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Etch silicon

Fig. 3.15 Examples of ultrahydrophobic surfaces. Lithographically etched silicon surface patterned with 30 pm tall cubic micro-posts. Reprinted from Ou et i. (2004) with permission... Fig. 3.15 Examples of ultrahydrophobic surfaces. Lithographically etched silicon surface patterned with 30 pm tall cubic micro-posts. Reprinted from Ou et i. (2004) with permission...
Ion-Assisted Processes An alternative use of ion beams generated from low cost sources is to assist particular chemical reactions, or vapour deposition. An example here is in etching processes (Figure 16). The simultaneous use of an argon beam with XeFp gas compared with the use of either separately, to etch silicon produces an etch rate of a factor of at least fourteen. The use of ion beams can also increase the directionality (23) of the process (Figure 17). Examples are given in Table IV of how ion bombardment during film formation modifies the final film. [Pg.321]

An incidental conclusion discussed in Section 5 is that exposure of freshly etched silicon surfaces to a given ambient of plasma products seems always to produce a chemical potential of hydrogen just beneath the surface that varies only modestly (no more than a factor ten) over a wide range of the bulk donor or acceptor doping. [Pg.248]

There is a special case of LDI worth mentioning, desorption/ionization on silicon (DIOS) [159, 160], in which analyte compounds are deposited on a surface of etched silicon. With this substrate the mass range can be extended to a few kilodaltons, allowing for analysis of, for example, small peptides without the involvement of a matrix. [Pg.35]

Aqueous electrolytes of high pH etch silicon even at open circuit potential (OCP) conditions. The etch rate can be enhanced or decreased by application of anodic or cathodic potentials respectively, as discussed in Section 4.5. The use of electrolytes of high pH in electrochemical applications is limited and mainly in the field of etch-stop techniques. At low pH silicon is quite inert because under anodic potentials a thin passivating oxide film is formed. This oxide film can only be dissolved if HF is present. The dissolution rate of bulk Si in HF at OCP, however, is negligible and an anodic bias is required for dissolution. These special properties of HF account for its prominent position among all electrolytes for silicon. Because most of the electrochemistry reported in the following chapters refers to HF electrolytes, they will be discussed in detail. [Pg.7]

The sample throughput of nanoESI is limited by the comparatively time-consuming procedure of manual capillary loading. A chip-based nanoESI sprayer on an etched silicon wafer allows for the automated loading of the sprayer array by a pipetting robot (Fig. 11.7). The chip provides a 10 x 10 array of nanoESI... [Pg.448]

Free radicals such as F can be used to etch silicon at ambient temperature. The radicals are formed by dissociating Thus,... [Pg.526]

Flow between parallel-plate electrodes SFe etching silicon Plug flow Boltzmann equation and Monte Carlo for electron energy electron density power balance 77... [Pg.417]

Flow between parallel plate electrodes SFff-02 etching silicon Well mixed Boltzmann equation for electron energy power balance for electron density 78... [Pg.417]

If skin is placed in a water bath under controlled conditions [14] the primary barrier to transdermal delivery, the epidermal membrane comprising the stratum corneum and viable epidermis, can be readily removed and used to analyze the penetration and diffusion of materials. Figure 18.3a and Figure 18.3b show the appearance of human breast epidermal membrane, with epidermis facing uppermost, following application of the cylindrical dry-etch and pyramidal wet-etch silicon microneedles, respectively. In each case the microneedles are clearly shown to pierce the stratum corneum and viable epidermis to facilitate controlled access of molecules to the target region of skin. [Pg.340]

FIGURE 18.3 Scanning electron micrographs of epidermal membrane treated with dry-etch and wet-etch silicon microneedles. The epidermal membrane, consisting of stratum corneum and viable epidermis, was obtained by heat separation of full-thickness human breast skin. The tissue was immersed in distilled water preheated to 60°C for 60 s and the upper layers carefully peeled off from the dermal layer using tweezers. Epidermal membranes were treated with microneedles for 30 s at an approximate pressure of 2 kg/cm2. (a) Dry-etch microneedle-treated epidermal membrane. Bar = 200 pm (b) wet-etch microneedle-treated epidermal membrane. Bar = 500 pm. [Pg.341]

Ceriotti and Verpoorte [20] integrated a fritless column for NCEC with conventional stationary phases, which was used for the separation of fluorescein isothiocyanate (FITC)-labeled amino acids. The chips were fabricated in poly(dimethylsiloxane) using deep-reactive-ion-etched silicon masters. The... [Pg.168]

Laermer F, Schilp A (Robert Bosch GmbH). Method of Anisotropically Etching Silicon. U.S. Patent No. 5501893, 1996. [Pg.199]

