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Quantitative surface analysis

Chemical analysis of the metal can serve various purposes. For the determination of the metal-alloy composition, a variety of techniques has been used. In the past, wet-chemical analysis was often employed, but the significant size of the sample needed was a primary drawback. Nondestmctive, energy-dispersive x-ray fluorescence spectrometry is often used when no high precision is needed. However, this technique only allows a surface analysis, and significant surface phenomena such as preferential enrichments and depletions, which often occur in objects having a burial history, can cause serious errors. For more precise quantitative analyses samples have to be removed from below the surface to be analyzed by means of atomic absorption (82), spectrographic techniques (78,83), etc. [Pg.421]

In other articles in this section, a method of analysis is described called Secondary Ion Mass Spectrometry (SIMS), in which material is sputtered from a surface using an ion beam and the minor components that are ejected as positive or negative ions are analyzed by a mass spectrometer. Over the past few years, methods that post-ion-ize the major neutral components ejected from surfaces under ion-beam or laser bombardment have been introduced because of the improved quantitative aspects obtainable by analyzing the major ejected channel. These techniques include SALI, Sputter-Initiated Resonance Ionization Spectroscopy (SIRIS), and Sputtered Neutral Mass Spectrometry (SNMS) or electron-gas post-ionization. Post-ionization techniques for surface analysis have received widespread interest because of their increased sensitivity, compared to more traditional surface analysis techniques, such as X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES), and their more reliable quantitation, compared to SIMS. [Pg.559]

Surface and quantitative depth profile (QDP) analysis of multimatrix materials (nm to 100 rm)... [Pg.618]

Laser desorption methods (such as LD-ITMS) are indicated as cost-saving real-time techniques for the near future. In a single laser shot, the LDI technique coupled with Fourier-transform mass spectrometry (FTMS) can provide detailed chemical information on the polymeric molecular structure, and is a tool for direct determination of additives and contaminants in polymers. This offers new analytical capabilities to solve problems in research, development, engineering, production, technical support, competitor product analysis, and defect analysis. Laser desorption techniques are limited to surface analysis and do not allow quantitation, but exhibit superior analyte selectivity. [Pg.737]

Smith, G.C. (1991) Quantitative Surface Analysis for Materials Science, London, The Institute of Metals. [Pg.38]

Finally, it should be kept in mind that quantification is often problematic in surface analysis and characterization. Firstly because some techniques are not really suited for quantification, but also in cases such as infrared spectroscopy where one does not really know precisely how deep into the material one is probing. Although, there are many good examples of semi-quantitative applications that involve measuring relative band intensities that relate to changes in a surface property. However, for problem solving revealing qualitative differences is often sufficient information to be able to identify cause and move on to look for a potential solution. [Pg.677]

The ProteinChip System from Ciphergen Biosystems uses patented SELDI (Surface-Enhanced Laser Desorption/Ionization) ProteinChip technology to rapidly perform the separation, detection, and analysis of proteins at the femtomole level directly from biological samples. ProteinChip Systems use ProteinChip Arrays which contain chemically (cationic, anionic, hydrophobic, hydrophilic, etc.) or biochemically (antibody, receptor, DNA, etc.) treated surfaces for specific interaction with proteins of interest. Selected washes create on-chip, high-resolution protein maps. This protein mass profile, or reten-tate map of the proteins bound to each of the ProteinChip Array surfaces, is quantitatively detected in minutes by the ProteinChip Reader. [Pg.262]

We have recently modified U7) one of the several radiochemical methods (U5) which have been used for surface electrochemistry investigations in order to characterize adsorption on well-defined, single crystal electrodes. Below, we will describe the technique and identify some challenging issues which we will be able to address. The proposed method is sensitive to a few percent of a monolayer at smooth surfaces, is nondestructive and simple to use. The radiochemical measurements can be made with all compounds which can be labelled with reasonably long-lived, preferably g- emitting radioisotopes. We believe this technique will fulfill the quantitative function in in situ surface analysis as Auger spectroscopy currently does in vacuum, ex situ characterization of electrodes. [Pg.246]

Problems such as diffusional limitations and the analysis of catalyst composition occur with solid-phase catalysts. Much work has been done on diffusion in bound enzymes (for reviews, see 24 and 88). In our work we used ninhydrin, which is a reagent ideal for surface analysis amino acid analysis is used wherever possible. Amine depletion as followed by ninhydrin is not exact, but some quantitative guides are obtained. Certainly synthetic catalysts must be made with bonds other than amide bonds and components other than those compounds that are detectable on the amino acid analyzer. [Pg.222]

Helwig, E.J. Black, M.L. Proc. 2nd Inter. Tinplate Conf., 1980, p.407. Japan Institute of Metals "Quantitative Surface Analysis" (in Japanese), Tokyo, 1978 p.64. [Pg.168]

Quantitative depth profiling using polyatomic MCs+ and MCs2+ ions instead of atomic ions M= ions is well established in surface analysis using SIMS. The MCs+ technique, which reduces matrix effects significantly, was proposed by Gao in 1988.100 The formation of MCs+ has been explained by the recombination of sputtered neutral atoms (M) with... [Pg.278]

The quantitative compositional surface analysis of the untreated glass fibers using XPS was complicated by the presence of carbon [5]. Nevertheless, the plot in Fig. 1 reveals that the boron concentration on the untreated fiber surfaces did, in fact, increase in proportion to its addition to the glass formulation, while the... [Pg.233]

McIntyre, N.S., ed. "Quantitative Surface Analysis of Materials" American Society for Testing and Materials Philadelphia, 1978. [Pg.11]


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See also in sourсe #XX -- [ Pg.651 ]




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