X-ray photoelectron spectroscopy method

Keywords X-ray photoelectron spectroscopy, method of electric explosion of conductors, nonstoihciometric oxides, electronic structure, nanoparticles. 

The nature of MWNT surface was characterized by X-ray photoelectron spectroscopy method (XPS). XPS spectra were obtained with use of Kratos Analitical SERIES 800 XPS spectrometer with non-monochromatic MgKa (1253.6 eV) X-ray source. While recording XPS spectra vacuum in the analytical chamber was maintained at level of 10-9 Torr. 

Shabanova 1. N., Chausov F. R, Naimushina E. A., Kazantseva 1. S. AppUcation of the X-ray photoelectron spectroscopy method for investigating the molecular structure of the corrosion inhibitor complex of 1-hydroxietylidene diphosphonic acid with zinc Zhumal struktumoi khimii. 2011. Vol. 52. Supplement. C. S113-S118. 

Briggs, D. Sinba, M. P. (Ed.) (1987). Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy Methods. Moscow Mir. 

ISO 20903 2011 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results... 

X-ray Photoelectron Spectroscopy. X-ray photoelectron spectroscopy (xps) and Auger electron spectroscopy (aes) are related techniques (19) that are initiated with the same fundamental event, the stimulated ejection of an electron from a surface. The fundamental aspects of these techniques will be discussed separately, but since the instmmental needs required to perform such methods are similar, xps and aes instmmentation will be discussed together. 

X-rays provide an important suite of methods for nondestmctive quantitative spectrochemical analysis for elements of atomic number Z > 12. Spectroscopy iavolving x-ray absorption and emission (269—273) is discussed hereia. X-ray diffraction and electron spectroscopies such as Auger and electron spectroscopy for chemical analysis (esca) or x-ray photoelectron spectroscopy are discussed elsewhere (see X-raytechnology). 

In other articles in this section, a method of analysis is described called Secondary Ion Mass Spectrometry (SIMS), in which material is sputtered from a surface using an ion beam and the minor components that are ejected as positive or negative ions are analyzed by a mass spectrometer. Over the past few years, methods that post-ion-ize the major neutral components ejected from surfaces under ion-beam or laser bombardment have been introduced because of the improved quantitative aspects obtainable by analyzing the major ejected channel. These techniques include SALI, Sputter-Initiated Resonance Ionization Spectroscopy (SIRIS), and Sputtered Neutral Mass Spectrometry (SNMS) or electron-gas post-ionization. Post-ionization techniques for surface analysis have received widespread interest because of their increased sensitivity, compared to more traditional surface analysis techniques, such as X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES), and their more reliable quantitation, compared to SIMS. 

The interface properties can usually be independently measured by a number of spectroscopic and surface analysis techniques such as secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS), specular neutron reflection (SNR), forward recoil spectroscopy (FRES), scanning electron microscopy (SEM) and transmission electron microscopy (TEM), infrared (IR) and several other methods. Theoretical and computer simulation methods can also be used to evaluate H t). Thus, we assume for each interface that we have the ability to measure H t) at different times and that the function is well defined in terms of microscopic properties. 

Table 8 shows results obtained from the application of various bulk and surface analysis methods to lithium metal at rest or after cyclization experiments, as well as at inert and carbon electrodes after cathodic polarization. The analytical methods include elemental analysis, X-ray photoelectron spectroscopy (XPS or ESCA), energy-dispersive analysis of X-rays (X-ray mi-... 

A variety of other techniques have been used to investigate ion transport in conducting polymers. The concentrations of ions in the polymer or the solution phase have been monitored by a variety of in situ and ex situ techniques,8 such as radiotracer studies,188 X-ray photoelectron spectroscopy (XPS),189 potentiometry,154 and Rutherford backscatter-ing.190 The probe-beam deflection method, in which changes in the density of the solution close to the polymer surface are monitored, provides valuable data on transient ion transport.191 Rotating-disk voltammetry, using an electroactive probe ion, provides very direct and reliable data, but its utility is very limited.156,19 193 Scanning electrochemical microscopy has also been used.194... 

Suhtnicion nickel powders luive been synthesized successfully from aqueous NiCh at various tempmatuTKi and times with ethanol-water solvent by using the conventional and ultrasonic chemical reduction method. The reductive condition was prepared by flie dissolution of hydrazine hydrate into basic solution. The samples synthesized in various conditions weae claractsiz by the m ins of an X-ray diffractometry (XRD), a scanning electron microscopy (SEM), a thermo-gravimetry (TG) and an X-ray photoelectron spectroscopy (XPS). It was found that the samples obtained by the ultrasonic method were more smoothly spherical in shape, smaller in size and narrower in particle size distribution, compared to the conventional one. 

Infrared spectra were recorded on a Perkin Elmer model 680 spectrophotometer as mulls in nujol or fluorolube. The magnetic susceptibility of the copper complexes was measured from 4.2 to 300 K by the Faraday method . X-ray photoelectron spectroscopy (XPS) was performed with a Perkin Elmer hemispherical spectrometer. 

Gomez-Sainero et al. (11) reported X-ray photoelectron spectroscopy results on their Pd/C catalysts prepared by an incipient wetness method. XPS showed that Pd° (metallic) and Pdn+ (electron-deficient) species are present on the catalyst surface and the properties depend on the reduction temperature and nature of the palladium precursor. With this understanding of the dual sites nature of Pd, it is believed that organic species S and A are chemisorbed on to Pdn+ (SI) and H2 is chemisorbed dissociatively on to Pd°(S2) in a noncompetitive manner. In the catalytic cycle, quasi-equilibrium ( ) was assumed for adsorption of reactants, SM and hydrogen in liquid phase and the product A (12). Applying Horiuti s concept of rate determining step (13,14), the surface reaction between the adsorbed SM on site SI and adsorbed hydrogen on S2 is the key step in the rate equation. 

Spoto, G. and E. Ciliberto (2000), X-ray photoelectron spectroscopy and Auger electron spectroscopy in art and archaeology, in Ciliberto, E. and G. Spoto (eds.), Modern Analytical Methods in Art and Archaeology, Chemical Analysis Series, Vol. 155, Wiley, New York, pp. 363 404. 

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