Solids spectrometry

The essentially non-destmetive nature of Rutherford backscattering spectrometry, combmed with the its ability to provide botli compositional and depth mfomiation, makes it an ideal analysis tool to study thm-film, solid-state reactions. In particular, the non-destmetive nature allows one to perfomi in situ RBS, thereby characterizing both the composition and thickness of fomied layers, without damaging the sample. Since only about two minutes of irradiation is needed to acquire a Rutherford backscattering spectmm, this may be done continuously to provide a real-time analysis of the reaction [6]. 

Tirira J, Serruys Y and Trooeiiier P 1996 Forward Recoil Spectrometry —Applications to Hydrogen Determination in Solids (New York Pienum)... 

To examine a sample by inductively coupled plasma mass spectrometry (ICP/MS) or inductively coupled plasma atomic-emission spectroscopy (ICP/AES) the sample must be transported into the flame of a plasma torch. Once in the flame, sample molecules are literally ripped apart to form ions of their constituent elements. These fragmentation and ionization processes are described in Chapters 6 and 14. To introduce samples into the center of the (plasma) flame, they must be transported there as gases, as finely dispersed droplets of a solution, or as fine particulate matter. The various methods of sample introduction are described here in three parts — A, B, and C Chapters 15, 16, and 17 — to cover gases, solutions (liquids), and solids. Some types of sample inlets are multipurpose and can be used with gases and liquids or with liquids and solids, but others have been designed specifically for only one kind of analysis. However, the principles governing the operation of inlet systems fall into a small number of categories. This chapter discusses specifically substances that are normally liquids at ambient temperatures. This sort of inlet is the commonest in analytical work. 

The nebulization concept has been known for many years and is commonly used in hair and paint spays and similar devices. Greater control is needed to introduce a sample to an ICP instrument. For example, if the highest sensitivities of detection are to be maintained, most of the sample solution should enter the flame and not be lost beforehand. The range of droplet sizes should be as small as possible, preferably on the order of a few micrometers in diameter. Large droplets contain a lot of solvent that, if evaporated inside the plasma itself, leads to instability in the flame, with concomitant variations in instrument sensitivity. Sometimes the flame can even be snuffed out by the amount of solvent present because of interference with the basic mechanism of flame propagation. For these reasons, nebulizers for use in ICP mass spectrometry usually combine a means of desolvating the initial spray of droplets so that they shrink to a smaller, more uniform size or sometimes even into small particles of solid matter (particulates). 

Until about the 1990s, visible light played little intrinsic part in the development of mainstream mass spectrometry for analysis, but, more recently, lasers have become very important as ionization and ablation sources, particularly for polar organic substances (matrix-assisted laser desorption ionization, MALDI) and intractable solids (isotope analysis), respectively. 

Modern commercial lasers can produce intense beams of monochromatic, coherent radiation. The whole of the UV/visible/IR spectral range is accessible by suitable choice of laser. In mass spectrometry, this light can be used to cause ablation, direct ionization, and indirect ionization (MALDI). Ablation (often together with a secondary ionization mode) and MALDI are particularly important for examining complex, intractable solids and large polar biomolecules, respectively. 

The term nebulizer is used generally as a description for any spraying device, such as the hair spray mentioned above. It is normally applied to any means of forming an aerosol spray in which a volume of liquid is broken into a mist of vapor and small droplets and possibly even solid matter. There is a variety of nebulizer designs for transporting a solution of analyte in droplet form to a plasma torch in ICP/MS and to the inlet/ionization sources used in electrospray and mass spectrometry (ES/MS) and atmospheric-pressure chemical ionization and mass spectrometry (APCI/MS). 

The previous discussion has centered on how to obtain as much molecular mass and chemical structure information as possible from a given sample. However, there are many uses of mass spectrometry where precise isotope ratios are needed and total molecular mass information is unimportant. For accurate measurement of isotope ratio, the sample can be vaporized and then directed into a plasma torch. The sample can be a gas or a solution that is vaporized to form an aerosol, or it can be a solid that is vaporized to an aerosol by laser ablation. Whatever method is used to vaporize the sample, it is then swept into the flame of a plasma torch. Operating at temperatures of about 5000 K and containing large numbers of gas ions and electrons, the plasma completely fragments all substances into ionized atoms within a few milliseconds. The ionized atoms are then passed into a mass analyzer for measurement of their atomic mass and abundance of isotopes. Even intractable substances such as glass, ceramics, rock, and bone can be examined directly by this technique. 

