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Laser surface analysis

Lykke K R and Kay B D 1990 State-to-state inelastic and reactive molecular beam scattering from surfaces Laser Photoionization and Desorption Surface Analysis Techniquesvo 1208, ed N S Nogar (Bellingham, WA SPIE) p 1218... [Pg.919]

In Surface Analysis by Laser Ionization (SALI), a probe beam such as an ion beam, electron beam, or laser is directed onto a surfiice to remove a sample of material. An untuned, high-intensity laser beam passes parallel and close to but above the sur-fiice. The laser has sufficient intensity to induce a high degree of nonresonant, and hence nonselective, photoionization of the vaporized sample of material within the laser beam. The nonselectively ionized sample is then subjected to mass spectral analysis to determine the nature of the unknown species. SALI spectra accurately reflect the surface composition, and the use of time-of-flight mass spectrometers provides fast, efficient and extremely sensitive analysis. [Pg.42]

In Surface Analysis by Laser Ionization (SAU) ionized and neutral atoms are sputtered from the sample surface, typically using an ion beam (like SIMS) or a... [Pg.528]

In other articles in this section, a method of analysis is described called Secondary Ion Mass Spectrometry (SIMS), in which material is sputtered from a surface using an ion beam and the minor components that are ejected as positive or negative ions are analyzed by a mass spectrometer. Over the past few years, methods that post-ion-ize the major neutral components ejected from surfaces under ion-beam or laser bombardment have been introduced because of the improved quantitative aspects obtainable by analyzing the major ejected channel. These techniques include SALI, Sputter-Initiated Resonance Ionization Spectroscopy (SIRIS), and Sputtered Neutral Mass Spectrometry (SNMS) or electron-gas post-ionization. Post-ionization techniques for surface analysis have received widespread interest because of their increased sensitivity, compared to more traditional surface analysis techniques, such as X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES), and their more reliable quantitation, compared to SIMS. [Pg.559]

Surface Analysis by Laser Ionization Post-Ionization Secondary Ion Mass Spectrometry Multi-Photon Nonresonant Post Ionization Multiphoton Resonant Post Ionization Resonant Post Ionization Multi-Photon Ionization Single-Photon Ionization... [Pg.768]

Surface analysis by non-resonant (NR-) laser-SNMS [3.102-3.106] has been used to improve ionization efficiency while retaining the advantages of probing the neutral component. In NR-laser-SNMS, an intense laser beam is used to ionize, non-selec-tively, all atoms and molecules within the volume intersected by the laser beam (Eig. 3.40b). With sufficient laser power density it is possible to saturate the ionization process. Eor NR-laser-SNMS adequate power densities are typically achieved in a small volume only at the focus of the laser beam. This limits sensitivity and leads to problems with quantification, because of the differences between the effective ionization volumes of different elements. The non-resonant post-ionization technique provides rapid, multi-element, and molecular survey measurements with significantly improved ionization efficiency over SIMS, although it still suffers from isoba-ric interferences. [Pg.132]

Initial results prove the high potential of LA-based hyphenated techniques for depth profiling of coatings and multilayer samples. These techniques can be used as complementary methods to other surface-analysis techniques. Probably the most reasonable application of laser ablation for depth profiling would be the range from a few tens of nanometers to a few tens of microns, a range which is difficult to analyze by other techniques, e. g. SIMS, SNMS,TXRE, GD-OES-MS, etc. The lateral and depth resolution of LA can both be improved by use of femtosecond lasers. [Pg.240]

Laser microprobe MS (LMMS) can be used for direct analysis of normal-phase HPTLC plates [802,837]. Kubis et al. [802] used polyamide TLC plates polyamide does not interfere with compound identification by the mass spectrum, owing to its low-mass fragment-ions (m/z < 150). LMMS is essentially a surface analysis technique, in which the sample is ablated using a Nd-YAG laser. The UV irradiation desorbs and ionises a microvolume of the sample the positive and negative ions can be analysed by using a ToF mass spectrometer. The main characteristics of TLC-LMMS are indicated in Table 7.84 [838],... [Pg.541]

