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Atomic phase image

In the conventional theory of elastic image fomiation, it is now assumed that the elastic atomic amplitude scattering factor is proportional to the elastic atomic phase scattering factor, i.e. [Pg.1638]

FIGURE 12.3 Atomic force microscopy (AFM) phase images of A, unaged and B, aged melamine fiber filaments at a scan area of 5 X 5 p,m. Arrows indicate direction of major fiber axis. (From Rajeev, R.S., Bhowmick, A.K., De, S.K., Gong, B., and Bandyopadhyay, S., J. Adh. Set Technol., 16, 1957, 2002. With permission.)... [Pg.360]

FIGURE 21.20 Tapping-mode atomic force microscopic (AFM) height image left) and phase image right) of NRIO sample. The stmctures indicated hy circles are considered to he carhon hlack (CB) fillers. [Pg.602]

Figure 10.6 STM images of the Ni(l 11) (5 /3 x 2)S phase and a model for the structure proposed to explain the decreased density of nickel within the islands, (a) 15.0 x 16.5 nm image showing the three possible domains of the (5 /3 x 2)S structure the brighter part of the image corresponds to an adlayer that has developed on top of a nickel island formed during H2S adsorption, (b) 1.8 x 2.9 nm atomically resolved image of the (5 /3 x 2)S structure, (c) Proposed clock structure for the (5 /3 x 2)S phase that accounts for the reduced nickel density in the sulfur adlayer. (Reproduced from Refs. 23 and 25). Figure 10.6 STM images of the Ni(l 11) (5 /3 x 2)S phase and a model for the structure proposed to explain the decreased density of nickel within the islands, (a) 15.0 x 16.5 nm image showing the three possible domains of the (5 /3 x 2)S structure the brighter part of the image corresponds to an adlayer that has developed on top of a nickel island formed during H2S adsorption, (b) 1.8 x 2.9 nm atomically resolved image of the (5 /3 x 2)S structure, (c) Proposed clock structure for the (5 /3 x 2)S phase that accounts for the reduced nickel density in the sulfur adlayer. (Reproduced from Refs. 23 and 25).
Fig. 21 Atomic force microscopy (AFM) phase images of all block copolymers in the library after spin coating from 2% w/v solution in toluene. No annealing has been performed. The scale bar represents 100 nm. (Reprinted with permission from [78]. Copyright (2005) Royal Society of Chemistry)... Fig. 21 Atomic force microscopy (AFM) phase images of all block copolymers in the library after spin coating from 2% w/v solution in toluene. No annealing has been performed. The scale bar represents 100 nm. (Reprinted with permission from [78]. Copyright (2005) Royal Society of Chemistry)...
The nature of structural orders in the PQT-12 thin films can be further characterized by atomic-force microscopic (AFM) analysis. Figure 4.10 shows the AFM phase images of a 20-nm PQT-12 film on an OTS-8-modified wafer surface before... [Pg.91]

The resulting physical picture of a rubber-like system as a close-packed collection of mers is radically different from the two-phase image introduced by James and Guth [10]. The latter represents mbber as a network of chains, which act as entropic springs in tension, embedded in a bath of simple liquid. The bath gives rise to an isotropic pressure, whereas the network is responsible for the deviatoric stress. More recent physical pictures consider as well the distribution of network junctions in the liquid and the action of these junctions as constraints on the free motion of a generic chain of the network. The current description is on the mer or atomic level and treats the full stress tensor, both the mean and deviatoric portions, in terms of atomic interactions. [Pg.7]

Scheme 3.2 (Top and middle) General schematic for the generation of nanoporous PS film. (Bottom) Atomic force microscopy (AFM) phase images of (a) PS375-tR.il]-PE0225 thin film, and (b) nanoporous PS film from oxidation-induced cleavage of the [Ru] junction. Scheme 3.2 (Top and middle) General schematic for the generation of nanoporous PS film. (Bottom) Atomic force microscopy (AFM) phase images of (a) PS375-tR.il]-PE0225 thin film, and (b) nanoporous PS film from oxidation-induced cleavage of the [Ru] junction.
Raghavan, D. et al.. Mapping polymer heterogeneity using atomic force microscopy phase imaging and nanoscale indentation. Macromolecules 33, 2573-2583, 2000. [Pg.335]


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Atomic force microscopy phase-imaging

Atomic imaging

Atomic phase imaging

Atomic phase imaging

Atoms images

Phase images

Phase imaging

Tapping mode atomic force microscopy phase images

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