Historically, the term SIMS was developed for bombardment of solid surfaces with ions, so, for greater descriptive precision, the name liquid secondary ion mass spectrometry (LSIMS) is better and can be used synonymously with FAB,... 

The term liquid secondary ion mass spectrometry (LSIMS) is sometimes used synonymously with FAB and is preferred by some as being more descriptive, since FAB could apply to bombardment of solid or liquid surfaces and does not indicate the types of secondaries investigated. In practice, little confusion is likely to result from using either term. Strictly, LSIMS can refer to the use of fast ions (FIB). 

Desorption ionization (DI). General term to encompass the various procedures (e.g., secondary ion mass spectrometry, fast-atom bombardment, californium fission fragment desorption, thermal desorption) in which ions are generated directly from a solid or liquid sample by energy input. Experimental conditions must be clearly stated. 

Reduced molibdophosphoric HPA was found to be well recovered by silica modified with tetradecyl ammonium nitrate. It was assumed as a basis of phosphoms determination in the range of 0.5-5 pmole using solid-phase spectrometry. 

Solid-phase microextraction (SPME) was used for headspace sampling. The FFA were extracted from the headspace with PA, Car/PDMS, and CW/DVB fibers. It was examined whether addition of salt (NaCl) and decreasing the pH by addition of sulphuric acid (H SO ) increased the sensitivity. FFA were analyzed using gas chromatography coupled to mass spectrometry in selected ion monitoring. 

The development of methods using sorbents modified with analytical reagents that enable analytical signal measuring directly on the surface by solid-phase spectrometry, visually or by electrothermic atomic absorption spectroscopy (ETAAS) after elution is now a subject of growing interest. 

The liquid chromatography - tandem mass spectrometry (LC/MS/MS) technique was proposed for the determination of corticosteroids in plasma and cerebrospinal fluid (CSF, liquor) of children with leucosis. Preliminai y sample prepai ation included the sedimentation of proteins, spinning and solid-phase extraction. MS detection was performed by scanning selected ions, with three chai acteristic ions for every corticosteroids. The limit of detection was found 80 pg/ml of plasma. 

Laser based mass spectrometric methods, such as laser ionization (LIMS) and laser ablation in combination with inductively coupled plasma mass spectrometry (LA-ICP-MS) are powerful analytical techniques for survey analysis of solid substances. To realize the analytical performances methods for the direct trace analysis of synthetic and natural crystals modification of a traditional analytical technique was necessary and suitable standard reference materials (SRM) were required. Recent developments allowed extending the range of analytical applications of LIMS and LA-ICP-MS will be presented and discussed. For example ... 

Direct atomic absorption spectrometry (AAS) analysis of increasing (e 0,10 g) mass of solid samples is the great practical interest since in a number of cases it allows to eliminate a long-time and labor consuming pretreatment dissolution procedure of materials and preconcentration of elements to be determined. Nevertheless at prevalent analytical practice iS iO based materials direct AAS are not practically used. 

ON-LINE COUPLING OF CONTINUOUS-FLOW FRACTIONATION OF HEAVY METALS IN ENVIRONMENTAL SOLIDS WITH ATOMIC EMISSION SPECTROMETRY... 

This assumes that the gas-solid exchange kinetics at the interface is rapid. When this process affects the exchange kinetics significantly dieii analysis of concentrations layer by layer in die diffused sample is necessaty. This can be done by the use of SIMS (secondary ion mass spectrometry) and the equation used by Kihier, Steele and co-workers for this diffusion study employs a surface exchange component. 

In Secondary Ion Mass Spectrometry (SIMS), a solid specimen, placed in a vacuum, is bombarded with a narrow beam of ions, called primary ions, that are suffi-ciendy energedc to cause ejection (sputtering) of atoms and small clusters of atoms from the bombarded region. Some of the atoms and atomic clusters are ejected as ions, called secondary ions. The secondary ions are subsequently accelerated into a mass spectrometer, where they are separated according to their mass-to-charge ratio and counted. The relative quantities of the measured secondary ions are converted to concentrations, by comparison with standards, to reveal the composition and trace impurity content of the specimen as a function of sputtering dme (depth). 

