106]

Fig. 6.3 Four layer model for the OFRR vapor sensor. OD ring resonator outer diameter / polymer thickness d ring resonator wall thickness , n2, n2, and are the refractive indices for the medium inside (air), polymer, silica ring resonator, and medium outside (air), respectively... Fig. 6.3 Four layer model for the OFRR vapor sensor. OD ring resonator outer diameter / polymer thickness d ring resonator wall thickness , n2, n2, and are the refractive indices for the medium inside (air), polymer, silica ring resonator, and medium outside (air), respectively...
Fig. 6.5 RI sensitivity as a function of the OFRR wall thickness for the first three WGMs. The polymer thickness is fixed at 1 pm. Other parameters are the same as in Fig. 6.4. Reprinted from Ref. 29 with permission. 2008 Optical Society of America... Fig. 6.5 RI sensitivity as a function of the OFRR wall thickness for the first three WGMs. The polymer thickness is fixed at 1 pm. Other parameters are the same as in Fig. 6.4. Reprinted from Ref. 29 with permission. 2008 Optical Society of America...
Fig. 6.6 (a) k2 as a function of polymer thickness for the first three WGMs. Dashed line indicates the k2 position for the first order ring resonator wall mode in the absence of the polymer layer. The simulation parameters are the same as in Fig. 6.4, except that the polymer RI, n2, is 1.7. (b) The WGM radial distribution of the second order mode for various polymer thicknesses indicated by the arrows in (a). Vertical lines indicate the boundaries of the ring resonator wall and the polymer layer. Reprinted from Ref. 29 with permission. 2008 Optical Society of America... [Pg.131]

Figure 9.31 AFM image of a scalpel scratch used to determine the thickness of the polyethylene films grown on a Cr0v/Si02/Si(100) model catalyst. The polymer thickness correlates linearly with the reaction time (adapted from Thiine et at. [90]). Figure 9.31 AFM image of a scalpel scratch used to determine the thickness of the polyethylene films grown on a Cr0v/Si02/Si(100) model catalyst. The polymer thickness correlates linearly with the reaction time (adapted from Thiine et at. [90]).
The transient solution to Eq. 7 will be discussed in the next section. Equation 5 can also be directly integrated to relate the remaining polymer thickness to the time dependent oxide thickness... [Pg.223]

Like the homopolymers, fairly thin polymer thicknesses were observed for the copolymers [72]. Again for these block copolymer brushes, the MW and PDI are unknown, much less the actual constitution and voliune of the blocks on the polymer brush. The presence of the blocks can be confirmed where the sequence of the polymerization procedure assures consumption... [Pg.124]

Polymer Thickness Water-flux A/hr/cm Salt flux /Kg/hr/cm Salt rejection equivalent %... [Pg.583]

In situ polymerization, and electrochemical polymerization in particular [22], is an elegant procedure to form an ultra thin MIP film directly on the transducer surface. Electrochemical polymerization involves redox monomers that can be polymerized under galvanostatic, potentiostatic or potentiodynamic conditions that allow control of the properties of the MIP film being prepared. That is, the polymer thickness and its porosity can easily be adjusted with the amount of charge transferred as well as by selection of solvent and counter ions of suitable sizes, respectively. Except for template removal, this polymerization does not require any further film treatment and, in fact, the film can be applied directly. Formation of an ultrathin film of MIP is one of the attractive ways of chemosensor fabrication that avoids introduction of an excessive diffusion barrier for the analyte, thus improving chemosensor performance. This type of MIP is used to fabricate not only electrochemical [114] but also optical [59] and PZ [28] chemosensors. [Pg.231]

A quasi-steady-state approximation may be used to describe the variation of the polymer thickness with time and hence to calculate the time for onset of disintegration ... [Pg.145]

Fig.9a-c Projection along the chains of the structure of the orthorhombic Qo polymer. Thick lines indicate the location of hypothetical interchain bonds to form the tetragonal phase, a Unit cell for a rotational angle of 45° the central molecule is centered at a/2 and rotated -45°. b Rotational angle 0. c Rotational angle 29°. Reprinted with permission from R Moret, P Launois, P-A Persson, and B Sundqvist, First X-ray diffraction analysis of pressure-polymerized C60 single crystals , Europhys. Lett. vol. 40 (1997) 55-60 [62], Copyright 1997 EDP Sciences... [Pg.99]

Figure 6.4 presents the calculated value of E 2 at the PEOPT/Ceo interface versus the thickness of the molecule for two polymer thicknesses (30 nm and 40 nm). The photocurrent measurements given by the external quantum efficiency 77 (see Sect. 6.3) of these devices reflect the predictions of the calculated optical field distribution. When the Ceo thickness was fixed at 34 nm and the PEOPT thickness was chosen as 30 nm and 40 nm, the 77 value of the thinner device reached 23%, while that of the thicker one reached 17% (Fig. 6.5). The thicker polymer layer only acted as a filter to the active region, decreasing the intensity and hence also the photocurrent. It can be observed that the ratio of I 2 at the interface is 1.12 while the 77 measurement gives a ratio of 23/17=1.35, which is quite similar considering possible experimental errors in thickness determination. Figure 6.4 presents the calculated value of E 2 at the PEOPT/Ceo interface versus the thickness of the molecule for two polymer thicknesses (30 nm and 40 nm). The photocurrent measurements given by the external quantum efficiency 77 (see Sect. 6.3) of these devices reflect the predictions of the calculated optical field distribution. When the Ceo thickness was fixed at 34 nm and the PEOPT thickness was chosen as 30 nm and 40 nm, the 77 value of the thinner device reached 23%, while that of the thicker one reached 17% (Fig. 6.5). The thicker polymer layer only acted as a filter to the active region, decreasing the intensity and hence also the photocurrent. It can be observed that the ratio of I 2 at the interface is 1.12 while the 77 measurement gives a ratio of 23/17=1.35, which is quite similar considering possible experimental errors in thickness determination.
All sensitive layers were prepared from solutions of Makrolon in mixtures of chloroform and dichlorobenzene by a spin-coating process. By adjustment of the rotation speed and time the thickness of the layers were varied between 35 nm and 455 nm. Layer thicknesses and refractive indices were determined by spectral ellipsometry. Furthermore the polymer thicknesses were verified by a surface profilometer (Alpha Step 500, Tencor Instruments, Mountain View, USA). [Pg.174]

Here we report a wet surface modification of PMDA-ODA and poly-(bisphenyl dianhydride-para-phenylenediamine) (BPDA-PDA) with KOH or NaOH solution. The modified surfaces are identified with contact angles, XPS spectra and ER IR spectra. Polymer thickness and weight changes are also studied. The depth of modified layer is measured by a non-destructive technique using ER IR and ellipsometry. Relationship between surface structure and adhesion strength is discussed. [Pg.181]

One of the most commonly used acid catalysts in organic reactions is p-toluensulfonic acid (PTSA). This acid was used to evaluate the possibility of selfcondensation of MAGME -polymers. Thick (20 ym) films were coated on glass plates and cured in an oven at different temperatures and curing times. Data in Table 2 show the time required at lowest possible curing temperature. In the case of PTSA it was difficult to achieve curing at temperatures below 120 C. This, and the fact that it took nearly... [Pg.163]

In this strategy, an ally 1 group is attached to the substrate bound silicon that then reacts in a cross metathesis fashion with (2a). Then this surface bound Ru-alkylidene catalyzes ROMP of norbomene to give alkyl silicon terminated polymer film that is thus attached to the surface in controllable density and polymer thickness. [Pg.5630]


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See also in sourсe #XX -- [ Pg.318 , Pg.325 ]




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