Low energy ion scattering spectroscopy

Aono M and Souda R 1985 Quantitative surface atomic structure analysis by low energy ion scattering spectroscopy Japan. J. Appl. Phys. Part 1 24 1249-62... 

Characterization of Alloy Electrocatalysts by Combined Low-Energy Ion Scattering Spectroscopy and Electrochemistry... 

Low Energy Ion Scattering Spectroscopy (LEISS) is a more recent development. Several studies in the Seventies showed that LEISS is highly surface-sensitive and can provide a useful addition to photoelectron spectroscopy (XPS). 

Figure 1 Schematic of the experimental UHV/electrochemical transfer system used for studies on modified platinum single-crystal surfaces. (From Ref. 26.) The UHV system has facilities for X-ray photoelectron spectroscopy (XPS), low-energy ion scattering spectroscopy (LEISS), low-energy electron diffraction (FEED), and temperature-programmed desorption (TPS). The electrochemical chamber allows the electrochemical cell, 0 with integral counter, reference, and secondary working electrode, to be brought to the surface allowing contact of the electrolyte with the transferred surface.

The characterization of complex solids, such as heterogeneous catalysts, composites or ceramics, involves the determination of many parameters. Several techniques are always needed to obtain all the necessary data to yield these parameters. For example, to characterize a catalyst surface, one might apply a combination of XPS (X-ray Photoelectron Spectroscopy), various forms of electron microscopy and LEIS (Low Energy Ion-scattering Spectroscopy) to produce a correct model. These techniques involve separate areas of expertise, the coordination of which, essential to the success of the project, requires a dedicated effort. 

LEIS low-energy ion scattering/low-energy ion scattering spectroscopy... 

TOF-DR, time of flight analysis of direct recoils (Mintz and Schultz,1986a) ISS, RIS, low energy ion scattering spectroscopy and recoil spectroscopy (Oura et al., 1984)... 

More recently, low-energy ion scattering spectroscopy (LEISS) has been used to elucidate the surface coverage of the monolayer supported and bulk vanadium and molybdenum oxide-based catalysts under in situ thermal treatments [2]. In LEISS, a beam of ions (typically, He+) with a certain energy (0.1 to 10 keV) scatters elastically from the outermost layer of atoms since the ions that penetrates the solid are neutralized [1]. 

M Aono, Y Hou, R Souda, C Oshima, S Otani, Y Ishizawa. Direct analysis of the structure, concentration, and chemical activity of surface atomic vacancies by specialized low-energy ion scattering spectroscopy TiC(OOl). Phys Rev Lett 50 1293, 1983. 

---