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Atomic force microscopy AFM imaging

FIGURE 12.10 Tapping mode atomic force microscopy (AFM) images of the section analyzes of ethylene-propylene-diene monomer (EPDM) rubber-melamine fiber composites. A, composite containing no dry bonding system B, composite containing resorcinol, hexamine, and silica in the concentrations 5, 3, and 15 phr, respectively. [Pg.370]

The shift of the amide I mode (FTIR spectra) from 1657 to 1646 cm-1 was attributed to a change in the a-helix native structure to fl-sheets, secondary structure conformations. Atomic Force Microscopy (AFM) images display the coating of the manganese oxide surface as well as the unfolding in a ellipsoidal chain of the protein molecules after adsorption and immobilization on the surface. [Pg.460]

Fig. 22 Atomic force microscopy (AFM) image of graphene flakes. (Reprinted with permission from [182])... Fig. 22 Atomic force microscopy (AFM) image of graphene flakes. (Reprinted with permission from [182])...
Figure 3.29 shows atomic force microscopy (AFM) images for the three copolymers, GE-1, GE-2, and GE-3 at low and high concentrations.(From ref. [132]). [Pg.198]

Fig. 7.5. Atomic force microscopy (AFM) images in 3D recorded at two scan sizes of the four stages involved in the etching and chemical modification of capillaries for OTCEC. Fig. 7.5. Atomic force microscopy (AFM) images in 3D recorded at two scan sizes of the four stages involved in the etching and chemical modification of capillaries for OTCEC.
Curing laminated PDMS stamp at room temperature for 48 h followed by delaminating from glass master completed the stamp fabrication. The thickness of cured PDMS layer obtained by following the later procedure is 50 pm (Fig. 10.27c, d). Atomic force microscopy (AFM) images of the developed PR are shown in Fig. 10.28a, b. [Pg.262]

Figure 5.3 Atomic Force Microscopy (AFM) images of two Silver Island Film (SIF) coated glass slides (A B), showing the variation in size and density that can be obtained by altering the dip coating conditions. Slides were produced by LI-COR Biosciences and imaged at the University of Nebraska-Lincoln. Figure 5.3 Atomic Force Microscopy (AFM) images of two Silver Island Film (SIF) coated glass slides (A B), showing the variation in size and density that can be obtained by altering the dip coating conditions. Slides were produced by LI-COR Biosciences and imaged at the University of Nebraska-Lincoln.
To make a local measurement of the photochemical activity of each grain, we used a well established probe reaction (the reduction of aqueous Ag+ to AgO) that deposits metallic silver on the surface as a reaction product [84-85]. The amount of silver deposited on each grain s surface during a given reaction, which is determined from atomic force microscopy (AFM) images, is taken to be a quantitative indicator of the grain s relative photochemical reactivity. The reactivity can then be correlated to surface orientation and/or the relative area of each facet on the surface. [Pg.507]

The data obtained permitted us to propose the model of atomic arrangement of the film structure, which is similar to that published before [2]. The structure shown in Figure 11.1(g) is multi-layered with each layer consisting of carbon atom chains in the sp -hybridization state. These chains are densely packed into a hexagonal lattice. According to the diffraction pattern and atomic force microscopy (AFM) images the distance between the chains is in the range of 0.490 to 0.503 nm. [Pg.223]

Microscopic examination of palygorskite and MB samples provides support for the ideas described above. Figure 4.15 shows atomic force microscopy (AFM) images of pristine palygorskite and a genuine MB sample from the archeological... [Pg.88]

Figure 20.2 Ex situ atomic force microscopy (AFM) image of the basal plane of highly oriented pyrolytic graphite (HOPG). Wide terraces separated by steps can be seen. Figure 20.2 Ex situ atomic force microscopy (AFM) image of the basal plane of highly oriented pyrolytic graphite (HOPG). Wide terraces separated by steps can be seen.
Figure 20.9 Atomic force microscopy (AFM) images of 1-dodecanethiol monolayer adsorbed on C(OOOl). (a) Bright spots are attributable to sulfur heads. Image (a) exhibits an array of parallel-oriented bright rows. At a higher resolution (b) pale bands between rows corresponding to ahphatic chains and bright circles along each row attributed to sulfur heads can be seen. Figure 20.9 Atomic force microscopy (AFM) images of 1-dodecanethiol monolayer adsorbed on C(OOOl). (a) Bright spots are attributable to sulfur heads. Image (a) exhibits an array of parallel-oriented bright rows. At a higher resolution (b) pale bands between rows corresponding to ahphatic chains and bright circles along each row attributed to sulfur heads can be seen.
Those serious differences in fiber properties can be illustrated by the means of fiber structures as they can be derived out of the results of WAXS and atomic force microscopy (AFM) images. [Pg.206]

Figure 9.11 shows typical atomic force microscopy (AFM) images (contact mode) of a crystalline DIP film of about 360 A thickness deposited on silicon oxide (a), an aluminium oxide film ( 174 A thick) deposited on silicon ox-... [Pg.178]

A polycationic water-soluble Ru hexamer possessing 12 positive charges was immobilized into oxidized SWCNTs throngh electrostatic interactions with the carboxylate moieties of the oxidized SWCNTs [87], The multiple ionic-pair interactions between the positively charged metallohexamer- and carboxylate-modified SWCNTs were evidenced by transmission electron microscopy (TEM) and atomic force microscopy (AFM) images. [Pg.285]


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AFM

AFM Microscopy

AFM imaging

AFMs

Atom Force Microscopy

Atomic force microscopy

Atomic force microscopy imaging

Atomic force microscopy, AFM

Atomic imaging

Atoms images

Image force

Imaging force

Microscopy image

Microscopy imaging

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