Imaging Surface Analysis

Secondary ion (mass spectrometry) SIMS Particle induced desorption/ ionization Nonvolatile molecular ions Semiconductors Surface analysis Imaging... 

Fig. XVin-3. AFM image of DNA strands on mica. Lower figure image obtained in the contact mode under water. The contrast shown covers height variations in the range of 0-2 nm. Upper figure observed profile along the line A-A of the lower figure. (From S. N. Magnov and M.-H. Whangbo, Surface Analysis with STM and AFM, VCH, New Yoric, 1996.)...

Imaging of Surfaces—Analysis of Surface Morphology. Several important techniques can help answer the question what does the surface look like This question is often the first one to be posed ia the characterization of a new surface or iaterface. Physical imaging of the surface is necessary to distinguish the relevant features important for understanding the whole surface and is essential for accurate iaterpretation of data from other surface analysis techniques which might later be appHed to a more limited region of the surface or iaterface. 

OM Identification of compounding ingredients, particle size, dispersion, surface blooming, image analysis... 

We shall concern ourselves here with the use of an X-ray probe as a surface analysis technique in X-ray photoelectron spectroscopy (XPS) also known as Electron Spectroscopy for Chemical Analysis (ESCA). High energy photons constitute the XPS probe, which are less damaging than an electron probe, therefore XPS is the favoured technique for the analysis of the surface chemistry of radiation sensitive materials. The X-ray probe has the disadvantage that, unlike an electron beam, it cannot be focussed to permit high spatial resolution imaging of the surface. 

Rudenauer FG (1989) Multidimensional image acquisition and processing in surface analysis. Fresenius Z Anal Chem 333 308... 

ToF-SIMS is one of the most sensitive and interesting methods for surface analysis, but intricate and expensive. It can be operated in imaging mode, with resolutions below 1 pm (though usually not with polymers). 

R. N. S. Sodhi, Time of flight secondary ion mass spectrometry (ToF SIMS) versatility in chemical and imaging surface analysis, Analyst, 129, 483 487 (2004). 

Imaging of starch granule surfaces Surface analysis of photosystem 1 complex... 

S. N. Magonov and M-H. Whangbo, Surface Analysis with STM and AFM, Experimental and Theoretical Aspects of Image Analysis, VCH, New York, 1996. 

Consideration of Surface Analysis Concerns. The researchers in this study used a wide range of surface and other tools, taking appropriate advantage of the strengths of the various methods. Previous work had shown that AES and XPS could be used to study chromate films without unreasonable problems and provided a basis for the current study. XPS was used to obtain specific chemical information while AES was used whenever spatial resolution and electron imaging were desired. RBS and electron microprobe work was used to analyze composition structures of thicker layers. 

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