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Raman reflection

Resonance Raman reflection spectroscopy of monolayers is possible, as illustrated in Fig. IV-14 for cetyl orange [157]. The polarized spectra obtained with an Ar ion laser allowed estimates of orientational changes in the cetyl orange molecules with a. [Pg.127]

To this group belong several models of very different kinds such as the image model (RE-IE), the charge transfer (RE-CT) model, the electron-hole excitation model (RE-EH), and the Raman reflectivity model (RE-RF). These models have very little in common except that they all lead to enhancements by virtue of a resonance scattering mechanism. The validity of the last statement is not always realized by people, but it will be shown below to hold true. [Pg.325]

The image models describe SERS in terms of molecular states modified by the surface. The CT model focused on joint molecule-metal states. The Raman reflectivity envisages the scattering as coming from the metal, modified by the presence of the molecule, and its internal vibrations. [Pg.334]

To summarize this part, one might say that the Raman reflectivity models, though possible in principle, still need more theoretical substantiation before one can decide regarding their importance in SERS. Certainly, these mechanisms cannot be the whole story. [Pg.336]

The three terms of Eq. (18) stand for three distinct processes. The first is the usual scattering of the isolated molecule. The second corresponds to the additional Raman scattering by the molecule due to the local field induced by the polarizable metal. The third term is a Raman reflectivity, where the coupling mechanism is the coulombic interaction [see Section III.2(iii)]. If the term Mai is 1, then enhancements of the Raman scattering are expected. [Pg.339]

The spectrum (Figure 19c) required only a short Raman collection, because shear-force controlled apertureless internal reflection Raman SNOM also creates the characteristic enhancement of the Raman reflection back to the sharp tapered fiber. Further, resonant Raman SNOM spectra of silicon (519.7 cm ) under an old (5 nm) or a freshly grown silica layer, and nomesonant Raman SNOM of these layers (500 cm ) as well as of gallium nitride (nonresonant El (TO) and E2 Raman modes at 560.8 and 570.4 cm ) on alumina (subtraction of the Raman response of support and fiber) with the shear-force apertureless technique (using 488 nm light) at total collection times of <10 min have been reported in Ref. 25. [Pg.690]

Figure 33.6 shows the typical spectra of FTIR absorption, Raman reflection, and neutron diffraction from water at the ambient. There are four features... [Pg.679]

Fig. 33.6 Typical vibrational spectra as measured using IR absorption, Raman reflection, and inelastic neutron scattering [35] from water at the ambient. Peaks correspond to 0 H stretching mode col < 300 cm , ZO H-0 bending mode to 500 cm ZH-O-H bending liberation mode 1,500 < m < 1,800 cm H-0 stretching mode in bulk water Wh 3,200 cm , H-O stretching mode in the liquid skin coh 3,450 cm The liberation mode is insensitive to the external stimulus. See Appendix A4-1 for the vibration mode frequency correspondence... Fig. 33.6 Typical vibrational spectra as measured using IR absorption, Raman reflection, and inelastic neutron scattering [35] from water at the ambient. Peaks correspond to 0 H stretching mode col < 300 cm , ZO H-0 bending mode to 500 cm ZH-O-H bending liberation mode 1,500 < m < 1,800 cm H-0 stretching mode in bulk water Wh 3,200 cm , H-O stretching mode in the liquid skin coh 3,450 cm The liberation mode is insensitive to the external stimulus. See Appendix A4-1 for the vibration mode frequency correspondence...
Vibrational Spectroscopy. Infrared absorption spectra may be obtained using convention IR or FTIR instrumentation the catalyst may be present as a compressed disk, allowing transmission spectroscopy. If the surface area is high, there can be enough chemisorbed species for their spectra to be recorded. This approach is widely used to follow actual catalyzed reactions see, for example. Refs. 26 (metal oxide catalysts) and 27 (zeolitic catalysts). Diffuse reflectance infrared reflection spectroscopy (DRIFT S) may be used on films [e.g.. Ref. 28—Si02 films on Mo(llO)]. Laser Raman spectroscopy (e.g.. Refs. 29, 30) and infrared emission spectroscopy may give greater detail [31]. [Pg.689]

Almost every modem spectroscopic approach can be used to study matter at high pressures. Early experiments include NMR [ ], ESR [ ] vibrational infrared [33] and Raman [ ] electronic absorption, reflection and emission [23, 24 and 25, 70] x-ray absorption [Tf] and scattering [72], Mossbauer [73] and gems analysis of products recovered from high-pressure photochemical reactions [74]. The literature contains too many studies to do justice to these fields by describing particular examples in detail, and only some general mles, appropriate to many situations, are given. [Pg.1961]

The Franck-Condon principle reflected in tire connection between optical and tliennal ET also relates to tire participation of high-frequency vibrational degrees of freedom. Charge transfer and resonance Raman intensity bandshape analysis has been used to detennine effective vibrational and solvation parameters [42,43]. [Pg.2985]

