Low energy ion scattering spectroscopy LEISS

Low Energy Ion Scattering Spectroscopy (LEISS) is a more recent development. Several studies in the Seventies showed that LEISS is highly surface-sensitive and can provide a useful addition to photoelectron spectroscopy (XPS). 

Figure 1 Schematic of the experimental UHV/electrochemical transfer system used for studies on modified platinum single-crystal surfaces. (From Ref. 26.) The UHV system has facilities for X-ray photoelectron spectroscopy (XPS), low-energy ion scattering spectroscopy (LEISS), low-energy electron diffraction (FEED), and temperature-programmed desorption (TPS). The electrochemical chamber allows the electrochemical cell, 0 with integral counter, reference, and secondary working electrode, to be brought to the surface allowing contact of the electrolyte with the transferred surface.

More recently, low-energy ion scattering spectroscopy (LEISS) has been used to elucidate the surface coverage of the monolayer supported and bulk vanadium and molybdenum oxide-based catalysts under in situ thermal treatments [2]. In LEISS, a beam of ions (typically, He+) with a certain energy (0.1 to 10 keV) scatters elastically from the outermost layer of atoms since the ions that penetrates the solid are neutralized [1]. 

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