Scanning transmission electron microscopy accuracy

The research of the structure of the radiation surface, of the etched metallographic section (direct and seating metallographic section) of the modified samples were carried out by the methods of electron scanning and transmission electron microscopy. X-ray structure analysis. The change mechanical properties of a material were characterized by microhardness. The accuracy of the measurement is amounted to 7%. For phase identification diffraction analysis with the use of darkfield method and subsequent indicating of microelectronograms was is used. 

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