Amorphous thin film

Nonferrous alloys account for only about 2 wt % of the total chromium used ia the United States. Nonetheless, some of these appHcations are unique and constitute a vital role for chromium. Eor example, ia high temperature materials, chromium ia amounts of 15—30 wt % confers corrosion and oxidation resistance on the nickel-base and cobalt-base superaHoys used ia jet engines the familiar electrical resistance heating elements are made of Ni-Cr alloy and a variety of Ee-Ni and Ni-based alloys used ia a diverse array of appHcations, especially for nuclear reactors, depend on chromium for oxidation and corrosion resistance. Evaporated, amorphous, thin-film resistors based on Ni-Cr with A1 additions have the advantageous property of a near-2ero temperature coefficient of resistance (58). 

Further, tungsten oxysulfide films, WOyS, have shown promising behavior as positive electrodes in microbatteries, unlike WS2 that is not suitable as cathode in lithium cells. Using amorphous thin films of WO1.05S2 and WO1.35S2.2 in the cell Li/LiAsFe, 1 M ethyl-methyl sulfone (EMS)/W03,Sz, Martin-Litas et al. [80] obtained current densities up to 37 xA cm between 1.6 and 3 V. In these cathode materials, 0.6 and 0.8 lithium per formula unit, respectively, could be intercalated and de-intercalated reversibly. 

D. J. Emin, Polycrystalline and Amorphous Thin Films and Devices, Ed. by L. L. Kazmerski, Academic, New York, 1980. 

Furthermore, it should be thermally stable, should be phase compatible, and should readily form uniform amorphous thin films [355]. 

M. Brinkmann, G. Gadret, M. Muccini, C. Taliani, N. Masciocchi, and A. Sironi, Correlation between molecular packing and optical properties in different crystalline polymorphs and amorphous thin films of mer-Tris(8-hydroxyquinolinc)Aluminum(III), J. Am. Chem. Soc., 122 5147— 5157 (2000). 

Mobility measurements by the TOP methods considered in Chapters 3 and 4 are particularly important, but they cannot give information about the whole spectrum of states in the mobility gap of amorphous chalcogenides. Therefore, in addition to TOP, XTOP, IPTOP, TSC, and TSDC, other complimentary techniques that probe the gap states are needed. Xerographic techniques that were initially developed to characterize properties of electrophotographic (xerographic) receptors [1] seemed to be informative, suitable, and widely applicable for the study of amorphous thin films and photoconductive insulator thin films [2],... 

Thin film technology is becoming one of the important technologies today. While there are infinite varieties of thin film fabrication methods, most amorphous thin films seem to exhibit fractal-like atomic structures. Depending on the fabrication conditions, a thin film grows on the substrate into columnar structures with many voids interdispersed in the thin film.80 These structures can be seen in the field ion microscope, and compositional variation can be analyzed with the atom-probe. In addition, formation of atomic clusters inside the thin film can be substantiated with the observation of a large fraction of cluster ions in field evaporation by the atom-probe. 

However, only 65a exhibits thermotropic nematic behavior if amorphous thin films are heated to 155 °C, at which a Schlieren texture develops. The material decomposes above... 

Paine D. C., Whitson T., Janiae D., Beresford R. and Yang C. O., A study of low temperature crystallization of amorphous thin film indium-tin-oxide, Appl. Phys. 85 (1999) pp. 8445-8450. 

Amorphous thin films of spiro-linked compounds (14a-d) (Figure 3.1.5) have been tested in OTFTs.[107,108] The characteristic structural feature of these materials is the linkage of two hole transporting units by a spiro junction. A mobility of 7 X 10 cm V s was obtained with an on/off ratio of 10 . 

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