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Imaging Capability

The quantitative imaging capability of the NMP is one of the major strengtiis of the teclmique. The advanced state of the databases available for PIXE [21, 22 and 23] allows also for the analysis of layered samples as, for example, in studying non-destmctively the elemental composition of fluid inclusions in geological samples. [Pg.1844]

Detection limits Resolving power Imaging capabilities Main use... [Pg.7]

There are three types of instruments that provide STEM imaging and analysis to various degrees the TEM/STEM, in which a TEM instrument is modified to operate in STEM mode the SEM/STEM, which is a SEM instrument with STEM imaging capabilities and dedicated STEM instruments that are built expressly for STEM operation. The STEM modes of TEM/STEM and SEM/STEM instruments provide useful information to supplement the main TEM and SEM modes, but only the dedicated STEM with a field emission electron source can provide the highest resolution and elemental sensitivity. [Pg.162]

The electron-optical performance of the EPMA system is indistinguishable from that of a conventional scanning electron microscope (SEM) thus, EPMA combines all of the imaging capabilities of a SEM with quantitative elemental analysis using both energy- and wavelength-dispersive X-ray spectrometry. ... [Pg.176]

The electron probe X-ray microanalyzer provides extraordinary power for measuring the elemental composition of solid matter with pm lateral spatial resolution. The spatial resolution, limited by the spread of the beam within the specimen, permits pg samples to be measured selectively, with elemental coverage from boron to the actinides. By incorporating the imaging capability of the SEM, the electron probe X-ray microanalyzer combines morphological and compositional information. [Pg.190]

SAM) and TEM. An Auger electron spectrometer with high spatial resolution imaging capability was developed especially for the detection of small particles and defects which might be present in the ULSI regime this enabled the inspection of wafers up to 200 mm in diameter [2.150]. [Pg.45]

Depth-sensing nanoindentation is one of the primary tools for nanomechanical mechanical properties measurements. Major advantages to this technique over AFM include (1) simultaneous measurement of force and displacement (2) perpendicular tip-sample approach and (3) well-modeled mechanics for dynamic measurements. Also, the ability to quantitatively infer contact area during force-displacement measurements provides a very useful approach to explore adhesion mechanics and models. Disadvantages relative to AFM include lower force resolution, as well as far lower spatial resolution, both from the larger tip radii employed and a lack of sample positioning and imaging capabilities provided by piezoelectric scanners. [Pg.212]

The scanning transmission electron microscope (STEM) was used to directly observe nm size crystallites of supported platinum, palladium and first row transition metals. The objective of these studies was to determine the uniformity of size and mass of these crystallites and when feasible structural features. STEM analysis and temperature programmed desorption (TPD) of hydrogen Indicate that the 2 nm platinum crystallites supported on alumina are uniform In size and mass while platinum crystallites 3 to 4 nm in size vary by a factor of three-fold In mass. Analysis by STEM of platinum-palladium dn alumina established the segregation of platinum and palladium for the majority of crystallites analyzed even after exposure to elevated temperatures. Direct observation of nickel, cobalt, or iron crystallites on alumina was very difficult, however, the use of direct elemental analysis of 4-6 nm areas and real time Imaging capabilities of up to 20 Mx enabled direct analyses of these transition metals to be made. Additional analyses by TPD of hydrogen and photoacoustic spectroscopy (PAS) were made to support the STEM observations. [Pg.374]

Characterization methods. The 100 kV Vacuum Generator HB-5 STEM was used to mlcroanalyze samples. The HB-5 has a KEVEX SI(LI) energy dispersive X-ray spectrometer (EDS) and micro area electron diffraction (MAED) capabilities In conjunction with simultaneous bright and dark field Imaging capabilities. A more detailed explanation of the Instrumental operation can be obtained In a publication by C. Lyman(12). [Pg.375]

The required speed for salmon selection is one salmon per second. To achieve this speed, projection data of a specific slice of a salmon should be used and the imaging capability is thus indispensable in developing a selection strategy for the projection data. [Pg.87]

The interaction of the electron beam with the sample is generally onion-shaped and results in a number of different processes, as shown in Fig. 8. The formation of secondary electrons and backscattered electrons is the basis for the imaging capabilities of the SEM. [Pg.143]

The key behind the imaging capabilities of the STM is the ability to control and monitor the tunneling current between the tip and the sample. To a first approximation, the tunneling current is related to the interelectrode spacing, d, by the expression (1,30) ... [Pg.181]

Among the many microscopy-based techniques for the study of biomolecular interactions on surfaces, scanning probe microscopies, and especially the atomic force microscopies (AFM), are the most used because of their molecular and sub-molecular level resolution and in situ imaging capability. Apart from the high resolution mapping of siuface nanotopographies, AFM can be used for the quantification and visualisation of the distribution of chemistry, hydrophobicity and local mechanical properties on surfaces, and for the fabrication of nanostructmes on surfaces. [Pg.114]

Both compounds are freely soluble in water, PCA as sodium salt. The LD50 of PCA after intraveneous injection in rats has been determined as 15 mmol/kg, the LD50 of NAT was even more favourable (as high as 25 mmol/kg).The relaxiv-ity and the imaging capability have been studied. Both compounds revealed a... [Pg.18]

The main purpose of the invention of the first SFM was to extend the imaging capabilities of STM to non-conductive samples [64]. This was enabled by sensing electromagnetic forces that act in the near field of the surface (Fig. la). In prac-... [Pg.66]


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Dielectric imaging capability

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