Transmission electron microscopy specimen preparation

Szot J, Hornsey R, Ohnishi T, Minagawa S (1992) Focused ion beam micromachining for transmission electron microscopy specimen preparation of semiconductor laser diodes. J Vac Sci Technol B 10 575-... 

Alloys were prepared by arc melting high purity starting materials followed by homogenisation. Transmission electron microscopy specimens were prepared by... 

Transmission electron microscopy is very widely used by biologists as well as materials scientists. The advantage of being able to resolve 0.2 nm outweighs the disadvantages of TEM. The disadvantages include the inabiUty of the common 100-kV electron beam to penetrate more than a few tenths of a micrometer (a 1000-kV beam, rarely used, penetrates specimens about 10 times thicker). Specimen preparation for the TEM is difficult because of the... 

Specimen Preparation for Transmission Electron Microscopy I. (J. C. Brav-man, R. M. Anderson, and M. L. McDonald, eds.) Volume 115 in MRS symposium proceedings series, 1988. 

S. Amelincks, D. van Dyck, J. van Landuyt, G. van Tendeloo (eds.) Electron Microscopy Principles and Fundamentals,VCH Verlagsgesellschaft mbH, Weinheim 1997. 2-178 R. M. Anderson, S. D. Walck (eds.) Specimen Preparation for Transmission Electron Microscopy of Materials IV, Materials Research Society, Pittsbrrrgh 1997. 

III. Transmission electron microscopy of radish seeds Transmission electron microscopy (TEM) of radish seeds was done as listed below For TEM preparations, the specimens after fixation and dehydration, were embedded in Epon 812 resin (Luft, 1961). Thick sections (ca. 1mm each) were stained with 0.1% toluidine blue and observed with a Zeiss light photomicroscope. Thin sections, obtained with a diamond knife on a Supernova microtome, were sequentially stained at room temperature with 2% uranyle acetate (aqueous) for 5 min and by lead citrate for 10 min (Reynolds, 1963). Ultrastructural studies were made using a Philips CM12 transmission electrone microscope (TEM) operated at 80 KV. 

Transmission electron microscopy (TEM) is a powerful and mature microstructural characterization technique. The principles and applications of TEM have been described in many books [16 20]. The image formation in TEM is similar to that in optical microscopy, but the resolution of TEM is far superior to that of an optical microscope due to the enormous differences in the wavelengths of the sources used in these two microscopes. Today, most TEMs can be routinely operated at a resolution better than 0.2 nm, which provides the desired microstructural information about ultrathin layers and their interfaces in OLEDs. Electron beams can be focused to nanometer size, so nanochemical analysis of materials can be performed [21]. These unique abilities to provide structural and chemical information down to atomic-nanometer dimensions make it an indispensable technique in OLED development. However, TEM specimens need to be very thin to make them transparent to electrons. This is one of the most formidable obstacles in using TEM in this field. Current versions of OLEDs are composed of hard glass substrates, soft organic materials, and metal layers. Conventional TEM sample preparation techniques are no longer suitable for these samples [22-24], Recently, these difficulties have been overcome by using the advanced dual beam (DB) microscopy technique, which will be discussed later. 

J. Bravman, R. Anderson, and M. McDonald, Eds., Specimen preparation for transmission electron microscopy of materials (I), MRS Symp. Proc., Vol. 115, Pittsburgh, 1988. 

J. Bravman and R. Sinclair, The preparation of cross-section specimens for transmission electron microscopy, J. Electron. Microsc. Tech., 1 53-61, 1984. 

Glauert AM, Lewis PR (1998) Biological Specimen Preparation for Transmission Electron Microscopy. In Glauert AM (ed). Practical Methods in Electron Microscopy, vol 17. Portland Press, London... 

Csencsits, R. and Gronsky, R. (1988), in Specimen Preparation for Transmission Electron Microscopy of Materials MRS Symp. Proc., vol. 115 (eds ).C. Bravman, R.M. Anderson, and M.L McDonald), Materials Research Society, Pittsburg, PA, pp. 103-108. 

Transmission electron microscopy (TEM) can provide valuable information on particle size, shape, and structure, as well as on the presence of different types of colloidal structures within the dispersion. As a complication, however, all electron microscopic techniques applicable for solid lipid nanoparticles require more or less sophisticated specimen preparation procedures that may lead to artifacts. Considerable experience is often necessary to distinguish these artifacts from real structures and to decide whether the structures observed are representative of the sample. Moreover, most TEM techniques can give only a two-dimensional projection of the three-dimensional objects under investigation. Because it may be difficult to conclude the shape of the original object from electron micrographs, additional information derived from complementary characterization methods is often very helpful for the interpretation of electron microscopic data. 

Saka, H. (1998), Transmission electron microscopy observation of thin foil specimens prepared by means of a focused ion beam , Journal of Vacuum Science and Technology B, 16, 2522-2527. 

The oldest microscopy technique for materials analysis was optical microscopy. Even to this day, for feature sizes above 1 pm, this is one of the most popular tools. For smaller features, electron microscopy techniques such as scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are the tools of choice. A third family of microscopy includes scanning probe tools such as scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In these relatively recent techniques, sample preparation concerns are of minor importance compared to other problems, such as vibration isolation and processing of atomically sharp probes. Therefore, the latter techniques are not discussed here. This chapter is aimed at introducing the user to general specimen preparation steps involved in optical and electron microscopy [3 7], which to date are the most common... 

When transmission electron microscopy is used, the specimen has to be extremely thin (on the order of 0.1 to 10 pm) for the highly absorbable electrons to penetrate the solid and form an image. Preparing such a thin solid specimen with minimal artifacts is a very complicated problem that makes sample preparation a crucial step in the use of this technique. Therefore, a substantial part of this chapter (Section 9.3) is devoted to specimen thinning issues in TEM. 

See, for example, the three-volume symposia proceedings entitled Specimen Preparation for Transmission Electron Microscopy of Materials, Vols. I—III, Materials Research Society, Warrendale, PA, 1987, 1990, and 1993. 

The use of transmission electron microscopy in heterogeneous catalysis centers around particle size distribution measurement, particle morphology and structural changes in the support. Consideration is given to the limitations of conventional electron microscopy and how modifications to the instrument enable one to conduct in-situ experiments and be in a position to directly observe many of the features of a catalyst as it participates in a reaction. In order to demonstrate the power of the in-situ electron microscopy technique examples are drawn from areas which impact on aspects of catalyst deactivation. In most cases this information could not have been readily obtained by any other means. Included in this paper is a synopsis of the methods available for preparing specimens of model and real catalyst systems which are suitable for examination by transmission electron microscopy. 

Microtomy refers to sectioning materials with a knife. It is a common technique in biological specimen preparation. It is also used to prepare soft materials such as polymers and soft metals. Tool steel, tungsten carbide, glass and diamond are used as knife materials. A similar technique, ultramicrotomy, is widely used for the preparation of biological and polymer specimens in transmission electron microscopy. This topic is discussed in Chapter 3. 

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