Aluminum secondary electron image

A Philips Environmental-SEM/EDX (Phihps XL30) was used to measure the morphology on untreated and plasma-treated powders. The powders were fixed on the sample holder by double conductive adhesive aluminum tape, and then gold-coated. Secondary electron images were recorded with the scanning electron microscope (SEM) using a 15 keV acceleration voltage. 

Figure 19. Secondary electron image of aluminum metallization pattern used for study of formation of stringers. (Reproduced with permission. Copyright Perkin-Elmer Corporation.)...

Figure 1.4 Microstructure of hot-pressed polycrystalline aluminum oxide secondary electron image using the SEM.

FIGURE 13.5 (a) Aluminum stub viewed by a secondary electron detector (left panel) and a backscatter electron detector (right panel). (b) Carbon-gold composite electrode viewed by a secondary electron detector and a backscatter electron detector (inset). (Reproduced with permission from Ref [11]. Copyright 2012, Wiley-VCH Verlag GmbH.) ( All unattributed images taken by author KEF.)... 

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