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Scanning transmission electron microscopy resolution

Garcia-Meitin, E. 1., Bar, G., Blackson, J., and Reuschle, D., High Resolution Polymer Imaging Using Scanning Transmission Electron Microscopy, Microscopy and Microanalysis, 14 (Suppl. 2), 1380 (2008)... [Pg.538]

Transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are recognized as powerful and versatile tools for the characterization of supported metal catalysts, because real-space images of catalysts with spatial resolution down to 0.1 nm can be recorded and combined with high-spatially resolved spectroscopic information. However, TEM has been used mainly for ex situ characterization, for example, of catalysts after gas treatments. [Pg.78]

Scanning Transmission Electron Microscopy (STEM) [22]. STEM represents a merger of the concepts of TEM and SEM. Modes of operation and mechanisms of contrast and of imaging are essentially the same as in CTEM but the main advantage of STEM is the ability to carry out microanalysis at very high resolution (see Section H). [Pg.557]

L. A. Bonney and R. F. Cooper, Reaction Layer Interfaces in SiC-Fiber-Reinforced Glass Ceramics A High Resolution Scanning Transmission Electron Microscopy Analysis, J. Am. Ceram. Soc., 73[10], 2916-2921 (1990). [Pg.262]

Figure 4 (a) Low-resolution scanning transmission electron microscopy (STEM) image of a thin sol-gel film (1 -2 layers) containing 5 nm CdSe NCs. The NCs appear in white, and the dark areas are pores, (h) Linear absorption (solid line) and PL (dashed line) spectra of as-prepared CdSe NCs (r = 2.5 nm) in a hexane solution (the arrow marks the lowest IS absorption resonance), (c) Absorption and PL spectra of the same NCs after their incorporation into titania... [Pg.5923]

HRSTEM High resolution scanning transmission electron microscopy HRTEM High resolution transmission electron microscopy MCM-41 Silica with hexagonal pore structure (Mobil recipe)... [Pg.56]

Fine scale microstructure and metal dispersion were investigated by scanning transmission electron microscopy (STEM -VG501) equipped with energy dispersive X-ray analysis (EDX) both globally and at point level with a lateral resolution of 2 nm. [Pg.156]


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See also in sourсe #XX -- [ Pg.140 , Pg.142 , Pg.150 ]




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Electron microscopy resolution

Resolution microscopy

Resolution scanning electron microscopy

Resolution transmission electron

Resolution transmission electron microscopy

Scanning electron microscopy

Scanning electronic microscopy

Scanning resolution

Scanning transmission

Scanning transmission electron

Scanning transmission electron microscopy

Scanning transmission microscopy

Transmission electron microscopy

Transmission electronic microscopy

Transmission microscopy

Transmission resolution

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