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Magnetic force microscopy

Figure Bl.19.22. Magnetic force microscopy image of an 8 pm wide track on a magnetic disk. The bit transitions are spaced every 2 pm along the track. Arrows point to the edges of the DC-erased region. (Taken from [109], figure 7.)... Figure Bl.19.22. Magnetic force microscopy image of an 8 pm wide track on a magnetic disk. The bit transitions are spaced every 2 pm along the track. Arrows point to the edges of the DC-erased region. (Taken from [109], figure 7.)...
Flobbs P, Abraham D and Wickramasinghe FI 1989 Magnetic force microscopy with 25 nm resolution Appl. Phys. Lett 55 2357... [Pg.1725]

Rugar D, Mamin FI J, Guenther P, Lambert S E, Stern J E, McFadyen I and Yogi T 1990 Magnetic force microscopy general principles and application to longitudinal recording media J. Appl. Phys. 68 1169... [Pg.1725]

The second mode of operation is the non-contact mode, in which the distance between tip and sample is much larger, between 2 and 30 nm. In this case one describes the forces in terms of the macroscopic interaction between bodies. Magnetic force microscopy, in which the magnetic domain structure of a solid can be imaged, is an example of the non-contact mode operation. [Pg.164]

Non-contact atomic force microscopy (NC-AFM) Magnetic force microscopy (MFM)... [Pg.33]

The force microscope, in general, has several modes of operation. In the repulsive-force or contact mode, the force is of the order of 1-10 eV/A, or 10 -10 newton, and individual atoms can be imaged. In the attractive-force or noncontact mode, the van der Waals force, the exchange force, the electrostatic force, or magnetic force is detected. The latter does not provide atomic resolution, but important information about the surface is obtained. Those modes comprise different fields in force microscopy, such as electric force microscopy and magnetic force microscopy (Sarid, 1991). Owing to the limited space, we will concentrate on atomic force microscopy, which is STM s next of kin. [Pg.314]

Dip-pen nanolithography has been employed to obtain magnetic nanopattems of y-Fe203 nanocrystals on mica and silicon substrates. The chemical and magnetic nature of the patterns have been characterized employing low-energy electron microscopy, x-ray photoemission electron microscopy, and magnetic force microscopy measurements. 2004 American Institute of Physics. [Pg.512]

Magnetic force microscopy (MFM), where the AFM tip is coated by a layer of magnetized metal, thus allowing the study of magnetic surfaces, with a reduced lateral sensitivity ( 5nm). [Pg.701]

Many-pass techniques Electric Force Microscopy (EFM) Scanning Capacitance Microscopy (SCaM) Kelvin Probe Microscopy (SKM) DC Magnetic Force Microscopy (DC MFM) AC Magnetic Force Microscopy (AC MFM) Dissipation Force Microscopy-Scanning Surface Potential Microscopy (SSPM) Scanning Maxwell Stress Microscpy (SMMM) Magnetic Force Microscopy (MFM) Van der Waals Force Microscopy (VDWFM)... [Pg.358]

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