Scanning transmission electron microscopy advantages

Scanning Transmission Electron Microscopy (STEM) [22]. STEM represents a merger of the concepts of TEM and SEM. Modes of operation and mechanisms of contrast and of imaging are essentially the same as in CTEM but the main advantage of STEM is the ability to carry out microanalysis at very high resolution (see Section H). 

Scanning transmission electron microscopy gives essentially the same type of results and has the same type of difficulties as the conventional TEM. There are two types of instruments, the dedicated STEMs, which generally have a UHV column, and the TEM based instruments mostly known as AEMs (analytical electron microscopes). A detailed comparison of STEM and TEM was given in Section 2.4.1.3. There are some advantages in using the STEM on polymer samples in particular it seems that thicker samples can be used. However, the added complexity and cost, combined with lower resolution in the AEM STEM mode, make it unlikely that either kind of instrument would be purchased for polymer studies. 

Electron Microscopy. Scanning electron microscopy and energy-dispersive X-ray microanalysis can be effectively used in combination to provide both structural and elemental information about individual mineral particles in coal and other materials (42,53-55). Transmission electron microscopy has the advantage of higher resolution (56,57) allowing more detailed characterization of mineral inclusions. 

Before specifically dealing with coherent x-ray imaging, its foundations, and its advantages, we note that alternate experimental solutions were used to tackle these problems. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) probe the surface morphology and the overall microstructure of metal electrodeposits. However, they do not work in real time they are used to analyze the final products after the end of the growth. 

XAS requires synchrotron radiation and a relatively large amount of material but no vacuum condition. On the other hand, EELS can be performed directly using an electron spectrometer fitted to a scanning transmission electron microscope (STEM). Here, the main advantage is the high spatial resolution attainable. (The incident electron beam can be as. small as I nm in diameter.) EELS can also be coupled with conventional transmission electron microscope (TEM) facilities and particularly high-resolution transmission electron microscopy (HRTEM) and energy dispersive X-ray spectroscopy (EDS). 

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