Sputtered Neutral Mass Spectrometry (SNMS) is the mass spectrometric analysis of sputtered atoms ejected from a solid surface by energetic ion bombardment. The sputtered atoms are ionized for mass spectrometric analysis by a mechanism separate from the sputtering atomization. As such, SNMS is complementary to Secondary Ion Mass Spectrometry (SIMS), which is the mass spectrometric analysis of sputtered ions, as distinct from sputtered atoms. The forte of SNMS analysis, compared to SIMS, is the accurate measurement of concentration depth profiles through chemically complex thin-film structures, including interfaces, with excellent depth resolution and to trace concentration levels. Genetically both SALI and GDMS are specific examples of SNMS. In this article we concentrate on post ionization only by electron impact. 

In Laser Ionization Mass Spectrometry (LIMS, also LAMMA, LAMMS, and LIMA), a vacuum-compatible solid sample is irradiated with short pulses ("10 ns) of ultraviolet laser light. The laser pulse vaporizes a microvolume of material, and a fraction of the vaporized species are ionized and accelerated into a time-of-flight mass spectrometer which measures the signal intensity of the mass-separated ions. The instrument acquires a complete mass spectrum, typically covering the range 0— 250 atomic mass units (amu), with each laser pulse. A survey analysis of the material is performed in this way. The relative intensities of the signals can be converted to concentrations with the use of appropriate standards, and quantitative or semi-quantitative analyses are possible with the use of such standards. 

Spark Source Mass Spectrometry (SSMS) is a method of trace level analysis—less than 1 part per million atomic (ppma)—in which a solid material, in the form of two conducting electrodes, is vaporized and ionized by a high-voltage radio frequency spark in vacuum. The ions produced from the sample electrodes are accelerated into a mass spectrometer, separated according to their mass-to-charge ratio, and collected for qualitative identification and quantitative analysis. 

In Dynamic Secondary Ion Ma s Spectrometry (SIMS), a focused ion beam is used to sputter material from a specific location on a solid surface in the form of neutral and ionized atoms and molecules. The ions are then accelerated into a mass spectrometer and separated according to their mass-to-charge ratios. Several kinds of mass spectrometers and instrument configurations are used, depending upon the type of materials analyzed and the desired results. 

This article discusses why one would choose nonresonant multiphoton ionization for mass spectrometry of solid surfaces. Examples are given for depth profiling by this method along with thermal desorption studies. 

The atom flux sputtered from a solid surface under energetic ion bombardment provides a representative sampling of the solid. Sputtered neutral mass spectrometry has been developed as method to quantitatively measure the composition of this atom flux and thus the composition of the sputtered material. The measurement of ionized sputtered neutrals has been a significant improvement over the use of sputtered ions as a measure of flux composition (the process called SIMS), since sputtered ion yields are seriously affected by matrix composition. Neutral panicles are ionized by a separate process after sputter atomization, and SNMS quantitation is thus independent of the matrix. Also, since the sputtering and ionization processes are separate, an ionization process can be selected that provides relatively uniform yields for essentially all elements. 

Laser ionization mass spectrometry or laser microprobing (LIMS) is a microanalyt-ical technique used to rapidly characterize the elemental and, sometimes, molecular composition of materials. It is based on the ability of short high-power laser pulses (-10 ns) to produce ions from solids. The ions formed in these brief pulses are analyzed using a time-of-flight mass spectrometer. The quasi-simultaneous collection of all ion masses allows the survey analysis of unknown materials. The main applications of LIMS are in failure analysis, where chemical differences between a contaminated sample and a control need to be rapidly assessed. The ability to focus the laser beam to a diameter of approximately 1 mm permits the application of this technique to the characterization of small features, for example, in integrated circuits. The LIMS detection limits for many elements are close to 10 at/cm, which makes this technique considerably more sensitive than other survey microan-alytical techniques, such as Auger Electron Spectroscopy (AES) or Electron Probe Microanalysis (EPMA). Additionally, LIMS can be used to analyze insulating sam-... 

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