Electron microscopy specimen preparation

For both optical and electron microscopy, specimen preparation is crucial, the basic concern being that the specimen prepared be a true represen-... 

Szot J, Hornsey R, Ohnishi T, Minagawa S (1992) Focused ion beam micromachining for transmission electron microscopy specimen preparation of semiconductor laser diodes. J Vac Sci Technol B 10 575-... 

See also Forensic Sciences Gunshot Residues Hair. Microscopy Applications Environmental. Microscopy Techniques Electron Microscopy Specimen Preparation for Electron Microscopy. X-Ray Fluorescence and Emission Energy Dispersive X-Ray Fluorescence. 

Ultrafiltration. Microscopy Applications Environmental Light Microscopy Electron Microscopy Specimen Preparation for Electron Microscopy Scanning Electron Microscopy Atomic Force and Scanning Tunneling Microscopy. Particle Size Analysis. Sampling Theory. 

K. C. Thompson-Russell and J. W. Edington. Electron Microscope Specimen Preparation Techniques in Materials Science. Monographs in Practical Electron Microscopy, No. 5- Philips Technical Library, Eindhoven Delaware, 1977. 

Alloys were prepared by arc melting high purity starting materials followed by homogenisation. Transmission electron microscopy specimens were prepared by... 

Specimens for electron microscopy were prepared as thin cross-sections and stained with uranyl acetate and lead citrate. A JEOL lOOB electron microscope was used to obtain the electron micrographs. Reconstruction of sections of these micrographs by Fourier filtration methods was done in collaboration with Dr. J. Frank of New York State Department of Health, Albany, N.Y. 

K. R. Peters, Penning Sputtering of Ultra Thin Metal Films for High Resolution Electron Microscopy, in Preparation of Biological Specimens for Scanning Electron Microscopy (eds. J. A. Murphy and G. M. Roomans), SEM, Chicago, 1980, pp. 173-184. 

E) Electron microscopy of the PSI complex Specimens for electron microscopy were prepared and negatively stained with uranyl acetate as described by Ford and Holzenburg [6]. The long and short axis of 20 particles were measured and mean values of 14.8 nm and 9.1 nm respectively, were obtained. 

Transmission electron microscopy is very widely used by biologists as well as materials scientists. The advantage of being able to resolve 0.2 nm outweighs the disadvantages of TEM. The disadvantages include the inabiUty of the common 100-kV electron beam to penetrate more than a few tenths of a micrometer (a 1000-kV beam, rarely used, penetrates specimens about 10 times thicker). Specimen preparation for the TEM is difficult because of the... 

Specimen Preparation for Transmission Electron Microscopy I. (J. C. Brav-man, R. M. Anderson, and M. L. McDonald, eds.) Volume 115 in MRS symposium proceedings series, 1988. 

S. Amelincks, D. van Dyck, J. van Landuyt, G. van Tendeloo (eds.) Electron Microscopy Principles and Fundamentals,VCH Verlagsgesellschaft mbH, Weinheim 1997. 2-178 R. M. Anderson, S. D. Walck (eds.) Specimen Preparation for Transmission Electron Microscopy of Materials IV, Materials Research Society, Pittsbrrrgh 1997. 

Aluminium is widely applied for decorative and protective requirements, while cadmium , zinc and titanium have been applied to ferrous materials chiefly for their protective value. The method finds particular application in the plating of high-tensile steels used in aviation and rocketry, car fittings and lamp reflectors, and gramophone record master discs, as well as in the preparation of specimens for electron microscopy and in rendering insulated surfaces electrically conducting, e.g. metallising of capacitors and resistors. 

This technique can be applied to samples prepared for study by scanning electron microscopy (SEM). When subject to impact by electrons, atoms emit characteristic X-ray line spectra, which are almost completely independent of the physical or chemical state of the specimen (Reed, 1973). To analyse samples, they are prepared as required for SEM, that is they are mounted on an appropriate holder, sputter coated to provide an electrically conductive surface, generally using gold, and then examined under high vacuum. The electron beam is focussed to impinge upon a selected spot on the surface of the specimen and the resulting X-ray spectrum is analysed. 

III. Transmission electron microscopy of radish seeds Transmission electron microscopy (TEM) of radish seeds was done as listed below For TEM preparations, the specimens after fixation and dehydration, were embedded in Epon 812 resin (Luft, 1961). Thick sections (ca. 1mm each) were stained with 0.1% toluidine blue and observed with a Zeiss light photomicroscope. Thin sections, obtained with a diamond knife on a Supernova microtome, were sequentially stained at room temperature with 2% uranyle acetate (aqueous) for 5 min and by lead citrate for 10 min (Reynolds, 1963). Ultrastructural studies were made using a Philips CM12 transmission electrone microscope (TEM) operated at 80 KV. 

Moran DT, Rowley JC. Biological specimen preparation for correlative light and electron microscopy, in Correlative Microscopy in Biology, Instrumentation and Methods (Hayat MA, ed.), Academic Press, New York, 1987, pp. 2-22. 

Transmission electron microscopy (TEM) is a powerful and mature microstructural characterization technique. The principles and applications of TEM have been described in many books [16 20]. The image formation in TEM is similar to that in optical microscopy, but the resolution of TEM is far superior to that of an optical microscope due to the enormous differences in the wavelengths of the sources used in these two microscopes. Today, most TEMs can be routinely operated at a resolution better than 0.2 nm, which provides the desired microstructural information about ultrathin layers and their interfaces in OLEDs. Electron beams can be focused to nanometer size, so nanochemical analysis of materials can be performed [21]. These unique abilities to provide structural and chemical information down to atomic-nanometer dimensions make it an indispensable technique in OLED development. However, TEM specimens need to be very thin to make them transparent to electrons. This is one of the most formidable obstacles in using TEM in this field. Current versions of OLEDs are composed of hard glass substrates, soft organic materials, and metal layers. Conventional TEM sample preparation techniques are no longer suitable for these samples [22-24], Recently, these difficulties have been overcome by using the advanced dual beam (DB) microscopy technique, which will be discussed later. 

J. Bravman, R. Anderson, and M. McDonald, Eds., Specimen preparation for transmission electron microscopy of materials (I), MRS Symp. Proc., Vol. 115, Pittsburgh, 1988. 

J. Bravman and R. Sinclair, The preparation of cross-section specimens for transmission electron microscopy, J. Electron. Microsc. Tech., 1 53-61, 1984. 

Each specimen was dehydrated, infiltrated and embedded in Technovit based methylmethacrylate. One section was cut and around in preparation for scanning electron microscopy (SEM). In each case, three overview photos were necessary and four high magnification fields (40X) were photographed and digitized. These fields were later analyzed for volume fraction of soft tissue, bone... 

Glauert AM, Lewis PR (1998) Biological Specimen Preparation for Transmission Electron Microscopy. In Glauert AM (ed). Practical Methods in Electron Microscopy, vol 17. Portland Press, London... 

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