Kelvin probe microscopy

Kelvin probe microscopy, 3 332 Kemira mixer-settler, 10 775 Kenaf, 11 292, 293-294 uses of, 11 299t, 300 Kendall structure, 19 204-205 Kennecott rhenium technology, 21 682 Kennecott wet chlorination plant, 22 84 Kenyaite, 22 455... 

Hallam T, Lee M, Zhao N, Nandhakumar I, Kemerink M, Heeney M, McCulloch I, Sirringhaus H (2009) Local charge trapping in conjugated polymers resolved by scanning Kelvin probe microscopy. Phys Rev Lett 103 256803... 

Fig. 12.7. Assessment of channel length of SAP-defined source-drain electrodes (A) top-view environmental scanning electron microscopy (ESEM) image of channel region (B) Scanning Kelvin probe microscopy of...

Many-pass techniques Electric Force Microscopy (EFM) Scanning Capacitance Microscopy (SCaM) Kelvin Probe Microscopy (SKM) DC Magnetic Force Microscopy (DC MFM) AC Magnetic Force Microscopy (AC MFM) Dissipation Force Microscopy-Scanning Surface Potential Microscopy (SSPM) Scanning Maxwell Stress Microscpy (SMMM) Magnetic Force Microscopy (MFM) Van der Waals Force Microscopy (VDWFM)... 

A further spatially resolved method, also based on work function contrast, is scanning Kelvin probe microscopy (SKPM). As an extended version of atomic force microscopy (AFM), additional information on the local surface potential is revealed by a second feedback circuit. The method delivers information depending on the value (p (p(x) + A x). Here, A(zS(x) is the difference in work function between the sample and the AFM tip and cp(x) is the local electric potential [12]. (p x) itself gives information on additional surface charges due to... 

FIGURE 2.3.12 (a) Schematic diagram of experimental setup for scanning Kelvin probe microscopy (SKPM). (b) Profiles of an L = 5.5 J,m P3HT transistor with Cr electrodes taken at three different temperatures V = 0 V, = -8 V). The inset shows a profile obtained after switching the source and drain contacts on the same TFT with both Cr and Cr-Au contacts Vg = 0 V, = -8 V). (From Burgi, L. et ah, J. Appl. Phys., 94, 6129-6137, 2003. Reprinted with permission. Copyright 2003, American Institute of Physics.)... 

K. Maturova, M. Kemerink, M.M. Wienk, D.S.H. Charrier, and R.A.J. Janssen, Scanning Kelvin probe microscopy on bulk heterojunction polymer blends. Adv. Funct. Mater., 19, 1... 

The force harmonics F and F2 are both proportional to the capacitance gradient SCfSz. More importantly, the first harmonic of the electric force Fi is directly proportional to the surface potential Vs- At a given position, this surface potential can be measured directly by varying Vdc, so that the first harmonic of the electric force Ft is equal to zero. In this way, the DC voltage, necessary to compensate the first harmonic, is equal to the surface electric potential Vs- This is the principle of the Kelvin Probe Microscopy. Furthermore, by dividing the first harmonic Fi by the second harmonic F2... 

Szunerits, S., Mermoux, M., Crisci, A. et al. 2006. Raman imaging and Kelvin probe microscopy for the examination of the heterogeneity of doping in polycrystaUine boron-doped diamond electrodes. J. Phys. Chem. B 110 23888-23897. 

Further work saw the use of SECM-AFM in conjunction with in situ AFM and Kelvin probe microscopy to examine and interpret the localized corrosion behavior of two aluminum alloys, EN AW-3003 and Al-Mn-Sr-Zr, which are commonly used as heat exchangers [55]. It was found that the Al-Mn-Sr-Zr alloy contained a smaller number of intermetallics with larger Volta differences, compared to the EN AW-3003 alloy. This correlated well with the SECM-AFM images that showed that the EN AW-3003 alloy was significantly more corrosion active, resulting in higher material loss during dissolution. 

Henning, A. K., Hochwitz, T., Slinkman, J., Never, J., Hoffmann, S., Kaszuba, P, Daghlian, C. Two-dimensional surface dopant profiling in sdicon using scanning Kelvin probe microscopy. Journal of Applied Physics 1995,77, 1888-1896. 

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