Atomic force microscopy AFM, also

The success of STM has resulted in the development of a whole variety of related scanning probe microscopes, the most important of which is atomic force microscopy, AFM, also known as scanning force microscopy. AFM was first reported in 1986 by Binnig, Quate and Gerber. 

In addition to surface analytical techniques, microscopy, such as scanning electron microscopy (SEM), transmission electron microscopy (TEM), scanning tunneling microscopy (STM) and atomic force microscopy (AFM), also provide invaluable information regarding the surface morphology, physico-chemical interaction at the fiber-matrix interface region, surface depth profile and concentration of elements. It is beyond the scope of this book to present details of all these microscopic techniques. 

FIGURE 1.12 Atomic force microscopy (AFM) also reveals the fundamental periodicity of macro-molecular crystals. In (a) is the surface layer of a crystal of brome mosaic virus, a particle having a diameter of about 280 A. In (b) is an AFM image of a monoclinic crystal of duodecahedral complexes of intact immunoglobulins, which have a diameter of about 230 A. 

Experimental techniques based on the application of mechanical forces to single molecules in small assemblies have been applied to study the binding properties of biomolecules and their response to external mechanical manipulations. Among such techniques are atomic force microscopy (AFM), optical tweezers, biomembrane force probe, and surface force apparatus experiments (Binning et al., 1986 Block and Svoboda, 1994 Evans et ah, 1995 Israelachvili, 1992). These techniques have inspired us and others (see also the chapters by Eichinger et al. and by Hermans et al. in this volume) to adopt a similar approach for the study of biomolecules by means of computer simulations. 

Several striking examples demonstrating the atomically precise control exercised by the STM have been reported. A "quantum corral" of Fe atoms has been fabricated by placing 48 atoms in a circle on a flat Cu(lll) surface at 4K (Fig. 4) (94). Both STM (under ultrahigh vacuum) and atomic force microscopy (AFM, under ambient conditions) have been employed to fabricate nanoscale magnetic mounds of Fe, Co, Ni, and CoCr on metal and insulator substrates (95). The AFM has also been used to deposit organic material, such as octadecanethiol onto the surface of mica (96). New appHcations of this type of nanofabrication ate being reported at an ever-faster rate (97—99). 

Tsou and Measmer examined the dispersion of organosUicates on two different butyl mbbers, namely BIMS and brominated poly(isobutylene-co-isoprene) (BIIR) with the help of small angle X-ray scattering (SAXS), wide angle X-ray scattering (WAXS), atomic force microscopy (AFM), and TEM [91]. There is also a patent on BIMS nanocomposites for low permeability and their uses in tire inner tubes [92]. 

Atomic force microscopy (AFM) or, as it is also called, scanning force microscopy (SFM) is based on the minute but detectable forces - of the order of nano Newtons -between a sharp tip and atoms on the surface. The tip is mounted on a flexible arm, called a cantilever, and is positioned at a subnanometre distance from the surface. If the sample is scanned under the tip in the x-y plane, it feels the attractive or repulsive force from the surface atoms and hence it is deflected in the z-direction. The deflection can be measured with a laser and photo detectors as indicated schematically in Fig. 4.29. Atomic force microscopy can be applied in two ways. 

The combination of atomic force microscopy (AFM) and Raman spectroscopy is another approach to attain high spatial resolution. AFM also employs a sharp tip close to a sample surface. When the tip is made of metal and light is irradiated onto the tip and surface, Raman scattering is largely enhanced. In this way, a spatial resolution of 15 nm is achieved [2]. 

The objective of this book is to highlight the important strides being made toward a molecular understanding of the processes that occur at surfaces through the unique information provided by the proximal scanning probe family of techniques this principally involves scanning tunneling microscopy (STM) but some atomic force microscopy (AFM) experiments are also included. 

The morphology of the assembled structure was also confirmed by atomic force microscopy (AFM). 

An ordered antibody array has also been assembled on the solid surface by a combination of Langmuir Blodgett (LB) film method and self-assembling method. An ordered monolayer of protein A is deposited on the solid surface by LB method, which is followed by self-assembling of antibody. Individual antigen molecules which are complexed with the antibody array have been quantitated selectively by atomic force microscopy (AFM). 

Microscopic techniques, 70 428 Microscopists, role of, 76 467 Microscopy, 76 464-509, See also Atomic force microscopy (AFM) Electron microscopy Light microscopy Microscopes Scanning electron microscopy (SEM) Transmission electron microscopy (TEM) acronyms related to, 76 506-507 atomic force, 76 499-501 atom probe, 76 503 cathodoluminescence, 76 484 confocal, 76 483-484 electron, 76 487-495 in examining trace evidence, 72 99 field emission, 76 503 field ion, 76 503 fluorescence, 76 483 near-held scanning optical,... 

---