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Electric force microscopy

Electric force microscopy, 3 332 Electric furnace acid, 11 121 Electric furnace ferromanganese production, 15 552-553 Electric furnace process, for zircon, 26 627-628... [Pg.302]

The force microscope, in general, has several modes of operation. In the repulsive-force or contact mode, the force is of the order of 1-10 eV/A, or 10 -10 newton, and individual atoms can be imaged. In the attractive-force or noncontact mode, the van der Waals force, the exchange force, the electrostatic force, or magnetic force is detected. The latter does not provide atomic resolution, but important information about the surface is obtained. Those modes comprise different fields in force microscopy, such as electric force microscopy and magnetic force microscopy (Sarid, 1991). Owing to the limited space, we will concentrate on atomic force microscopy, which is STM s next of kin. [Pg.314]

Johnson, A.S., C.L. Nehl, M.G. Mason, and J.H. Hafner. 2003. Fluid electric force microscopy for charge density mapping in biological systems. Langmuir 19 10007-10010. [Pg.176]

Wilson, N.R., and J.V. MacPherson. 2004. Enhanced resolution electric force microscopy with single-wall carbon nanotube tips. J. Appl. Phys. 96 3565-3567. [Pg.176]

DC-EFM Dynamic contact mode electrical force microscopy... [Pg.89]

The term electrical force microscopy or electrostatic force microscopy (EFM) is used if the detection of the electrical properties like surface potential or charge is based on a force, leading to a d.c. cantilever bending or to a change in the vibration amplitude or frequency of a vibrating cantilever. [Pg.171]

Muller, F., et al. (1997), Applications of scanning electrical force microscopy, Micro-electron. ReliabU., 37(10-11), 1631-1634. [Pg.1322]

Force Modulation Mode Contact Electric Force Microscopy (EFM) Young s Modulus Microscopy (YMM) Scanning near-field acoustic Force-distance measurements... [Pg.358]

Many-pass techniques Electric Force Microscopy (EFM) Scanning Capacitance Microscopy (SCaM) Kelvin Probe Microscopy (SKM) DC Magnetic Force Microscopy (DC MFM) AC Magnetic Force Microscopy (AC MFM) Dissipation Force Microscopy-Scanning Surface Potential Microscopy (SSPM) Scanning Maxwell Stress Microscpy (SMMM) Magnetic Force Microscopy (MFM) Van der Waals Force Microscopy (VDWFM)... [Pg.358]

Melin, T. et al.. Electric force microscopy of individually charged nanoparticles on conductors An analytical model for quantitative charge imaging, Phys. Rev. B 69, 35321, 2004. [Pg.335]

Zdrojek, M. et al.. Charging and emission effects of multiwalled carbon nanotubes probed by electric force microscopy, Appl. Phys. Lett. 86, 213114, 2005. [Pg.335]

Atomic Force Microscopy (AFM), Kelvin Probe Force Microscopy (KFM), and Electric Force Microscopy (EFM)... [Pg.103]

J.N. Barisci, R. Stella, G.M. Spinks, and G.G. Wallace, Characterisation of the topography and surface potential of electrodeposited conducting polymer films using atomic force and electric force microscopies. Electrochim. Acta, 46, 519 (2000). [Pg.152]

Another widely used application of dynamic modes is the investigation of surface electrical characteristics. Electrical force microscopy (EFM) comprises a set of related techniques [70], and provides the possibility of probing locahzed charge distribution. [Pg.392]

Figure 9.18 Topography image (left), and SP image (right), of a PPy/p-toluene sulphonate (PTS) film grown potentiostatically at 0.6 V for 5 min, thickness 150 nm. (Reprinted with permission from Electrochimica Acta, Characterisation of the topography and surface potential of electrodeposited conducting polymer films using atomic force and electric force microscopies by J. N. Barisci, R. Stella, G. M. Spinks and G. G. Wallace, 46, 4. Copyright (2000) Elsevier Ltd)... Figure 9.18 Topography image (left), and SP image (right), of a PPy/p-toluene sulphonate (PTS) film grown potentiostatically at 0.6 V for 5 min, thickness 150 nm. (Reprinted with permission from Electrochimica Acta, Characterisation of the topography and surface potential of electrodeposited conducting polymer films using atomic force and electric force microscopies by J. N. Barisci, R. Stella, G. M. Spinks and G. G. Wallace, 46, 4. Copyright (2000) Elsevier Ltd)...
W.R. Silveira, E.M. Muller, T.N. Ng, D.H. Dunlap, and J.A. Marohn, High sensitivity electric force microscopy of organic electronic materials and devices. In Scanning Probe Microscopy Electrical and Electrochemical Phenomena at the Nanoscale ed. S. Kalinin and A. Gruverman, Springer, New York, 2006. [Pg.409]

See other pages where Electric force microscopy is mentioned: [Pg.284]    [Pg.574]    [Pg.575]    [Pg.33]    [Pg.375]    [Pg.302]    [Pg.433]    [Pg.136]    [Pg.48]    [Pg.27]    [Pg.33]    [Pg.191]    [Pg.595]    [Pg.44]    [Pg.46]    [Pg.94]    [Pg.301]    [Pg.301]    [Pg.310]    [Pg.313]    [Pg.102]    [Pg.104]    [Pg.387]    [Pg.398]    [Pg.410]   
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See also in sourсe #XX -- [ Pg.102 , Pg.104 ]

See also in sourсe #XX -- [ Pg.203 ]

See also in sourсe #XX -- [ Pg.83 ]



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