Scanning Kelvin probe force

Scanning Kelvin Probe Force Microscopy (SKPFM)... 

SKPFM Scanning Kelvin probe force microscopy... 

It is also possible to combine AFM with SKP to achieve the capability to map Volta potentials with submicron resolution [90, 120, 121]. The Scanning Kelvin Probe Force Microscope (SKPFM) operates by scanning the topography across a line and then, during a rescan of that line at a fixed distance from the surface. 

Defects at the interface most likely play an important role in the delamination process. Unfortunately, the defects in self-assembled films are mostly nanoscopic and can be studied only with atomic force microscopy (AFM) and STM, which require very time-consuming preparation and limit the flexibility of the experiments. Other operation modes such as scanning Kelvin probe force microscopy (SKPFM) [73] will play an important role in future work [74]. 

Guillaumin, V., Schmutz, P, Frankel, G. S. Characterization of corrosion interfaces by the scanning Kelvin probe force microscopy technique. Journal of the Electrochemical Society 2001, 148, B163-B173. 

A further spatially resolved method, also based on work function contrast, is scanning Kelvin probe microscopy (SKPM). As an extended version of atomic force microscopy (AFM), additional information on the local surface potential is revealed by a second feedback circuit. The method delivers information depending on the value (p (p(x) + A x). Here, A(zS(x) is the difference in work function between the sample and the AFM tip and cp(x) is the local electric potential [12]. (p x) itself gives information on additional surface charges due to... 

While the previously described techniques both require extrapolation of measured data in order to calculate the contact resistance, Kelvin probe force microscopy (KFM, also known as scanning surface potential microscopy or scanning potenti-ometry) can be used to determine the source and drain contributions to the contact resistance directly. In KFM, a conductive atomic force microscope (AFM) tip is scanned over the operational OFET channel twice. On the first pass, the topography... 

Characterizing these many aspects of microstructure is necessary to establish relationships between primary chemical structure, processing, and performance. Currently, the most commonly used methods are scanning probe microscopy techniques such as atomic force microscopy (AFM) or kelvin probe force microscopy... 

Scanning force spectroscopy (SFS) Force-distance curves Amplitude-distance curves Phase-distance curves Frequency-distance curves - Kelvin probe spectroscopy - Scanning capacitance spectroscopy Full-resonance spectroscopy (FRS) AFAM resonance spectroscopy (AFAM-RS) Scanning spreading resistance spectroscopy (SSRS)... 

Many-pass techniques Electric Force Microscopy (EFM) Scanning Capacitance Microscopy (SCaM) Kelvin Probe Microscopy (SKM) DC Magnetic Force Microscopy (DC MFM) AC Magnetic Force Microscopy (AC MFM) Dissipation Force Microscopy-Scanning Surface Potential Microscopy (SSPM) Scanning Maxwell Stress Microscpy (SMMM) Magnetic Force Microscopy (MFM) Van der Waals Force Microscopy (VDWFM)... 

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