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Noise specification

Transistors Mg and Mg are the main sources of noise of this ampHfier. Their area is hence optimized in order to meet the noise specifications. Table 5.3 summarizes the transistor dimensions, bias currents and resistance values. [Pg.82]

The amplitude of noise error has been evaluated performing test retrievals with observations generated starting from assumed atmospheric profiles (reference profiles) and perturbed with random noise of amplitude consistent with MIPAS noise specification. [Pg.343]

From the Requirements Specifications, the nser can derive the instrnment type and its minimal Functional Specifications. For example, if an instrument is schednled to rnn overnight, the number of samples should be specified so that the system can inject antomatically. The UV/visible detector s baseline noise specification can be determined from the specified detection and quantitation limit of an HPLC analysis. The required data evaluation will determine the demands on the evaluation software. [Pg.454]

Successful and exhaustive understanding of complexes is generally achieved through the accumulation of disparate data coming from approaches that have to be scrupulously chosen based on expected easiness, level of accuracy, background noise, specificity, constraints as labelling needs or in vitro/in vivo carrying out. [Pg.167]

Sensitivity is specified by baseline noise. For years, noise specification has been benchmarked at 1.0 x 10 absorbance unit (AU) (Figure 4.9b). A wavelength range of 190-600 nm is typical, though sensitivity is substantially lower >400 nm due to a lack of energy of the deuterium source in the visible region. Many detectors allow a secondary tungsten source to increase sensitivity in... [Pg.88]

The dual-beam variable wavelength I JV/Vis absorbance detector remains the primary detector for routine analysis. Sensitivity and linearity performance have improved significantly in recent years. Noise specifications of 0.25 x 1(L5 AU and linearity of upper limit exceeding 2 AU are achievable with newer models. Typical spectral bandwidth ranges from 5 to 8nm. The lifetime of the deuterium lamp has improved to 1,000-2,000 hours. Most detectors have features such as self-aligned sources and flow cells, leak sensors, and built-in holmium oxide filters for easy wavelength accuracy verification. Many have dual- or multiple-wavelength and ratio plot output capabilities. [Pg.267]

For illustration, the circuit from Fig. 6.1.10 is redrawn in Fig. 6.1.13 with the noise sources vn and i from the amplifier and bias resistor shown explicitly. The variances are determined from Equation (12) for the resistor, and the datasheet of the amplifier. The noise specification of amplifiers includes also an input referred current noise, which (for amplifiers with CMOS inputs) is usually negligible, and for amplifiers with bipolar input is so large that BJT input stages simply cannot be used in most capacitive readout circuits. [Pg.251]

These stand head and shonlders above the non-specific background, a bit like spectral peaks projecting above background noise. Specific binding events are the cornerstone of chemical biology. [Pg.341]

In reading the noise specifications for mixers or detector diodes it is important to determine exactly what is being quoted. The device performance will be influenced by the circuit into which it is incorporated, and its noise figure will depend in part on the way it was measured. [Pg.59]

For insulation applications, plastics are mostly used. For water insulation (waterproofing), PU, PVC, thermoplastic elastomers, silicones, various rubbers, acrylics, and even PE are mainly used. For heat insulation applications, PVC, EPS, PU foams are used directly (for roofs and walls), as well as in sandwich panels. In addition, UPVC-hollow panels are being used as interior cladding to provide multi-purpose insulation (for water, heat, noise), specifically for pipes, wall insulation, and so on. [Pg.166]

Many machines currently meet noise specification because manufacturers have responded to the need to cut noise. Some equipment like saws, however, can t be made to run any quieter, so proper hearing protection is a must. [Pg.693]

For high-resolution spectrometry systems, it is essential to use preamplifiers and amplifiers with alow noise specification. [Pg.98]

As with all detectors, the pulse of current at the output, in this case the PMT anode, must be integrated to provide the signal. Because electronic noise is usually not a problem, preamplifiers for scintillation systems need not have a particularly low noise specification. AU three types of preamplifier - voltage, current and charge-sensitive - are in common use. Charge-sensitive preamplifiers are often offered for routine use but low cost voltage-sensitive types are also common. For normal gamma spectrometry... [Pg.217]

As with the preamplifier, the scintillation amphfier need not be of such a demanding low noise specification as would be needed for semiconductor systems. In the manufacturers catalogues, a distinction is commonly made between amplifier , suitable for low-resolution spectrometry, and spectroscopy amplifier intended for high-resolution spectrometry using semiconductor detectors. Typical simple amplifier modules provide pole-zero cancellation and automatic base line restoration. The pulse shaping time options provided are often limited on such instruments and may need to be selected internally. Because of the faster rise time of scintillation pulses, the time constants provided are usually within the range 0.2 to 2 or 3 (its. [Pg.217]

Excessive instrument noise is internally generated noise that exceeds the self-noise specification of the seismometer. There are three broad classes of excessive internal noise ... [Pg.3726]

Stationary broadband noise that significantly exceeds the instmment s pubUshed self-noise specification... [Pg.3726]

Excessive broadband axis noise (specific to a U, V, or W axis) can be due to electronics noise, for example, excessive current noise due to components not meeting specification. [Pg.3728]

Recent advances in signal processing techniques have led to the development of sotmd intensity meters that can determine the direction, as well as the magnitude, of the soimd, without the need for expensive test facilities. These instruments enable the engineer to determine if large equipment, such as gas turbine packages, meet the required noise specification even when tested in the factory or on site where other noise sources are present. [Pg.31]

This example clearly Ultistrates the benefits of sound intensity measurements to check compliance with noise specifications when the test items are very large and are sited in acoustically tmdesirable areas. [Pg.41]

This section has discussed the concepts of sound intensity, sound power, and sound pressure. It has shown how sound intensity meters have given the acoustics engineer a very powerful diagnostic tool. Noise specifications for large, complex machinery can now be checked without the need for special acoustics rooms. [Pg.42]


See other pages where Noise specification is mentioned: [Pg.539]    [Pg.423]    [Pg.413]    [Pg.60]    [Pg.413]    [Pg.85]    [Pg.29]    [Pg.116]    [Pg.323]    [Pg.637]   
See also in sourсe #XX -- [ Pg.88 ]




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