Phase image

FIGURE 12.3 Atomic force microscopy (AFM) phase images of A, unaged and B, aged melamine fiber filaments at a scan area of 5 X 5 p,m. Arrows indicate direction of major fiber axis. (From Rajeev, R.S., Bhowmick, A.K., De, S.K., Gong, B., and Bandyopadhyay, S., J. Adh. Set Technol., 16, 1957, 2002. With permission.)... 

FIGURE 20.4 (a, b) Height and phase images of rubber blend of natural rubber (NR) and butylene rubber (BR) (50 50), which were taken immediately after cryo-ultramicrotomy. (c, d) Height and phase images of the same sample location as in (a, b) taken 12 h later. 

FIGURE 20.5 Phase images of neat rubbers (a) natural rubber (NR), (b) butylene rubber (BR),... 

FIGURE 20.6 Phase images of ethylene-propylene-diene terpol3mier (EPDM) samples at different scales. Images of the unvulcanized sample are shown in (a, d) and images of samples, which were cross-linked with different amount of sulfur curative—1 phr—in (b, e) and 2 phr—in (c, f). White arrows in (f) most likely indicate locations with small sulfur crystals. 

FIGURE 20.7 Phase images of ethylene-propylene-diene terpolymer (EPDM) samples loaded with oil (50 wt%). Image in (a) was obtained on the unvulcanized sample and images in (b,c,d) on samples cross-linked with different amounts of sulfur curative 0.5, 1.0, 1.5 phr, respectively. 

FIGURE 20.9 Phase images of cryo-ultramicrotomed surfaces of PU samples with different content of soft blocks 70% (a-b), 50% (c-d). 

FIGURE 20.10 (a,b) Phase images of cryo-ultramicrotomed surfaces of triblock copolymer styrene and ethylene-butylene (SEES) samples of neat material and loaded with oil (40 wt%), respectively. (c,d) Phase images of film of triblock copolymer poly(methyl methacrylate-polyisobutylene-poly(methyl methacrylate) (PMMA-PIB-PMMA) immediately after spin-casting and after 3 h annealing at 100°C, respectively. Inserts in the top left and right comers of the images show power spectra with the value stmctural parameter of microphase separation. 

One of the key issues of mechanical behavior of multicomponent materials such as TPV is the stmcture and properties of the interface regions. The phase image in Figure 20.1 Id shows a part of TPV sample with few mbber domains surrounded by iPP matrix. An extended rectangle area outlined with a white dotted box includes several interfaces between mbber domains and the plastic matrix. Examination of the interfaces is a challenging task and one possible approach is AFM-based... 

FIGURE 20.12 (a) Top part shows variations of elastic modulus profile measured in different locations of the polypropylene (PP)-ethylene-propylene-diene terpolymer (EPDM) blend. The locations are shown by white dots in the blend phase image placed at the bottom. Vertical white dashed lines show the components borders and the elastic modulus value for this location. Vertical black dotted lines indicate the locations where elastic modulus E gradually changes between PP (E ) and EPDM (E )- These values are indicated with black arrows on the E axis, (b) LvP curves for PP-matrix, EPDM-domains, and one of interface locations. The approach curves are seen as solid black lines and the retract curves as gray lines. 

FIGURE 20.14 (a) Height image of a cluster of carbon black (CB) particles. The sample was prepared by pressing the particles into a pellet, (b) Optical micrograph of a cryo-ultramicrotome cut of a mbbery composite loaded with silica, (c, d) Phase images of a nanocomposite of polyurethane (PU) loaded with silica and a mbber blend based on natural mbber (NR) and styrene-butadiene copolymer (SBR) loaded with siUca, respectively. The samples were prepared with a cryo-ultramicrotome. 

FIGURE 20.15 Phase images of samples of triblock copol3mier styrene and ethylene-butylene (SEES) filled with clay particles (5 wt%) with (a) poor mixing and exfoliation and (b) fine distribution of clay layers. 

Belikov, S., Erina, N., and Magonov, S., Interplay between an experiment and theory in probing mechanical properties and phase imaging of heterogeneous polymer materials, J. Phys., Conference Series, 61, 765, 2007. 

FIGURE 21.20 Tapping-mode atomic force microscopic (AFM) height image left) and phase image right) of NRIO sample. The stmctures indicated hy circles are considered to he carhon hlack (CB) fillers. 

With this imaging system it is possible to study virtually all metals and alloys, many semiconductors and some ceramic materials. The image contrast from alloys and two-phase materials is difficult to predict quantitatively, as the effects of variations in chemistry on local field ion emission characteristics are not fully understood. However, in general, more refractory phases image more brightly in the FIM. Information regarding the structure of solid solutions, ordered alloys, and precipitates in alloys has been obtained by FIM. 

Figure 5.7 AFM images of fibrous aggregates of D-Glu-8 (1) lying directly on silicon surfaces (a) network of fibers (b) high-resolution phase image of quadruple helices. Reprinted with permission from Ref. 42. Copyright 2000 by the American Chemical Society.

---