Height image

FIGURE 20.14 (a) Height image of a cluster of carbon black (CB) particles. The sample was prepared by pressing the particles into a pellet, (b) Optical micrograph of a cryo-ultramicrotome cut of a mbbery composite loaded with silica, (c, d) Phase images of a nanocomposite of polyurethane (PU) loaded with silica and a mbber blend based on natural mbber (NR) and styrene-butadiene copolymer (SBR) loaded with siUca, respectively. The samples were prepared with a cryo-ultramicrotome. 

FIGURE 21.15 The results of force-volume measurement on NRIO sample, (a) Apparent height image, (b) reconstmcted real height image, and (c) Young s modulus distribution image. The maximum load was set to 6.0 nN. 

FIGURE 21.20 Tapping-mode atomic force microscopic (AFM) height image left) and phase image right) of NRIO sample. The stmctures indicated hy circles are considered to he carhon hlack (CB) fillers. 

Figure 15. Contact mode AFM height images of PE foils before (HDPE and LDPE) and after 400 s modification in Ar plasma (HDPE/400, LDPE/400). [70],...

For imaging applications, minimisation of the damage to DNA molecules by the AFM tip is essential. One method of less-invasive imaging is based on phase (rather than height) imaging, which employs for instance 100 mm long silicon nitride cantilevers with narrow arms inserted into a fluid cell [65]. Alternatively, or better complementary, the operation in liquids [66], and... 

Fig. 6 Morphological AFM images of PS brushes. The topological or height image (left) and the amplitude or phase image (right) are shown a after polymerization to form PS brushes in benzene/THF (sample 3), X-Y (3.0 x 3.0 p.m), and Z (27.5 nm) b small-area scan of PS brushes in benzene/THF (sample 3), X-Y (1.35 x 1.35 p.m), and Z (8.5 nm), showing dendritic morphology and c after polymerization to form PS brushes in TMEDA on Au-coated glass, X-Y (3.0 x 3.0 p.m), and Z (2.25 nm) [72]...

Fig. 5a-d AFM images of DNA assembled in various devices, a Mixed-sequence DNA between platinum electrodes spaced by 40 nm. Scale bar 50 nm. b Height image of poly(dG)-poly(dC) DNA bundles on platinum electrodes. The distance between electrodes is 200 nm, and the scale bar is 1 um. c High magnification image of the device shown in b. Several DNA bundles clearly extend over the two electrodes. Scale bar 200 nm. d Poly(dG)-poly(dC) DNA bundles on platinum electrodes fabricated on a mica substrate. Scale bar 500 nm. For all these devices, no conduction was observed (from [59], with permission Copyright 2001 by the American Institute of Physics)... 

Fig. 8. Surface structure of a single crystal of perfluorododecyleicosane F(CF2 )12(CH2)20H measured by contact mode SFM on the (a) micrometer and (b) nanometer scale. The constant height image in (a) shows variation of the normal force, while the constant force image in (b) displays variation in height caused by densely packed CF3 end groups protruding at the surface...

Fig. 16. a Schematic diagram of the pressure chamber for characterisation of flat membranes by means of a pneumatic SFM. b Height image of a nuclear pore membrane of polycarbonate recorded by the pneumatic SFM at a pressure difference of 0.4 bar. The elevations are resulted from the nitrogen streams through the pores. Reproduced from [167]... 

Fig.25. Surface structures formed on mica upon adsorption of P(S-fc-4VP) 330-130 from chloroform [279]. The 2.5x2.5 pm2 height images were obtained by contact mode SFM. Depending on the solution concentration, the morphology developed from small islands on the left to lamellar morphology on the right. The solution concentrations are indicated above the micrographs. The drawing below illustrates the transition from the A dot-like to B stripe-like morphology caused by variation of the block-length ratio. Courtesy of P. Eibeck and M. Moller...

Fig. 47. Height (top) and phase (bottom) images of a microlayered PE sample recorded on the surface perpendicular to the layer plane using A0= 100 nm a light tapping (rsp=0.8—0.9) b moderate tapping (rsp=0.4-0.7) and chard tapping (rsp=0.1-0.3). In all height images the contrast covers variations in the 0-170 nm range. In the phase images, the contrast covers phase shifts in the 20° (a,b) and 50° in (c). Reproduced from [110]...

Fig. 54. a A typical image of closely packed pZT plasmid DNA molecules adsorbed onto a cationic lipid membrane of dipalmitoyldimethyl ammoniumylpropane. The image was recorded in 20 mMNaCl [513]. b Height image of tobacco mosaic viruses on the mica surface modified with bovine serum albumin (BSA). In contrast, direct adsorption from a solution containing BSA led to disperse adsorption of the TMV rods [517]... 

Fig. 4 (a) SFM phase image (3x1.5 im) of the surface structures in SB47 films annealed in vacuum at 120°C. The white contour lines are taken from the height image (not shown) and mark the borders between the flat regions, as well as the transition region between the indicated terraces, (b) Spacings of cylindrical microdomains as a function of the local film thickness... 

Fig. 18 SFM height images (scale 20 nm) of representative surface structures in SV films after spin-coating from chloroform solution (a), and from toluene solution (b). (c) Comparison of the swelling kinetics of400-nm-thick SV films with starting micelle (triangles) and lamella (circles) morphologies...

Fig. 6 Overview of the wavelength ranges that can be routinely achieved using the various modification techniques of PDMS surfaces. The inset displays a 3-D AFM height-image of a plasma-modified surfaces...

Fig. 8 Increase of wavelength (filled triangles) and amplitude (open circles) of the wrinkles with increasing plasma dose (oxygen plasma exposure time multiplied by plasma power). The values were evaluated by quantitative FFT-analysis applied to AFM height-images...

Fig. 16 Top-. Summary of the p.CP process using wrinkled stamps. Bottom AFM height-images 5 x 5 Llm (height scale AZ= 15nm) of surfaces, which are patterned via pCP by the use of wrinkled stamps with different periodicities and heights. With increasing features of the stamp, the stripes of the pattern broaden and separate, (a) A/X 25/302 nm, (b) A/X 40/355nm, (c) A/X 60/426 nm, A) A/X 100/603 nm, (c)A/X 150/743 nm, (f)A/X 200/931 nm) [48]...

Figure 20 AFM image (tapping mode, height image) of a dry cellulose film. The cellulose concentration was 0.5%w/w. The root-mean-square surface roughness was 5.0 nm (courtesy of M. Liu, University of Birmingham, UK).

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