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Electrochemical atomic force microscopy EC-AFM

In addition to utilization of combined UHV and electrochemistry (UHV-EC), the enormous growth witnessed in the past ten years can be attributed to the inclusion of scanning tunneling microscopy (STM) and atomic force microscopy (AFM) in the analytical arsenal. STM-AFM-based data were employed to support or dispute earlier results from purely electrochemic or UHV-EC techniques stimulating scientific discussions ensued. The scientific debate about the mechanism of electrode processes vis-d-vis the structure and composition of the electrochemical interface subsequently spurred theorists to wade in and join the debate. [Pg.362]

See other pages where Electrochemical atomic force microscopy EC-AFM is mentioned: [Pg.786]    [Pg.812]    [Pg.786]    [Pg.812]    [Pg.4406]    [Pg.4432]    [Pg.150]    [Pg.283]    [Pg.786]    [Pg.812]    [Pg.786]    [Pg.812]    [Pg.4406]    [Pg.4432]    [Pg.150]    [Pg.283]    [Pg.131]    [Pg.23]    [Pg.364]    [Pg.602]    [Pg.16]    [Pg.187]    [Pg.28]    [Pg.129]    [Pg.6208]    [Pg.7]    [Pg.199]    [Pg.696]    [Pg.90]   
See also in sourсe #XX -- [ Pg.129 ]



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