Laser desorption methods (such as LD-ITMS) are indicated as cost-saving real-time techniques for the near future. In a single laser shot, the LDI technique coupled with Fourier-transform mass spectrometry (FTMS) can provide detailed chemical information on the polymeric molecular structure, and is a tool for direct determination of additives and contaminants in polymers. This offers new analytical capabilities to solve problems in research, development, engineering, production, technical support, competitor product analysis, and defect analysis. Laser desorption techniques are limited to surface analysis and do not allow quantitation, but exhibit superior analyte selectivity. [Pg.737]

Infrared and ultraviolet probes for surface analysis are then considered.The applications of IR spectroscopy and Raman microscopy are discussed, and a brief account is also given of laser-microprobe mass spectrometry (LAMMA). [Pg.229]

Figure 6. Plan of the target preparation facilities consisting of UHV preparation chamber (a), (reactive) ion etching chamber (b), ion etching gun (c), laser (d), photon detector (e), transfer arms (f), Auger system for surface analysis (g), sample manipulator and annealing facility (h), load lock and optical microscope for viewing sample (i), evaporator (j), transmission diffractometer (k), and vacuum tank for main spectrometer (1). Figure 6. Plan of the target preparation facilities consisting of UHV preparation chamber (a), (reactive) ion etching chamber (b), ion etching gun (c), laser (d), photon detector (e), transfer arms (f), Auger system for surface analysis (g), sample manipulator and annealing facility (h), load lock and optical microscope for viewing sample (i), evaporator (j), transmission diffractometer (k), and vacuum tank for main spectrometer (1).
The desorption laser can be tracked across the surface of the meteorite so the plume of molecules can be associated directly with internal structures and morphology on the meteorite surface. The internal morphology of a meteorite is accessed by cleaving the sample in an ultraclean environment to prevent terrestrial contamination, followed by the laser desorption analysis. Nearly all meteorites have been studied in this way producing a mature field of research, however, the details of just two meteorites will be discussed in some detail. The Murchison and ALH84001 meteorites have provoked considerable interest, particularly the Antarctic meteorite ALH84001, which was the subject of a NASA announcement regarding life on Mars. [Pg.170]

Mass spectrometric measurements of ions desorbed/ionized from a surface by a laser beam was first performed in 1963 by Honig and Woolston [151], who utilized a pulsed mby laser with 50 p,s pulse length. Hillenkamp et al. used microscope optics to focus the laser beam diameter to 0.5 p,m [152], allowing for surface analysis with high spatial resolution. In 1978 Posthumus et al. [153] demonstrated that laser desorption /ionization (LDI, also commonly referred to as laser ionization or laser ablation) could produce spectra of nonvolatile compounds with mass > 1 kDa. For a detailed review of the early development of LDI, see Reference 154. There is no principal difference between an LDI source and a MALDI source, which is described in detail in Section 2.1.22 In LDI no particular sample preparation is required (contrary to... [Pg.34]

Brands proposed a calculation method in the case of segregation A special type of inhomogeneous, particulate objects is the surface analysis by microscopic techniques e.g. analytical electron sj troscopy, laser induced mass spectroscopy or proton-induced X-ray emission. Here the minimum sample size can be translated into the minimum number of specific sample points in the specimen under investigation. [Pg.51]

In contrast, the LA-ICP-MS (in comparison to laser ionization mass spectrometry (LIMS) where the ion source operates under high vacuum conditions) at present, in spite of the disadvantage of a higher polyatomic ion formation rate, uses an argon plasma ionization at normal pressure - a promising inorganic mass spectrometric technique for trace, isotope and surface analysis which will... [Pg.42]


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See also in sourсe #XX -- [ Pg.930 ]




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