Salie

Chatfield C and A J Collins 1980. Introduction to Multivariate Analysis. London, Chapman Hall. Dobson C M, A Sali and M Karplus 1998. Protein Folding A Perspective from Theory and Experiment. 

Sali A and T L Blundell 1993. Comparative Protein Modelling by Satisfaction of Spatial Restraii journal of Molecular Biology 234 779-815. 

Sali A, E Shakhnovich and M Karplus 1994a. How Does a Protein Fold Nature 369 248-251. 

Sanchez K and A Sali 1998. Large-scale Protein Structure Modelling of the Saccharomyces cerevi. Genome. Proceedings of the National Academy of Sciences USA 95 13597-13602. 

Pressure (mm. Ho) Water ChLOBO BENZENE Benz- ALDEHYDE Ethyl SALI- CYLATE Glycerol Anthra- cene... 

Sali s group http //guitar.rockefeiier.edu/sub-pages/programs.htmi... 

Andrej Sali Laboratories of Molecular Biophysics, The Rockefeller University, New York, New York... 

Concern for the conservation of energy and materials maintains high interest in catalytic and electrochemistry. Oxygen in the presence of metal catalysts is used in CUPROUS ION-CATALYZED OXIDATIVE CLEAVAGE OF AROMATIC o-DIAMINES BY OXYGEN (E,Z)-2,4-HEXADIENEDINITRILE and OXIDATION WITH BIS(SALI-CYLIDENE)ETHYLENEDIIMINOCOBALT(II) (SALCOMINE) 2,6-DI-important industrial method, is accomplished in a convenient lab-scale process in ALDEHYDES FROM OLEFINS CYCLOHEXANE-CARBOXALDEHYDE. An effective and useful electrochemical synthesis is illustrated in the procedure 3,3,6,6-TETRAMETHOXY-1,4-CYCLOHEX ADIENE. ... 

In Surface Analysis by Laser Ionization (SALI), a probe beam such as an ion beam, electron beam, or laser is directed onto a surfiice to remove a sample of material. An untuned, high-intensity laser beam passes parallel and close to but above the sur-fiice. The laser has sufficient intensity to induce a high degree of nonresonant, and hence nonselective, photoionization of the vaporized sample of material within the laser beam. The nonselectively ionized sample is then subjected to mass spectral analysis to determine the nature of the unknown species. SALI spectra accurately reflect the surface composition, and the use of time-of-flight mass spectrometers provides fast, efficient and extremely sensitive analysis. 

Sputtered Neutral Mass Spectrometry (SNMS) is the mass spectrometric analysis of sputtered atoms ejected from a solid surface by energetic ion bombardment. The sputtered atoms are ionized for mass spectrometric analysis by a mechanism separate from the sputtering atomization. As such, SNMS is complementary to Secondary Ion Mass Spectrometry (SIMS), which is the mass spectrometric analysis of sputtered ions, as distinct from sputtered atoms. The forte of SNMS analysis, compared to SIMS, is the accurate measurement of concentration depth profiles through chemically complex thin-film structures, including interfaces, with excellent depth resolution and to trace concentration levels. Genetically both SALI and GDMS are specific examples of SNMS. In this article we concentrate on post ionization only by electron impact. 

GDMS is slowly replacing SSMS because of its increased quantitative accuracy and improved detection limits. Like SNMS and SALI, GDMS is semiquantitative without standards ( a factor of 3) and quantitative with standards ( 20%) because sputtering and ionizadon are decoupled. GDMS is often used to measure impuri-des in metals and other materials which are eventually used to form thin films in other materials applications. 

SIMS is one of the most powerful surface and microanalytical techniques for materials characterization. It is primarily used in the analysis of semiconductors, as well as for metallurgical, and geological materials. The advent of a growing number of standards for SIMS has gready enhanced the quantitative accuracy and reliability of the technique in these areas. Future development is expected in the area of small spot analysis, implementation of post-sputtering ionization to SIMS (see the articles on SALI and SNMS), and newer areas of application, such as ceramics, polymers, and biological and pharmaceutical materials. 

Static SIMS, SALI, SNMS, and Surface Roughness... 

In other articles in this section, a method of analysis is described called Secondary Ion Mass Spectrometry (SIMS), in which material is sputtered from a surface using an ion beam and the minor components that are ejected as positive or negative ions are analyzed by a mass spectrometer. Over the past few years, methods that post-ion-ize the major neutral components ejected from surfaces under ion-beam or laser bombardment have been introduced because of the improved quantitative aspects obtainable by analyzing the major ejected channel. These techniques include SALI, Sputter-Initiated Resonance Ionization Spectroscopy (SIRIS), and Sputtered Neutral Mass Spectrometry (SNMS) or electron-gas post-ionization. Post-ionization techniques for surface analysis have received widespread interest because of their increased sensitivity, compared to more traditional surface analysis techniques, such as X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES), and their more reliable quantitation, compared to SIMS. 

The advantages of SALI are seen most clearly when analyzing trace (ppm to ppb) amounts of material on surfaces or at interfaces. Typically, SALI analyzes the same samples as SIMS, with the added advantage of providing easily quantifiable data. 

Comparison of SALI to other surface spectroscopic techniques. 

SALI compares fiivorably with other major surface analytical techniques in terms of sensitivity and spatial resolution. Its major advantj e is the combination of analytical versatility, ease of quantification, and sensitivity. Table 1 compares the analytical characteristics of SALI to four major surfiice spectroscopic techniques.These techniques can also be categorized by the chemical information they provide. Both SALI and SIMS (static mode only) can provide molecular fingerprint information via mass spectra that give mass peaks corresponding to structural units of the molecule, while XPS provides only short-range chemical information. XPS and static SIMS are often used to complement each other since XPS chemical speciation information is semiquantitative however, SALI molecular information can potentially be quantified direedy without correlation with another surface spectroscopic technique. AES and Rutherford Backscattering (RBS) provide primarily elemental information, and therefore yield litde structural informadon. The common detection limit refers to the sensitivity for nearly all elements that these techniques enjoy. 

Previous studies of the interaction of energetic particles with suri ces have made it clear that under nearly all conditions the majority of atoms or molecules removed from a surface are neutral, rather than charged. This means that the chained component can have large relative fluctuations (orders of magnitude) depending on the local chemical matrix. Calibration with standards for surfaces is difficult and for interfaces is nearly impossible. Therefore, for quantification ease, the majority neutral component of the departing flux must be sampled, and this requires some type of ionization above the sample, often referred to as post-ionization. SALI uses effi-... 

SALI applies two methods of post-ionization, MPI and SPI, each of which can be used in one of the three modes of analysis survey analysis, depth profiling, and mapping ... 

Depth profiling by SALI provides quantitative information through interfaces and for extremely thin films, in the form of reliable chemical concentrations. 

SALI mapping is a sensitive and quantitative method to characterize the spatial distribution of elements in both insulating and conductive materials. 

Figure 3 Depth profiles of F implanted into 2000 A Si on Si02 la) SALI profile with Ar sputtering and 248-nm photoionization and (b) positive SIMS profile with O2 sputtering. Analytical conditions SALI, SiF profile) 7-keV Ar, 248 nm SIMS, F profile) 7-keV02 ...

By examining the sputtered neutral particles (the majority channel) using nons-elective photoionization and TOFMS, SALI generates a relatively uniform sensitivity with semiquantitative raw data and overcomes many of the problems associated with SIMS. Estimates for sensitivities vary depending on the lateral spatial resolution for a commercial liquid-metal (Ga ) ion gun. Galculated values for SALI... 

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