X-ray elemental mapping

Fig. 10. X-ray elemental map in the electron microscope of metal-substituted aluminophosphate (MAPO-36 (with M = Zn)) catalyst. The map shows a uniform distribution of the elements in the sample.

Figure 6. X-ray elemental maps obtained using an electron microscope—urban dust sample containing automotive exhaust particles...

Figure 4.3. C0-ALPO5 catalyst (with (Co/Co + Al) = 0.036) (a) an SEM image (b) an HRTEM image (inset— simulated structure) and (c) x-ray elemental map of Co-ALPO indicating uniform distribution of the elements Al, P and Co. The bright-held image is also shown.

Figure 2. X-ray elemental maps of Si, Ca, P, and a relevant SEM image of the cross-section of the pseudowollastonite ceramic after 1 month immersion in SBF.

Among higher terrestrial plants, horsetail species Equisetum spp.) are well known as strong accumulators of silicon. In addition to X-ray element mapping. 

EELS spectra can also be employed to map the distribution of selected elements present in a sample, in the same way that X-ray elemental can be exhibited in analytical TEM experiments. 

Analysis by the Detection of X-rays or y rays. EPMA is a fully qualitative and quantitative method of non-destructive analysis of micrometre-sized volumes at the surface of materials, with sensitivity at the level of ppm. All elements from Be to U can be analysed, either in the form of point analysis, from line scans and also as X-ray distribution maps. Current software allows the combination of elemental data in the latter, so that, for example, the digital data for those elements that corresponds to a selected phase will produce an X-ray map of the distribution of that phase in a given microstructure. 

The SEM is also used to do X-ray/elemental analysis. This technique is qualitative. X-ray analysis and mapping of the particular elements present is useful for the identification of inorganic fillers and their dispersion in compounds as well as inorganic impurities in gels or on surfaces and curatives, e.g., aluminum, silicon, or sulfur in rubber compounds and Cl and Br in halobutyl blends. (Figure 9)... 

FIGURE 8.2 Backscattered electron image of surface soil and corresponding x-ray elemental dot maps. White colors indicate highest concentration of target elements, and dark spots indicate low concentration. 

Figure 21 X-ray elemental scanning maps using Mg K (a), Si K (b) and Ni K (c), plus backscattered electron images ((d) and (e)) of a typical type I porphyritic chondmle in the QUE 99177 CR2 chondrite, which has a forsterite-rich core, a porphyritic olivine-pyroxene rim (POP) and an outermost silica-rich rim (SIR). The Ni K map (c) shows that metallic Fe,Ni grains in the chondrule core are richer in nickel than those in the outer portions. The zoned stmcture of the chondrule can be explained by gas-melt fractional condensation or gas-solid condensation followed...

Wavelength dispersive X-ray spectrometry (WDS) for a more detailed elemental analysis of samples in the SEM. JEOL Four-Crystal Spectrometer attached to the JSM-35C SEM can be used for l-pm spot analysis, digital and analog line scans, and X-ray image mapping, elements detection from Be to U, minimum detection limit of 0.01% by weight, fully quantitative results by extended cp-p-z. 

Ion Imaging. A SIMS 1on Image represents the x-y distribution of a species over the surface of the sample. The usefulness of elemental Images has been Illustrated for Auger and electron microprobe energy dispersive X-ray (EDAX) maps SIMS... 

Maps were constructed of the entire remnant in the spectral line energies of several specific elements. The Si and S X-ray line maps and the optical... 

Figure 4. (A) Electron micrograph of fracture surface from an x = 0.1S8 pellet produced by composite method. The distance between the black dots on the white bar corresponds to 10 /im. (B) X-ray fluorescence map of bismuth for the same region as in (A). White points indicate th presence of detected element. Continued on next page.

At medium and low energies (l-20keV) projection microscopy was commercially established and used in materials and geological sciences and for biological applications. Nevertheless, the technique lost its popularity because of competition from the scanning electron microscope and electron probe analyzer, both of which offer X-ray elemental fluorescence maps superimposed on structural images. However, both of these instruments give information about the... 

The EDX analysis showed the elemental composition on the surface of the nanobiocomposites. Figure 7.10 shows the energy dispersive X-ray spectroscopy mapping image and spectrum of the fractured PP/KE (10 mm)/clay nanobiocomposites. The... 

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