Morphology Imaging with Scanning Transmission Electron Microscopy

Intermezzo Morphology Imaging with Scanning Transmission Electron Microscopy 

As in the field of condensed matter sciences, polymer research has made extensive use of conventional transmission electron microscopy (CTEM) ever since its invention. Polymer research focuses on materials that mainly consist of carbon and other light elements. These materials are relatively weak electron scatterers and therefore give low mass thickness and phase contrast. Mass thickness contrast may be enhanced using an objective aperture, staining, and/or low 

---

Small domains of high electronic density have been imaged in halato-telechelic ionomers by Scanning Transmission Electron Microscopy (STEM) using the technique of atomic number or Z-contrast. The possibility that these are ionic domains is evaluated and the morphology compared with that derived from recent SAXS experiments. 

Before specifically dealing with coherent x-ray imaging, its foundations, and its advantages, we note that alternate experimental solutions were used to tackle these problems. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) probe the surface morphology and the overall microstructure of metal electrodeposits. However, they do not work in real time they are used to analyze the final products after the end of the growth. 

---