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Phase imaging TMAFM

TMAFM and Phase Imaging are proving to be excellent methods for the characterization of microbial attachment features. Maurice et al. and Forsythe et al. (5,... [Pg.64]

Figure 11.7 TMAFM phase images of poly(3-hexylthiophene)-b-poly(2-ethyl-2-oxazoline) (P3HT-PEOXA) diblock copolymers (a) 5 mol% PEOXA (b) 15 mol% PEOXA (c) 30 mol% PEOXA. Reproduced with permission from Ref [93]. Copyright 2010, Wiley-VCH Verlag GmbH. Figure 11.7 TMAFM phase images of poly(3-hexylthiophene)-b-poly(2-ethyl-2-oxazoline) (P3HT-PEOXA) diblock copolymers (a) 5 mol% PEOXA (b) 15 mol% PEOXA (c) 30 mol% PEOXA. Reproduced with permission from Ref [93]. Copyright 2010, Wiley-VCH Verlag GmbH.
Figure 11.24 TMAFM images of poly(3- (c and d) height and phase images of... Figure 11.24 TMAFM images of poly(3- (c and d) height and phase images of...
Figure 2.15 Tapping mode atomic force microscopy (TMAFM) phase images of poly(3-hexylthiophene) diblock copolymers (scan size 2x2 iu.m) (a) poly(3-hexylthiophene)-b-poly(methyl methacrylate) (15 mol % PHT) (b) poly(3-hexylthlophene)-b-poly(isobornyl methacrylate) (15 mol% PHT) (c) poly(3-hexylthiophene) b-poly(t-butyl methacrylate) (60 mol % PHT) (d) poly(3-hexylthiophene)-b-poly(t-butyl methacrylate) (15 mol % PHT)... Figure 2.15 Tapping mode atomic force microscopy (TMAFM) phase images of poly(3-hexylthiophene) diblock copolymers (scan size 2x2 iu.m) (a) poly(3-hexylthiophene)-b-poly(methyl methacrylate) (15 mol % PHT) (b) poly(3-hexylthlophene)-b-poly(isobornyl methacrylate) (15 mol% PHT) (c) poly(3-hexylthiophene) b-poly(t-butyl methacrylate) (60 mol % PHT) (d) poly(3-hexylthiophene)-b-poly(t-butyl methacrylate) (15 mol % PHT)...
As mentioned above, the spm is mostly limited to sampling the near-sinface region of a polymer system. A new technique based on tmafm has been developed to enable volume imaging with the spm. This study tracked a series of height and phase images of a styrene-butadiene-styrene (SBS) triblock polymer microdomain as the surface was being removed 7.5 nm at a time with a plasma etcher. These data are illustrated in Figure 10 (65). [Pg.656]

Figure 3.7. TMAFM images of a (001) surface of an as-received EDT-TTF-(CONHMe)2 single crystal measured under ambient conditions (2.5 im x 2.5 j.m) (a) topography and (b) phase. The phase angle is defined as the phase shift observed between the cantilever oscillation and the signal sent to the piezo-scanner driving the cantilever. Figure 3.7. TMAFM images of a (001) surface of an as-received EDT-TTF-(CONHMe)2 single crystal measured under ambient conditions (2.5 im x 2.5 j.m) (a) topography and (b) phase. The phase angle is defined as the phase shift observed between the cantilever oscillation and the signal sent to the piezo-scanner driving the cantilever.
Figure 1. TMAFM height (a) and phase detection (b) images (1x1 pm ) of the 14,500-63,000-14,500 MBuM copolymer (Sample A). The Root Mean Square roughness of the height image is about 1.6 nm illustrating the flatness of such a thin film. The phase contrast shows the morphology of the copolymer. The inset shows that the PMMA domains are locally arranged in a centered hexagonal structure. Figure 1. TMAFM height (a) and phase detection (b) images (1x1 pm ) of the 14,500-63,000-14,500 MBuM copolymer (Sample A). The Root Mean Square roughness of the height image is about 1.6 nm illustrating the flatness of such a thin film. The phase contrast shows the morphology of the copolymer. The inset shows that the PMMA domains are locally arranged in a centered hexagonal structure.
Figure 3. TMAFM phase detection image (2x2 pm ) of the 30,000-63,000-30,000 MBuM copolymer film (Sample B). Figure 3. TMAFM phase detection image (2x2 pm ) of the 30,000-63,000-30,000 MBuM copolymer film (Sample B).

See other pages where Phase imaging TMAFM is mentioned: [Pg.74]    [Pg.60]    [Pg.64]    [Pg.65]    [Pg.65]    [Pg.652]    [Pg.33]    [Pg.348]    [Pg.2413]    [Pg.2414]    [Pg.2416]    [Pg.113]    [Pg.114]    [Pg.60]    [Pg.373]    [Pg.192]    [Pg.649]    [Pg.360]    [Pg.364]    [Pg.443]   
See also in sourсe #XX -- [ Pg.60 , Pg.62 ]




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