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Analytical electron microscopy specimen preparation

The bulk of the results obtained in this study were obtained by analytical transmission electron microscopy. Observations were made on both grades of material in the as-received, untested condition and after tensile testing at 1250°C. Test samples selected for examination covered the range of observed creep behavior, and included samples that failed after times ranging from -10 to -200 hours depending on applied stress and also samples from interrupted tests that survived for up to 2000 hours under lower applied stresses. In addition, a comparison was made of non-reinforced samples tested with and without a 500 hour pre-anneal at the test temperature. In all cases, the gauge sections of crept samples were cut parallel to the stress axis to obtain both near-surface and raid-plane sections. Prior to final TEM specimen preparation, these sections were examined optically for evidence of distributed creep cavitation or crack damage. [Pg.320]


See other pages where Analytical electron microscopy specimen preparation is mentioned: [Pg.3088]    [Pg.280]    [Pg.520]    [Pg.132]    [Pg.12]    [Pg.681]    [Pg.157]    [Pg.101]    [Pg.1078]    [Pg.60]   


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