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Test circuits

J. L. Anastasi and co-workers, "Molten-Caustic-Leaching (Gravimelt Process) Integrated Test Circuit Operation Results," Report to the Gravimelt Process Advisory Board, Summer 1989. [Pg.265]

For more clarity we have reproduced in Figure 14.3 an actual test circuit and in Figure 14.4, the oscillograms of the test results of a short-circuit test successfully carried out on an LT power distribution panel (Figure 14.8) for a system fault level of 50 kAfor 1 second, at CPRI (Central Power Research Institute). From a study of these oscillograms (Figure 14.4), we can infer the following test results ... [Pg.433]

Before creating a fault condition, to obtain the required /sc the impedance of the test circuit is adjusted so that the required fault current is obtained in all the phases on creating a short-circuit. To provide the required thermal effect (/sc /). the duration of test, /, is then adjusted accor-dingly. The relevant standards therefore stipulate that the test current may be higher or lower than required and can be compensated by adjusting its duration, i. [Pg.433]

The test circuit may be connected to the test voltage and then switched to obtain the required oscillograms during switching operations and assess the following ... [Pg.578]

For adequate protection of the machine it is essential to know the amplitude, F, and the rise time, /, of the severest voltage surge (FOW) that may occur on the system. It is recommended that the actual field tests be conducted for large installations according to the recommended simulation test circuits, noted above, to ascertain these surges. [Pg.578]

Supply source Busbar section, Test circuit Cable... [Pg.578]

Early in the program, critical components (e.g.,the turbomolecular pump) and circuit boards were tested for their ability to survive neutron and gamma irradiation rates and doses similar to those that would be received from exposure to the detonation of a tactical nuclear device. All components were powered up at the start of the gamma irradiation tests but not during the neutron irradiation tests. Circuit boards were protected by circumvention circuits that powered down critical circuits in 10 to lOOps upon detecting radiation. All components survived the nuclear radiation tests. This unusual performance was noted with positive commendations by the staff at the White Sands Missile Range, where the tests were performed. Tests of the fully integrated CBMS II system, installed in a reconnaissance vehicle, will be conducted in the future. [Pg.85]

Figure 4.5 A potentiometer circuit The voltage from the test circuit is balanced against a known voltage by means of a variable resistance using a galvanometer to indicate the position at which no current flows in either direction. Figure 4.5 A potentiometer circuit The voltage from the test circuit is balanced against a known voltage by means of a variable resistance using a galvanometer to indicate the position at which no current flows in either direction.
Go to http //bevond-desians.com/pspice.htm and scroll to the middle of the page to the title "Level 3 spark gap model and test circuit" the second to last sentence says Note that the centre terminal of a spark-plug is normally fired with negative polarity". [Pg.32]

Figure 3.24 Cate turnoff thyristor pulse-testing circuit. Figure 3.24 Cate turnoff thyristor pulse-testing circuit.
Fig. 5.24 SIM elemental images of a test circuit 40 gm full scale, (a) is an image of 27A1+ ions and (b) is an image of 48Ti+ ions. (Courtesy of R. Levi-Setti.)... Fig. 5.24 SIM elemental images of a test circuit 40 gm full scale, (a) is an image of 27A1+ ions and (b) is an image of 48Ti+ ions. (Courtesy of R. Levi-Setti.)...
The test circuit takes a 20 V DC input and provides a regulated 10 V DC output. [Pg.68]

The modulation gain of the test circuit was also measured. The modulation gain is the gain from the output of the opto-coupler to the output of the STR-F6524 average mode model. The breadboard results are shown in Fig. 4.76, and the IsSpice results are shown in Fig. 4.77. [Pg.110]

In order to answer this question, the zener voltages versus zener currents were plotted for the Micro-Cap diode, IsSpice diode, and a lab diode. The test circuit is shown in Fig. 6.39. [Pg.171]

Figure 10.18 IsSpice diode forward characteristics test circuit schematic. Figure 10.18 IsSpice diode forward characteristics test circuit schematic.
Figure 6.16 Dummy-cell test circuits for three-electrode instrumentation. Figure 6.16 Dummy-cell test circuits for three-electrode instrumentation.
FIGURE 1.29 (a) Depolarization test circuit and (b) depolarization after a heavy side-step-function electric... [Pg.45]

Different testing circuits have been put into practice (Fig. 6.236) to investigate the spark ignition characteristic of a fieldbus power supply with and without a cable and/or cable termination. [Pg.412]

Figure 6.236 Different test circuits for the investigation of the ignitability of a field-bus power supply with and without cable and cable termination. Figure 6.236 Different test circuits for the investigation of the ignitability of a field-bus power supply with and without cable and cable termination.
So, for three-phase apparatus representing the majority in public and industrial power supply systems, a three-phased synthetic PD test circuit has been developed and put into operation [17], [20]. [Pg.446]

All conductors are part of three closed current loops with impressed currents which are kept constant, and a three-phase high voltage system enables simultaneous PD measurements in the three conductors (Fig. 8.9). The complete test circuit is installed in a shielded cabin as a Faraday cage, all power lines enter this cage via filter banks to suppress unwanted signal transmission to the internal test circuit. The main parts of the test circuit are ... [Pg.446]

Table 8.4 Main technical data of the synthetic test circuit... Table 8.4 Main technical data of the synthetic test circuit...
The main technical data of this 3 AC PD test circuit are summarized in Table 8.4. This test facility enables continuous PD measurements for electrical 3 AC apparatus up to 11 kV and 1000 A, the voltage limitation complying with EN 50019 and IEC 60079-7, but with a margin of safety in the rating of the test voltage. As a total, a throughput power of 104 MVA can be simulated. [Pg.447]

A cylindrical sample of solid germanium has length 55.0 mm and diameter 5.0 mm. In a test circuit, 0.150 A of current flowed through this sample when the voltage applied between its ends was 17.5 V. What is the electrical conductivity of this sample ... [Pg.927]

A gold wire 4.0 mm in diameter and 1.5 m in length is to be used in a test circuit, (a) Calculate the resistance of the wire, (b) Calculate the current density in the wire when the voltage applied between its ends is 0.070 V. (c) Calculate the electric field in the wire. [Pg.927]


See other pages where Test circuits is mentioned: [Pg.214]    [Pg.577]    [Pg.578]    [Pg.578]    [Pg.570]    [Pg.370]    [Pg.239]    [Pg.367]    [Pg.68]    [Pg.291]    [Pg.182]    [Pg.185]    [Pg.208]    [Pg.44]    [Pg.326]    [Pg.442]    [Pg.442]    [Pg.443]    [Pg.444]    [Pg.446]    [Pg.913]    [Pg.491]   
See also in sourсe #XX -- [ Pg.180 ]




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Circuit Under Test

In-circuit test

Open-circuit voltage ratio tests

Power circuits short-circuit tests

Short circuit testing

Short-circuit tests

Short-circuit tests panels

Testing electrical circuits

Testing intrinsic safety of electrical circuits

Testing intrinsically safe circuits

Thermal resistance test circuit

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