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Silicon nitride substrates

Lin, X.M., Jaeger, H.M., Sorensen, C.M. and Klabunde, K.J. (2001) Formation of long-range-ordered nanocrystal superlattices on silicon nitride substrates. Journal of Physical Chemistry B, 105 (17), 3353-3357. [Pg.58]

Both silicon oxide and alumina slurries can be efficiently removed on PECVD TEOS oxide or silicon nitride substrates in a conventional SCI or in a SCI without any water peroxide in the case of outcropping tungsten (see Fig. 5). When water peroxide is not present to continuously regrow a protective oxide layer, OH species can etch the silicon. In the latter case, the backside of the wafer must therefore be protected with a nitride or oxide layer to avoid a severe silicon roughening effect. Nevertheless to achieve the same particle removal efficiency obtained with a scrubber, power mega-sonics also have to be used (see Fig. 18). [Pg.204]

Fig. 31. Scanning electron micrograph (SEM) and scanning Auger element maps for an array of four strips of gold numbers 1,3,6, and 8) and four of aluminum/alumina (numbers 2, 4, 5, and 7) on a silicon nitride substrate that was exposed to a mixture of HS(CH2),, C1 and CF3(CF2)8C02H in isooctane. The SEM and element maps are for the array viewed from above the schematic of the device (the height of the strips is not drawn to scale) is a side view [175]... Fig. 31. Scanning electron micrograph (SEM) and scanning Auger element maps for an array of four strips of gold numbers 1,3,6, and 8) and four of aluminum/alumina (numbers 2, 4, 5, and 7) on a silicon nitride substrate that was exposed to a mixture of HS(CH2),, C1 and CF3(CF2)8C02H in isooctane. The SEM and element maps are for the array viewed from above the schematic of the device (the height of the strips is not drawn to scale) is a side view [175]...
Manning M, Redmond G (2005). Formation and characterization of DNA microarrays at silicon nitride substrates. Langmuir. 21 395-402. [Pg.654]

Block copolymers can be employed as templates to direct the deposition of inorganic nanostructures. Parket al. [82] used an Os04-stained microphase-separated thin film of poly(styrene-foZock-butadiene) that produced holes upon RIE in silicon nitride substrates. The etch ratio between the two phases, stained butadiene and styrene, was only about 1 2. MoUer et aL discussed the use of poly(styrene-fc/ock-2-vinylpyridine), to prepare masks for nanolithography by loading the PVP domains with gold particles [83] or by selective growth of Ti on top of the PS domains [84]. [Pg.106]

The sr Si was obtained by treating the silicon nitride powder with an HF solution for a iixed time period luid tuialyzing the Si content of the aqueous filtrate. It was found in earlier extensive investigations that the amount of die dissolved Si reaches a maximum value, characteristic of a powder, which does not increase upon continued acid treatment, even at higher acid concentrations and/or higher temperatiu-es. Tltis indicates the presence of a discrete, HF-soluble, oxygenated layer on the surface of the silicon nitride powder particles. Once this layer is removed, there is no dissolution of the ur dcrlying silicon nitride substrate by HF solutions. [Pg.79]

NASA demonstrated that both their standard EBC system, EPM, and rare-earth disilicate EBC material (REDS) could be deposited onto silicon nitride substrates if a PDC bond coat was applied. Figure 4 and Figure 5. Testing at NASA also showed that the EBC coatings, deposited on silicon nitride with the PDC bond coat, offered environmental resistance during thermal cycle... [Pg.4]

One of the first journal articles about block copolymer lithography, introduced by Park and coworkers from Princeton University in 1997, opened the door for future application of block copolymers in lithography (Park et al, 2008). In this pioneering work, a monolayer of poly (styrene-Z /6>cA -butadiene) (PS-Z -PB) was used in two different approaches to create positive-tone holes and negative-tone nanopillars on a silicon nitride substrate depending on the processing technique used on the PB block. [Pg.779]