Figure 5.13 shows a typical experimental arrangement for obtaining the Raman spectmm of a gaseous sample. Radiation from the laser source is focused by the lens Lj into a cell containing the sample gas. The mirror Mj reflects this radiation back into the cell to increase... [Pg.122]

The deterrnination of surface temperature and temperature patterns can be made noninvasively using infrared pyrometers (91) or infrared cameras (92) (see Infrared technology and raman spectroscopy). Such cameras have been bulky and expensive. A practical portable camera has become available for monitoring surface temperatures (93). An appropriately designed window, transparent to infrared radiation but reflecting microwaves, as well as appropriate optics, is needed for this measurement to be carried out during heating (see Temperature measurement). [Pg.343]

Several properties of the filler are important to the compounder (279). Properties that are frequentiy reported by fumed sihca manufacturers include the acidity of the filler, nitrogen adsorption, oil absorption, and particle size distribution (280,281). The adsorption techniques provide a measure of the surface area of the filler, whereas oil absorption is an indication of the stmcture of the filler (282). Measurement of the sdanol concentration is critical, and some techniques that are commonly used in the industry to estimate this parameter are the methyl red absorption and methanol wettabihty (273,274,277) tests. Other techniques include various spectroscopies, such as diffuse reflectance infrared spectroscopy (drift), inverse gas chromatography (igc), photoacoustic ir, nmr, Raman, and surface forces apparatus (277,283—290). [Pg.49]

Laser stimulation of a silver surface results in a reflected signal over a million times stronger than that of other metals. Called laser-enhanced Raman spectroscopy, this procedure is useful in catalysis. The large neutron cross section of silver (see Fig. 2), makes this element useful as a thermal neutron flux monitor for reactor surveillance programs (see Nuclearreactors). [Pg.82]

A schematic of a PL system layout is shown in Figure 5. This optical system is very similar to that required for absorption, reflectance, modulated reflectance, and Raman scattering measurements. Many custom systems are designed to perform several of these techniques, simultaneously or with only small modifications. [Pg.383]

Usually, particle size has relatively little effect on Raman line shapes unless the particles are extremely small, less than 100 nm. For this reason, high-quality Raman spectra can be obtained from powders and from polycrystalline bulk specimens like ceramics and rocks by simply reflecting the laser beam from the specimen surface. Solid samples can be measured in the 90° scattering geometry by mounting a slab of the solid sample, or a pressed pellet of a powder sample so that the beam reflects from the surface but not into the entrance slit (Figure 3). [Pg.433]

Solid state NMR is a relatively recent spectroscopic technique that can be used to uniquely identify and quantitate crystalline phases in bulk materials and at surfaces and interfaces. While NMR resembles X-ray diffraction in this capacity, it has the additional advantage of being element-selective and inherently quantitative. Since the signal observed is a direct reflection of the local environment of the element under smdy, NMR can also provide structural insights on a molecularlevel. Thus, information about coordination numbers, local symmetry, and internuclear bond distances is readily available. This feature is particularly usefrd in the structural analysis of highly disordered, amorphous, and compositionally complex systems, where diffraction techniques and other spectroscopies (IR, Raman, EXAFS) often fail. [Pg.460]

Raman spectroscopy has provided information on catalytically active transition metal oxide species (e. g. V, Nb, Cr, Mo, W, and Re) present on the surface of different oxide supports (e.g. alumina, titania, zirconia, niobia, and silica). The structures of the surface metal oxide species were reflected in the terminal M=0 and bridging M-O-M vibrations. The location of the surface metal oxide species on the oxide supports was determined by monitoring the specific surface hydroxyls of the support that were being titrated. The surface coverage of the metal oxide species on the oxide supports could be quantitatively obtained, because at monolayer coverage all the reactive surface hydroxyls were titrated and additional metal oxide resulted in the formation of crystalline metal oxide particles. The nature of surface Lewis and Bronsted acid sites in supported metal oxide catalysts has been determined by adsorbing probe mole-... [Pg.261]

Raman modes. Such a symmetry analysis will also be useful for identifying the chirality of CNTs. The spectral features in the intermediate frequency range may come from the finite length of CNTs. The resonant Raman intensity may reflect differences in the DOS between metallic and semiconducting CNTs. [Pg.61]


See other pages where Raman reflection is mentioned: [Pg.334]    [Pg.338]    [Pg.63]    [Pg.187]    [Pg.334]    [Pg.338]    [Pg.63]    [Pg.187]    [Pg.203]    [Pg.1179]    [Pg.1217]    [Pg.1264]    [Pg.1280]    [Pg.1299]    [Pg.1868]    [Pg.2749]    [Pg.2962]    [Pg.123]    [Pg.268]    [Pg.269]    [Pg.417]    [Pg.134]    [Pg.233]    [Pg.224]    [Pg.414]    [Pg.456]    [Pg.131]    [Pg.782]   
See also in sourсe #XX -- [ Pg.63 ]




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