Figure 4.8 Panel (a) shows a planar oxygen sensor array half coated with etched silicone and half coated with smooth silicone. Panel (b) shows that the etched side (left to the viewer) is experiencing a host response and appears cloudy, while the smooth material on the right remains optically clear. Figure 4.8 Panel (a) shows a planar oxygen sensor array half coated with etched silicone and half coated with smooth silicone. Panel (b) shows that the etched side (left to the viewer) is experiencing a host response and appears cloudy, while the smooth material on the right remains optically clear.
Fig. 12 a. All-glass microchannels formed by DRIE with back-etched silicon... [Pg.34]

Figure 2.13 Examples of RIE etched silicon, with friendly permission of the Technical University of llmenau, Faculty of Mechanical Engineering, Department of Micromechanical Systems.(a) Circular channels, (b) channel with a through-hole and (c) adjustment mark. Figure 2.13 Examples of RIE etched silicon, with friendly permission of the Technical University of llmenau, Faculty of Mechanical Engineering, Department of Micromechanical Systems.(a) Circular channels, (b) channel with a through-hole and (c) adjustment mark.
In addition to the deposition conditions, the ZnO microstructure is also heavily influenced by the substrate. In view of the findings described above it is not surprising that ZnO films deposited onto smooth substrates are much more stable than those deposited onto rough substrates. This is best illustrated by experiments [57] where polished and texture-etched silicon wafers were used as model substrates (Figs. 9.10 and 9.11). [Pg.429]

Fig. 9.10. Scanning electron micrograph of a ZnO thin film on a texture-etched silicon substrate. The ZnO microstructure is disturbed where one pyramid of the substrate borders the next pyramid... Fig. 9.10. Scanning electron micrograph of a ZnO thin film on a texture-etched silicon substrate. The ZnO microstructure is disturbed where one pyramid of the substrate borders the next pyramid...
FIG. 2. Contact AFM images of y-Fe2Oj nanocrystal patterns drawn (a) on mica along with (b) its surface plot, (c) on silicon with the native SiOr layer (arrows point to closely-drawn patterns) and (d) on etched silicon. [Pg.513]

Figure 3.48 Exploded schematic view of a flow-cell FPW liquid sensor. The silicon chip containing die thin silicon-nitride membrane, piezoelectric film and transducers is sandwiched between two etched silicon chips. The upper chip is a cap with fluid inlet and outlet fittings, b also provides vias for contact to a temperature-sensing polysilicon resistor deposited on the FPW chip below it. The lower chip introduces transducer contact leads and protects the underside of the membrane fitm contact with the fluid. (Hgwc courtesy of Beo Costello, Bokeley Microliulratitents, Inc.)... Figure 3.48 Exploded schematic view of a flow-cell FPW liquid sensor. The silicon chip containing die thin silicon-nitride membrane, piezoelectric film and transducers is sandwiched between two etched silicon chips. The upper chip is a cap with fluid inlet and outlet fittings, b also provides vias for contact to a temperature-sensing polysilicon resistor deposited on the FPW chip below it. The lower chip introduces transducer contact leads and protects the underside of the membrane fitm contact with the fluid. (Hgwc courtesy of Beo Costello, Bokeley Microliulratitents, Inc.)...

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Advanced Silicon Etching

Advanced Silicon Etching process

Anisotropic (Crystallographic) Wet Chemical Etching of Silicon (KOH)

Anodic etching, silicon

Bromine silicon etching

Chlorine silicon etching

Deep silicon etching

Etch Pit Formation by Avalanche Breakdown in Low-Doped n-Type Silicon

Etch rate silicon

Etch silicon dioxide

Etched silicon channels

Etching of silicon

Etching of silicon dioxide

Etching polycrystalline silicon

Etching silicon carbide

Etching silicon, characteristics

Isotropic Wet Chemical Etching of Silicon

Isotropic Wet Chemical Etching of Silicon Glass

Isotropic etching, silicon

Open-circuit etching, silicon

Photoelectrochemical etching, silicon

Porous silicon etched layer

Pure Chemical F-Atom Etching of Silicon Flamm Formulas and Doping Effect

RIE-etched silicon

Selective Silicon Etching

Silicon dioxide etching

Silicon dioxide selective etching

Silicon dioxide, plasma etching

Silicon electrolytic etching

Silicon etch characteristics

Silicon etched-through

Silicon etching

Silicon etching anisotropic

Silicon etching isotropy

Silicon etching oxygen addition

Silicon etching technologies

Silicon etching with

Silicon isotropic wet chemical etching

Silicon nitride etching

Silicon plasma etching

Silicon wafer, etching rates

Silicon wafers etching

Silicon wet etch

Silicon-based substrates, fabrication technology etching

Stain etch films, porous silicon

XeF2, silicon etching

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