In the first approach, the PB block was degraded upon exposure to ozone gas. The highly reactive ozone molecules attack carbon-carbon double bonds in the diene backbone, cutting the linkages and converting the polymer into butadiene monomer, which can easily be dispersed in water. The resulting nanostructure consisted of a periodic array of 1.3 x 10 holes per square centimeter in a PS matrix that could then be used as an etch mask for an underlying silicon nitride substrate. [Pg.780]

While the manifolds were fabricated by a plain molding process, the microchannels substrate fabrication was quite complicated and was achieved by a multistage process. The following main stages were used in the process (1) double side oxidation of a 525 pm (1 0 0) silicon substrate to 1,000 A, (2) single side 1,200 A silicon nitride deposition, (3) silicon nitride channels template opening by reactive... [Pg.394]

CVD plays an increasingly important part in the design and processing of advanced electronic conductors and insulators as well as related structures, such as diffusion barriers and high thermal-conductivity substrates (heat-sinks). In these areas, materials such as titanium nitride, silicon nitride, silicon oxide, diamond, and aluminum nitride are of particular importance. These compounds are all produced by CVD. 1 1 PI... [Pg.367]

Electrochemical experiments have been carried out on materials deposited by PVD on silicon microfabricated arrays of Au pad electrodes [Guerin et al., 2006a]. The substrate is made up of a square silicon wafer capped with silicon nitride (31.8 mm x 31.8 mm), which has an array of 100 individually addressable Au pad electrodes. These electrodes make up a square matrix on the wafer, which can be masked when placed in a PVD chamber, allowing deposition of thin films on the Au electrodes. Figure 16.3 is a schematic drawing of the configuration. Small electrical contact pads in Au for the individual addressing of electrodes (0.8 mm x 0.8 mm) are placed on the boundaries. [Pg.574]

The first LAPS utilized silicone nitride (S3N4) as a pH-sensitive layer [68], A light-addressable high resolution pH imaging sensor was applied to the detection of spatially resolved metabolic activity of Escherichia coli colonies on agar medium [69], For a silicone substrate thickness of 20 pm the reported spatial resolution was about 10 pm. The observed pH distribution was in good agreement with the results of simulation based on a two-dimensional diffusion model. [Pg.120]

Fig. 8 Schematic representation of block copolymer nanolithography process, a Schematic cross-sectional view of a nanolithography template consisting of a uniform mono-layer of PB spherical microdomains on silicon nitride. PB wets the air and substrate interfaces, b Schematic of the processing flow when an ozonated copolymer film is used as a positive resist, which produces holes in silicon nitride, c Schematic of the processing flow when an osmium-stained copolymer film is used as a negative resist, which produces dots in silicon nitride, (taken from [44])... Fig. 8 Schematic representation of block copolymer nanolithography process, a Schematic cross-sectional view of a nanolithography template consisting of a uniform mono-layer of PB spherical microdomains on silicon nitride. PB wets the air and substrate interfaces, b Schematic of the processing flow when an ozonated copolymer film is used as a positive resist, which produces holes in silicon nitride, c Schematic of the processing flow when an osmium-stained copolymer film is used as a negative resist, which produces dots in silicon nitride, (taken from [44])...
Fig. 4.15. Silicon nitride spot locally deposited through a shadow mask on a bare Si-substrate... Fig. 4.15. Silicon nitride spot locally deposited through a shadow mask on a bare Si-substrate...
The rapid developments in the microelectronics industry over the last three decades have motivated extensive studies in thin-film semiconductor materials and their implementation in electronic and optoelectronic devices. Semiconductor devices are made by depositing thin single-crystal layers of semiconductor material on the surface of single-crystal substrates. For instance, a common method of manufacturing an MOS (metal-oxide semiconductor) transistor involves the steps of forming a silicon nitride film on a central portion of a P-type silicon substrate. When the film and substrate lattice parameters differ by more than a trivial amount (1 to 2%), the mismatch can be accommodated by elastic strain in the layer as it grows. This is the basis of strained layer heteroepitaxy. [Pg.317]

Calculation of the Forces Susceptible to be Exerted on a Fine Particle Deposited ON A Substrate (Case of Spherical Silicon Nitride Particles in Water at Room Temperature, Substrate Potential — 300V)... [Pg.193]


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See also in sourсe #XX -- [ Pg.257 ]




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