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Phase composite films, image

Figure 21.19 SAXS traces with mesophase assignment of the polymer—inorganic composite films and SEM images of individual nanoparticles (a) sphere, (b) hexagonal cylinder, and (c) lamellar morphologies. The schematic in the middle shows nanoparticle shapes obtained from each phase through dissolution of the films and subsequent calcinations.61 (Reprinted with permission from C. B. W. Garcia et al., J. Am. Chem. Soc. 2003, 125, 13310-13311. Copyright 2003 American Chemical Society.)... Figure 21.19 SAXS traces with mesophase assignment of the polymer—inorganic composite films and SEM images of individual nanoparticles (a) sphere, (b) hexagonal cylinder, and (c) lamellar morphologies. The schematic in the middle shows nanoparticle shapes obtained from each phase through dissolution of the films and subsequent calcinations.61 (Reprinted with permission from C. B. W. Garcia et al., J. Am. Chem. Soc. 2003, 125, 13310-13311. Copyright 2003 American Chemical Society.)...
Fig. 20 AFM micrographs (both height image and phase image) of MEH-PPV/C60 (20 wt %) composite films fabricated with a xylene, b DCB, and c THE The phase image enables calculation of the 50 surface coverage. (Reproduced from [118] with permission, 2001, Wiley-VCH)... Fig. 20 AFM micrographs (both height image and phase image) of MEH-PPV/C60 (20 wt %) composite films fabricated with a xylene, b DCB, and c THE The phase image enables calculation of the 50 surface coverage. (Reproduced from [118] with permission, 2001, Wiley-VCH)...
FIGURE 6.6 Cross-sectional SEM images of PHBV-cellulose composite films with (a) low filler concentration—good dispersion and phase continuity and (b) high filler concentration—phase discontinuity and reduced homogeneity. (Data from Sanchez-Garcia, M.D., Carbohydrate Polymers, 71, 235-244, 2008.)... [Pg.205]

Figure 5 Images of a thin region of an epitaxial film of Ge on Si grown by oxidation of Ge-implanted Si (a) conventional TEM phase contrast image with no compositional information and b) high-angle dark-field STEM image showing atomically sharp interface between Si and Ge. (Courtesy of S.J. Pennycook)... Figure 5 Images of a thin region of an epitaxial film of Ge on Si grown by oxidation of Ge-implanted Si (a) conventional TEM phase contrast image with no compositional information and b) high-angle dark-field STEM image showing atomically sharp interface between Si and Ge. (Courtesy of S.J. Pennycook)...
Fig. 10 displays STM images of several PtMe(lll) alloy surfaces with surface compositions around 50% Pt. A quantification of SRO in terms of correlations is given in Table 2. The PtFe sample was not a bulk alloy but rather a thin (= 8 monolayers) alloy film created by annealing a thin Fe film on Pt(lll). The Pt25Niy5 and Pt25Co75 crystals can form LI2 bulk ordered phases, but we did not find any indications thereof, presumably because the formation of these phases would require a very slow cooldown. [Pg.135]


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Compositional images

Imaging composition

Phase composition

Phase images

Phase imaging

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