Secondary electron imaging SEI

Fig.20. Secondary-electron imaging (SEI) pattern obtained from epitaxial Ag on Al(l 11) heat treated at 410 K. The sixfold symmetry verifies the formation of Ag2Al clusters with hep structure [82].

M. Erbudak (ETH Zurich) and coworkers with secondary-electron imaging (SEI), see Figure 8(a) in Ref. [10]. 

Quantum dots are detectable by SEM by topographical contrast with secondary electron imaging (SEI), compositional contrast with backscattered electron imaging (BEI), and scanning transmission electron imaging. By SEI, the quantum dots appear as particles on exposed surfaces that can resemble normal biological structures. However, the CdSe core and ZnS coating impart... 

SEM in combination with secondary electron imaging (SEI) mode adds another important dimension to visualize adhesive penetration into wood tissues. Figure 6 shows tracheids without and with adhesive. In the rays small droplets can be seen ... 

Figure 7. SEM photomicrograph of penetration of the adhesive mix UP I into beech, taken in secondary electron imaging (SEI) mode. Scale bar = 50 pm.

Figure 13. Secondary electron image (SEI) profiles of Ca and Mg - determined by traversing the cross section of the two fiber components at a right angle to their interface, indicate that the MgO level is higher in component (A) than in component (B), and that the CaO level is higher in component (B) than in component (A). Courtesy of Micron Inc., Analytical Sen/ices, Wilmington, DE.

Fig. 3. Secondary electron images (SEI) and distribution of X-rays for initial bentonite.

The etching study was conducted to complement ultrathin sectioning of high modulus oriented fibers [238]. Representative results of the plasma etching experiment are shown in the secondary electron images (SEI) (Fig. 4.19% Glass fibers and amorphous polyester film were used as controls. Oriented PET and aramid fibers were etched for 15 min in argon in order to evaluate the effect of the treatment on oriented crystaUine... 

Fig. 4.5 Secondary electron image (SEI) of a polymer fiber prepared by the peelback method reveals the internal fibrillar texture (arrow).

Scanning Electron Microscopy (SEM) Secondary Electron Imaging (SEI) Backscattered Electron Imaging (BEI) Transmission Electron Microscopy (TEM) Scanning Transmission Electron Microscopy (STEM) Scanning Tunneling Microscopy (STM) Atomic Force Microscopy (AFM) Frictional Force Microscope (FFM). 

Fig. 2. Secondary electron image (SEI) for composite in Ti-B-Nb system (A, B), Composite in Ti-B-Cr system (C, D)...

Fig. 4. AES-EBSD image for composite fabricated in Ti-Nb-B system A) Secondary electron image (SEI), B) IFF map for aU components. C). phase map for aU component D) Original agenda for phase map -total fraction in vol.%. E) ciystaUographic data ...

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