Scanned probe microscopies: STM, AFM

Scanning probe microscopy (STM, AFM,. ..) High resolution topology (nm scale) in 3D local physico-chemical properties depending on specific technique (e.g., mechanical stability, adhesion, potential). Restricted to solid/fluid interfaces., i.e., supported monolayers and LB films precautions to avoid deformation and damage of the layers may be necessary. 

Explain the principles of the scanning probe microscopies STM and AFM, and discuss the type of information these techniques provide. What are the major differences between the two ... 

We describe here three main microscopy techniques, namely local probe microscopy (STM, AFM, etc.), transmission microscopy (TEM) and scanning electron microscopy (SEM). 

Experimental approaches to bioelectrochemical systems include other techniques which introduce new environments for interfacial bioelectrochemical function. Introduction of single-crystal, atomically planar electrode surfaces has opened a basis for the use of the scanning probe microscopies, STM and AFM, also for biological macromolecules. Importantly this extends to the electrochemical STM mode where electrochemical surfaces, adsorbate molecules, and now also biological macromolecules can be mapped directly in their natural aqueous environment, with full electrochemical potential control in situ STM and... 

The abihty to measure and to control charge transport across nanometer-scale metal-molecule-metal junctions represents a key step toward the realization of molecular-based electronics [190-192]. Various experimental approaches have been employed to study molecular junctions in two- and three-terminal configurations. These include scanning probe microscopies (STM, STS, CP-AFM) [193-208], crossed-wire junctions [209], mechanical [210-215] and electromigration [216,217] break junctions, nanopores [218] and mercury drop electrodes [219]. Approaches in condensed media, and in par-... 

The ability to control the position of a fine tip in order to scan surfaces with subatomic resolution has brought scanning probe microscopies to the forefront in surface imaging techniques. We discuss the two primary techniques, scanning tunneling microscopy (STM) and atomic force microscopy (AFM) the interested reader is referred to comprehensive reviews [9, 17, 18]. 

We confine ourselves here to scanning probe microscopies (see Section VIII-2B) scanning tunneling microscopy (STM) and atomic force microscopy (AFM), in which successive profiles of a surface (see Fig. VIII-1) are combined to provide a contour map of a surface. It is conventional to display a map in terms of dark to light areas, in order of increasing height above the surface ordinary contour maps would be confusing to the eye. 

The objective of this book is to highlight the important strides being made toward a molecular understanding of the processes that occur at surfaces through the unique information provided by the proximal scanning probe family of techniques this principally involves scanning tunneling microscopy (STM) but some atomic force microscopy (AFM) experiments are also included. 

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