Microscopy AFM

Fig. 8A-D. Images obtained with AFM microscopy of simple vesicles derived A from 4 B from mixed vesicle originating from 2 C from mixed vesicle originating from 3 D vesicles obtained after the interaction of B and C liposomes...

AFM microscopy is more suited for the morphological study of solid surfaces, such as metallic plates with variable roughness therefore, it is extremely helpful when used in combination with the SERS investigation. In this way, the SERS... 

The morphology of the sputtered aluminium film on a glass substrate (1000 nm thickness) before and after anodisation was studied by AFM microscopy. The surface roughness of both films is approximately 35 nm. The... 

Patterned beams of neutral Ar or Cs atoms can also be used to selectively damage gold-thiol monolayers in the exposed areas524,525. Recently, use of AFM microscopy to selectively replace the monolayer of one alkanethiol with another with a resolution better than 2 nm was described526. 

A revolution in surface characterization came with the development of imaging techniques such as scanning tunneling (STM) and atomic force (AFM) microscopy " . Both can image surfaces with atomic resolution at low force loads. These methods are based on positioning an atomically sharp tip very close to the monolayer surface. The current (STM) or force (AFM) measurements and movement of a sample in a horizontal direction produce images in which individual atoms can be visualized. These experiments play a crucial role in determining the structure of the monolayer surfaces, and the results are discussed in Section V.A. 

Walheim et al. reported PS droplets after annealing a 50/50 w/w PS/PMMA sample for 12 h at 190°C (Walheim et al. 1997), and Ade et al. have also found using scanning force microscopy surface phase-separated PS and PMMA domains with PS droplets after annealing at ISO C (Ade et al. 1999). Based on AFM microscopy investigations, Harris et al. showed that PS and PMMA are phase-separated on the surface only in PS-b-PMMA diblock copolymer films is the PS block always at the surface and the PMMA block never at the surface (Harris et al. 2003). 

The nanoprobes are less robust, but as robust as most conventional silicon AFM probes, and can be used in aU of the conventional AFM imaging modes, including contact, tapping, and pulsed-force mode. When used in this way, the spatial resolution is similar to that in conventional AFM microscopy, (i.e., of the order of 1 nm). For L-TA the spatial resolution is of the order of 100 nm or better. Their disadvantages are that they cannot, at the time of writing, be used for calorimetric measurements or thermal imaging. This is because the heater is located at the top of the pyramid that forms the tip rather than immediately adjacent to the surface. However, they perform well for local TMA. The maximum temperature is -250 °C undoubtedly more versions of these probes will become available in the future with a wider range of capabilities. 

K. Gacem, A. El Hdiy, M. Troyon, I. Berbezier, and A. Ronda, Conductive AFM microscopy study of the carrier transport and storage in Ge nanocrystals grown by dewetting. Nanotechnology, 21, 065706(1-6]... 

Excessive filler content, specially when it is heterogeneously distributed in the adhesive, can be the origin of the failure in the bonding line, O Fig. 43.9. Crack propagates following the embrittled filler-rich areas. Filler content can be determined by TGA, but it is quite difficult to identify particle distribution from fractographic characteristics of the fractured surface. Depending on the size of the particles, optical, SEM, or AFM microscopy has to be applied. 

APN analysis of carbon nanotubes. The graphics and table report the nanotopography analysis useful to characterize nanostructures. In addition, AFM microscopy is used to perform mechanical and electrical characterization of carbon nanotubes. 

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