Secondary-electron imaging

Catalysts were characterized using SEM (Hitachi S-4800, operated at 15 keV for secondary electron imaging and energy dispersive spectroscopy (EDS)), XRD (Bruker D4 Endeavor with Cu K radiation operated at 40 kV and 40 mA), TEM (Tecnai S-20, operated at 200 keV) and temperature-programmed reduction (TPR). Table 1 lists BET surface area for the selected catalysts. 

Figure 3 - Secondary electron image and EDX spectroscopy map showing the presence of elemental gold...

Figure 7.4 High-resolution secondary electron image of an a-Al203 support (from Liu et al. [It]).

Figure 4c shows the disappearance of Ga droplets when the temperature exceeds the monotectic temperature at which the solid Pb phase melts. The Ga liquid is no longer visible either by Auger spectroscopy or by the secondary electron imaging. This means that the Pb layer covering the surface of the liquid Ga is thick enough (at least 2nm) for concluding that... 

A Philips Environmental-SEM/EDX (Phihps XL30) was used to measure the morphology on untreated and plasma-treated powders. The powders were fixed on the sample holder by double conductive adhesive aluminum tape, and then gold-coated. Secondary electron images were recorded with the scanning electron microscope (SEM) using a 15 keV acceleration voltage. 

Figure 13.11—Scanning electron microscopy (SEM) accompanied by X-ray fluorescence analysis. Secondary electron image of a cross-section of a supraconducting polycrystalline ceramic with oriented grains of oxide BiPbiSriCaiCurO, (Philips instrument, model XL30FEG). Energy emission spectra corresponding to the matrix and to a 5 pm-long inclusion (bottom). It should be noted that it is possible with this technique to obtain the composition at a precise point on the sample (Link-Oxford analyser) (study by V. Rouessac, reproduced by permission of CRISMAT. University of Caen).

Figure 5 shows the SEM micrographs, operating with secondary electron imaging, which show the surface topography of cold fractured film edges. The films were cryro-fractured in liquid N2 to obtain an undistorted view representitve of the bulk material. 

Elemental mapping to depict distributions of elements over the mass distribution image or a secondary electron image... 

Fig. 1.16. Secondary electron image of the Ni-Bi transition zone and the concentration profiles of both components within the phases involved in the interaction.149 Temperature 250°C, annealing time 9xl04 s (25 h). Electrolytic polishing.

Fig. 1.18. Secondary electron image of the Ni-Bi transition zone after the second anneal in the as-received condition.150 Temperature 250°C. The time of the first anneal is 14400 s (4 h), while that of the second is 12600 s (3.5 h), 27000 s or 7.5 h in total. Microhardness indentations were put onto the electropolished surface of the cross-section after the first anneal at a load of 0.196 N (20 g). 

Fig. 3.14. Secondary electron image of the Co-Zn transition zone with the Co and Zn concentration profiles.

Fig. 5.18. Secondary electron image of the transition zone between Fe-Cr alloys and aluminium. Temperature 700°C, dipping time 3600 s. Initial liquid phase (a) aluminium melt saturated with the alloy constituents, (b) pure aluminium (go = 24.0 rad sec-1).

Hitachi announced the development of the third commercial microprobe instrument, the ion microprobe analyzer IMA-2 in 1969 [30]. This instrument placed a scintillator close to the sample for secondary electron imaging. A Wien filter, for primary beam mass selection [31], and an electron spray, for charge compensation on insulating samples [32], were added later. 

Fig. 10.3 SEM secondary electron image of Ciment Fondu hydrated for a few minutes in a suspension of w/c = 10 at room temperature, showing foils, probably of C,AH j. and amorphous material. Mcnctricr-Sorrentino (M88).

Fig. 10.5 shows portions of fracture surfaces of some pastes of Ciment Fondu examined by secondary electron imaging in the SEM. At 22 h. in pastes hydrated at 20 C, fibrous material is abundant, together with plates of CjAHg. The fibrous material is probably partially dehydrated CAH,(,. 

Fig. 10.5 SEM secondary electron images of the fracture surface of a paste of Ciment Fondu (w/c = 0.4), hydrated for 22 h at room temperature, showing (A) CAH,o, and (B) plates of CjAHg. Menetrier-Sorrentino (M88).

Figure 4. Bast fiber from Etowah Mound 1145 core (ca. A.D. 1200). Secondary electron image magnification 1200 X.

Figure 3. Scanning Electron Microscope Images of a V53-Ti26-Ni21 Alloy (a) Back-scattered and (b) secondary electron image.

Fig. 24. Plan view secondary electron image of a porous layer formed in p-Si(lOO), 0.001 2 cm in 10 M HF at lOOmAcm-2 [83].

Its morphology and texture are described by the secondary electron images (topographical contrast). 

Secondary electron images are characteristic of the topography of the sample they are used to describe the morphology and texture of samples and can be used to describe both details a few tens of nanometres in size and the morphology of samples several millimetres in diameter. 

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