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Amorphous polymer thin films

J.H. Kim, Y. Hong, and J. Kanicki, Amorphous silicon thin-film transistors-based organic polymer light-emitting displays, IEEE Electron Device Lett., 24, 451-453, 2003. [Pg.616]

Y. Hong, J.-Y. Nahm, and J. Kanicki, Opto-electrical properties of 200 dpi four amorphous silicon thin-film transistors active-matrix organic polymer light-emitting display, Appl. Phys. Lett., 83, 3233-3235, 2003. [Pg.616]

Poly(arylene ether l,2,4-triazole)s were synthesized from the reaction of 3,5-di(4-hydroxyphenyl)-4-phenyl-1,2,4-triazole with three different activated aromatic difluoro monomers [34,35]. The polymer from the triazole bisphenol and 1,4-di(4-fluorobenzoyl)benzene exhibited an inherent viscosity of 3.40 dL/g (0.5% solution in m-cresol at 25 °C), a Tg of 216 °C and a Tm of 377 °C [35]. Solution cast amorphous unoriented thin films of this polymer gave 23 °C tensile strength, modulus and elongation of 87.6 MPa, 2.7 GPa and 7.8% respectively. No work was performed to induce crystallinity in the film. [Pg.91]

Kawase et al. [17] fabricated All-polymer thin film transistors by inkjet printing technique. They used these transistors as active-matrix backplane for information displays. This field has been dominated by amorphous Si TFTs and large liquid crystal displays with an amorphous Si TFT active matrix backplane have been manufactured at a reasonable cost. An organic TFT is expected to reduce the cost even more, and to be applied to flexible displays based on a plastic substrate. The TFT characteristics required for active-matrix displays are (1) sufficient drain cmrent, (2) low off current, (3) low gate leakage current through an insulator, (4) small gate overlap capacitance and (5) uniform characteristics. [Pg.189]

J.H. Jang and W. L. Mattice, The effect of solid wall interactions on an amorphous polyethylene thin film, using a Monte Carlo simulation on a high coordination lattice. Polymer 40 4685 (1999). [Pg.126]

Battiston, G.A. Gerbasi, R. Gregori, A. Porchia, M. Cattarin, S. Rizzi, G.A. (2000). PECVD of Amorphous Ti02 Thin Films Effect of Growth Temperature and Plasma Gas Composition. Thin Solid Films, Vol. 371, pp. 126-131 Belmonte, T. Henrion, G. Gries, T. (2011). Nonequilibrium Atmospheric Plasma Deposition.. Therm. Spray Techn., Vol. 20, pp. 744-759 Biederman, H. (Ed.). (2004). Plasma Polymer Films, Imperial College Press, ISBN 1-86094-467-1, London... [Pg.131]

Solvent Resistance. At temperatures below the melting of the crystallites, the parylenes resist all attempts to dissolve them. Although the solvents permeate the continuous amorphous phase, they are virtually excluded from the crystalline domains. Consequently, when a parylene film is exposed to a solvent a slight swelling is observed as the solvent invades the amorphous phase. In the thin films commonly encountered, equilibrium is reached fairly quickly, within minutes to hours. The change in thickness is conveniently and precisely measured by an interference technique. As indicated in Table 6, the best solvents, specifically those chemically most like the polymer (eg, aromatics such as xylene), cause a swelling of no more than 3%. [Pg.439]

Inorganic monomers can be used to plasma-deposit polymer-type films (16). At high plasma energies, the monomers are largely decomposed and can be used to form materials such as amorphous hydrogen-containing siUcon films from SiH for thin-film solar-ceU materials. [Pg.526]

X-ray diffraction consists of the measurement of the coherent scattering of x-rays (phenomenon 4 above). X-ray diffraction is used to determine the identity of crystalline phases in a multiphase powder sample and the atomic and molecular stmctures of single crystals. It can also be used to determine stmctural details of polymers, fibers, thin films, and amorphous soflds and to study stress, texture, and particle size. [Pg.372]


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See also in sourсe #XX -- [ Pg.8 , Pg.9 , Pg.9 ]




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