PASS technique

Many-pass techniques Electric Force Microscopy (EFM) Scanning Capacitance Microscopy (SCaM) Kelvin Probe Microscopy (SKM) DC Magnetic Force Microscopy (DC MFM) AC Magnetic Force Microscopy (AC MFM) Dissipation Force Microscopy-Scanning Surface Potential Microscopy (SSPM) Scanning Maxwell Stress Microscpy (SMMM) Magnetic Force Microscopy (MFM) Van der Waals Force Microscopy (VDWFM)... 

Assessment of global ventricular function (first pass technique for determination of ejection fraction and/or regional wall motion)... 

There is a voluminous hterature concerned with the study of flame spectra, but the application of spectroscopy to the study of flame kinetics followed the introduction of flame photometry as a general analytical tool. The chief interest before this was in the spectra of the flames, which could serve to demonstrate the presence of intermediates in the combustion process. These were in general detected by the emission spectra of excited species and therefore were not necessarily indicative of the concentrations of ground state species. The difficulties of constructing burners which were sufficiently large and uniform to allow the study of absorption spectra prohibited a measurement of the species in their ground states, until the development of the multiple pass technique. ... 

A routine to compute the matrix vector product c = Ab using a hybrid multi-threading and message-passing technique. The algorithm shown combines the MPI and OpenMP parallelizations illustrated in Figures 4.4 and 4.6. Since all MPI calls are from the main thread, MPI need only support the "funneled" level of multi-threading. 

CST parameters were estabHshed by means of 2D PASS technique. In order to precisely assign the Su values, the sufficient number of spinning side-... 

All portable fire extinguishers work the same way. This commonality of design makes them easy to use. An easy way to remember how to use the extinguisher is the PASS technique pull, aim, squeeze, and sweep. 

Figure 3.35. Dual pass technique used to collect signals due to force gradients 5-50 nm above the surface (A). The resulting output signal traces are shown in (B). Note that the phase or frequency may have a direction owing to the sign of the interaction (e.g., whether positive or negative bias is used in EFM).

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