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Rise-time

The VMOS-pulser with a rise time lower than 6 ns provides high axial resolution and high-frequency inspections above 10 MHz with an excellent signal-to-noise ratio. The output voltage amounts to about 228 V without load, and 194 V with a load of 75 H, A damping control from 75 Q to 360 Q matches the impedance to the transducer. [Pg.858]

The internal pulser generates an output voltage of 228 V with a rise time of lower than 6 ns, which provides high resolution for frequencies above 10 MHz. The external trigger input enables synehronization with manipulators. [Pg.861]

Figure B2.5.6. Temperature as a fiinction of time in a shock-tube experiment. The first r-jump results from the incoming shock wave. The second is caused by the reflection of the shock wave at the wall of the tube. The rise time 8 t typically is less than 1 ps, whereas the time delay between the incoming and reflected shock wave is on tlie order of several hundred microseconds. Adapted from [110]. Figure B2.5.6. Temperature as a fiinction of time in a shock-tube experiment. The first r-jump results from the incoming shock wave. The second is caused by the reflection of the shock wave at the wall of the tube. The rise time 8 t typically is less than 1 ps, whereas the time delay between the incoming and reflected shock wave is on tlie order of several hundred microseconds. Adapted from [110].
This behavior is consistent with experimental data. For high-frequency excitation, no fluorescence rise-time and a biexponential decay is seen. The lack of rise-time corresponds to a very fast internal conversion, which is seen in the trajectory calculation. The biexponential decay indicates two mechanisms, a fast component due to direct crossing (not seen in the trajectory calculation but would be the result for other starting conditions) and a slow component that samples the excited-state minima (as seen in the tiajectory). Long wavelength excitation, in contrast, leads to an observable rise time and monoexponential decay. This corresponds to the dominance of the slow component, and more time spent on the upper surface. [Pg.306]

Viscosity can also be determined from the rising rate of an air bubble through a Hquid. This simple technique is widely used for routine viscosity measurements of Newtonian fluids. A bubble tube viscometer consists of a glass tube of a certain size to which Hquid is added until a small air space remains at the top. The tube is then capped. When it is inverted, the air bubble rises through the Hquid. The rise time in seconds may be taken as a measure of viscosity, or an approximate viscosity in mm /s may be calculated from it. In an older method that is commonly used, the rate of rise is matched to that of a member of a series of standards, eg, with that of the Gardner-Holdt bubble tubes. Unfortunately, this technique employs a nonlinear scale of letter designations and may be difficult to interpret. [Pg.190]

T] Use with log mean mole fraction differences based on ends of column, t = rise time. No continuous phase resistance. Stagnant drops are likely if drop is very viscous, quite small, or is coated with surface active agent. A.y uiean dispersed liquid M.T. coefficient. [Pg.613]

While the manufacturers of measurement devices can supply some information on the dynamic characteristics of their devices, interpretation is often difficult. Measurement device dynamics are quoted on varying bases, such as rise time, time to 63 percent response, settling time, and so on. Even where the time to 63 percent response is quoted, it might not be safe to assume that the measurement device exhibits first-order behavior. [Pg.758]

All electrical equipment are designed for a specific BIL, as indicated in Tables 11.6, 13.2, 14.1, and 32.1(A) for motors, switchgears and bus systems respectively, and Tables 13.2 and 13.3 for the main power system (line clearances and insulators). If the actual severity of a prospective surge, i.e. its amplitude and/or rise time or both, is expected to be higher than these levels (higher amplitude and lower rise time) the same must be damped to a safe level, with the use of surge arresters, surge capacitors or both as discussed later. [Pg.558]

For adequate protection of the machine it is essential to know the amplitude, F, and the rise time, /, of the severest voltage surge (FOW) that may occur on the system. It is recommended that the actual field tests be conducted for large installations according to the recommended simulation test circuits, noted above, to ascertain these surges. [Pg.578]

Vi = peak value of the voltage surge in kV /i = rise time in /rs... [Pg.584]

J.W. Swegle and D.E. Grady, Shock Viscosity and the Prediction of Shock Wave Rise Times, J. Appl. Phys. 58, 692-701 (1985). [Pg.257]

Rise time The time interval between the initial response and 95% of the final response,... [Pg.198]

Control problem For a speeifie hull, the eontrol problem is to determine the autopilot setting K ) to provide a satisfaetory transient response. In this ease, this will be when the damping ratio has a value of 0.5. Also to be determined are the rise time, settling time and pereentage overshoot. [Pg.103]

The rise times of the elastic wave may be quite narrow in elastic single crystals, but in polycrystalline solids the times can be significant due to heterogeneities in physical and chemical composition and residual stresses. In materials such as fused quartz, negative curvature of the stress-volume relation can lead to dispersive waves with slowly rising profiles. [Pg.20]

The inelastic wave shows rise times that vary quite substantially. Recognizing that the rise time is a direct indication of the balance between the viscous response of the sample and the driving force, Grady [81G01] has analyzed and compared the effective viscosity of a range of materials. These viscosities are manifestations of the dynamic deformation controlled by the shock-induced defects, heterogeneities, and their motions. [Pg.20]


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Capillary rise time

Circuit rise time

Current rise time

Detectors pulse rise time

Femtosecond rise time

Foamed rise time

Formation measurable rise time

Full rise time

Gradient rise time

Inverter rise time

Operational amplifier rise time

Oxygen rise over time

Performance Analysis—Inverter Rise Time

Photomultiplier Rise time

Pulse rise time

Rise time degradation

Rise time preamplifiers

Temperatur rise time

Temperature Rise Time

Temperature rise time TRT

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